公开(公告)号：US12020855B2

公开(公告)日：2024-06-25

申请号：US17315022

申请日：2021-05-07

Applicant: Tektronix, Inc.

Inventor： Shubha B ,  Niranjan R Hegde ,  Yogesh M Pai ,  Gajendra Kumar Patro ,  Krishna N H Sri

IPC: H01F27/34 ,  G01R33/14 ,  H01F3/10 ,  H01F27/24 ,  H01F27/42

CPC classification number: H01F27/346 ,  G01R33/14 ,  H01F3/10 ,  H01F27/24 ,  H01F27/42 ,  H01F2003/106 ,  H01F2027/348

Abstract: A test and measurement instrument for determining magnetic core losses of a device under test during in circuit operation. The test and measurement instrument receives a primary current signal from a primary winding of a device under test and receives a primary voltage signal measured across a magnetic core of the device under test. Based on the primary electric current signal and the primary voltage signal, the test and measurement instrument determines a magnetic loss of the device under test. In some examples, the test and measurement instrument can use primary and secondary voltage and current inputs to determine the magnetic loss of the device under test. The magnetic loss of the device under test can be displayed on a display of the test and measurement instrument. The magnetic loss can include a total magnetic loss, a hysteresis loss, a copper loss, and/or other losses.

公开(公告)号：US20210358685A1

公开(公告)日：2021-11-18

申请号：US17315022

申请日：2021-05-07

Applicant: Tektronix, Inc.

Inventor： Shubha B ,  Niranjan R Hegde ,  Yogesh M Pai ,  Gajendra Kumar Patro ,  Krishna N H Sri

IPC: H01F27/34 ,  H01F27/42 ,  H01F3/10 ,  H01F27/24 ,  G01R33/14

Abstract: A test and measurement instrument for determining magnetic core losses of a device under test during in circuit operation. The test and measurement instrument receives a primary current signal from a primary winding of a device under test and receives a primary voltage signal measured across a magnetic core of the device under test. Based on the primary electric current signal and the primary voltage signal, the test and measurement instrument determines a magnetic loss of the device under test. In some examples, the test and measurement instrument can use primary and secondary voltage and current inputs to determine the magnetic loss of the device under test. The magnetic loss of the device under test can be displayed on a display of the test and measurement instrument. The magnetic loss can include a total magnetic loss, a hysteresis loss, a copper loss, and/or other losses.