Abstract:
A test and measurement system includes a test and measurement device having input channels, a reference array of antennas connected to the input channels, one or more processors in the test and measurement device configured to execute code to cause the one or more processors to receive a first signal from a phased array of antennas connected to a device under test directed at a first side of the reference array, receive a second signal from the phased array of antennas connected to the device under test directed at a second side of the reference array, without moving the device under test, the phased array, or the reference array. A method of testing a device under test using a phased array of antennas includes tuning the phased array to a first location at a first side of a reference array of antennas, by adjusting a phase for each antenna in the phased array, receiving a first signal from the device under test at the first location, tuning the phased array to a second location at a second side of the reference array of antennas, and receiving a second signal from the device under test at the second location. A test and measurement device includes at least two input channels, an array of at least two reference antennas, each antenna connected to one of the input channels, one or more processors in the test and measurement device configured to execute code to cause the one or more processors to receive an input signal from one or more of the reference antennas, and measure the input signal from one or more of the reference antennas.
Abstract:
An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.
Abstract:
A test and measurement system includes a test and measurement device having input channels, a reference array of antennas connected to the input channels, one or more processors in the test and measurement device configured to execute code to cause the one or more processors to receive a first signal from a phased array of antennas connected to a device under test directed at a first side of the reference array, receive a second signal from the phased array of antennas connected to the device under test directed at a second side of the reference array, without moving the device under test, the phased array, or the reference array. A method of testing a device under test using a phased array of antennas includes tuning the phased array to a first location at a first side of a reference array of antennas, by adjusting a phase for each antenna in the phased array, receiving a first signal from the device under test at the first location, tuning the phased array to a second location at a second side of the reference array of antennas, and receiving a second signal from the device under test at the second location. A test and measurement device includes at least two input channels, an array of at least two reference antennas, each antenna connected to one of the input channels, one or more processors in the test and measurement device configured to execute code to cause the one or more processors to receive an input signal from one or more of the reference antennas, and measure the input signal from one or more of the reference antennas.
Abstract:
A mixed-domain oscilloscope (MDO) includes a signal generator configured to generate a test signal having a span ranging from a user-configurable start frequency to a user configurable stop frequency, an output channel coupled to the signal generator and configured to transmit the test signal, an RF input channel configured to receive a return signal based on the test signal, an acquisition section configured to acquire and digitize the return signal as an acquisition record, and a ramp busy signal generator configured to substantially time-align the acquisition record with the test signal. The test signal includes a chirp signal that is a linearly swept sine wave that spans between the user-configurable start frequency and the user-configurable stop frequency. Methods include calibrating the chirp signal, connecting the MDO in various test configurations relative to external return loss bridge and DUT equipment, and performing measurements such as S21 (db), S11 (db), and distance-to-fault type measurements.
Abstract:
An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.
Abstract:
A mixed-domain oscilloscope (MDO) includes a signal generator configured to generate a test signal having a span ranging from a user-configurable start frequency to a user configurable stop frequency, an output channel coupled to the signal generator and configured to transmit the test signal, an RF input channel configured to receive a return signal based on the test signal, an acquisition section configured to acquire and digitize the return signal as an acquisition record, and a ramp busy signal generator configured to substantially time-align the acquisition record with the test signal. The test signal includes a chirp signal that is a linearly swept sine wave that spans between the user-configurable start frequency and the user-configurable stop frequency. Methods include calibrating the chirp signal, connecting the MDO in various test configurations relative to external return loss bridge and DUT equipment, and performing measurements such as S21 (db), S11 (db), and distance-to-fault type measurements.
Abstract:
A mixed-domain oscilloscope (MDO) includes a signal generator configured to generate a test signal having a span ranging from a user-configurable start frequency to a user configurable stop frequency, an output channel coupled to the signal generator and configured to transmit the test signal, an RF input channel configured to receive a return signal based on the test signal, an acquisition section configured to acquire and digitize the return signal as an acquisition record, and a ramp busy signal generator configured to substantially time-align the acquisition record with the test signal. The test signal includes a chirp signal that is a linearly swept sine wave that spans between the user-configurable start frequency and the user-configurable stop frequency. Methods include calibrating the chirp signal, connecting the MDO in various test configurations relative to external return loss bridge and DUT equipment, and performing measurements such as S21 (db), S11 (db), and distance-to-fault type measurements.
Abstract:
A test and measurement instrument has an arbitrary waveform generator having at least two waveform generators. Each waveform generator includes a signal generator to generate in-phase (I) and quadrature (Q) digital signals according to a selected signal type for a digital constituent output signal, a pulse envelope sequencer to modulate amplitude of the I and Q digital signals, and one or more multipliers to combine the I and Q digital signals with a carrier signal to produce the digital constituent output signal. The arbitrary waveform generator includes a stream manager to produce modulation descriptor words for the waveform generators, a summing block to selectively combine digital constituent output signals to produce a digital multi-constituent output signal, a digital-to-analog converter to convert the digital multi-constituent output signal to an analog output signal, and an internal signal analyzer to receive an analyzer input of one of more of the digital output signals.
Abstract:
A mixed-domain oscilloscope (MDO) includes a signal generator configured to generate a test signal having a span ranging from a user-configurable start frequency to a user configurable stop frequency, an output channel coupled to the signal generator and configured to transmit the test signal, an RF input channel configured to receive a return signal based on the test signal, an acquisition section configured to acquire and digitize the return signal as an acquisition record, and a ramp busy signal generator configured to substantially time-align the acquisition record with the test signal. The test signal includes a chirp signal that is a linearly swept sine wave that spans between the user-configurable start frequency and the user-configurable stop frequency. Methods include calibrating the chirp signal, connecting the MDO in various test configurations relative to external return loss bridge and DUT equipment, and performing measurements such as S21(db), S11(db), and distance-to-fault type measurements.