Method of transferring a thin crystalline semiconductor layer
    2.
    发明申请
    Method of transferring a thin crystalline semiconductor layer 审中-公开
    转移薄晶体半导体层的方法

    公开(公告)号:US20060270190A1

    公开(公告)日:2006-11-30

    申请号:US11137979

    申请日:2005-05-25

    IPC分类号: H01L21/30

    CPC分类号: H01L21/76254

    摘要: A method for transferring a monocrystalline, thin layer from a first substrate onto a second substrate involves deposition of a doped semiconductor layer on a substrate and epitaxial growth of a thin, monocrystalline, semiconductor layer on the doped layer. After bonding the thin epitaxial monocrystalline semiconductor layer to a second substrate, hydrogen is introduced into the doped layer, and the thin layer is cleaved and transferred to the second substrate, with the cleaving controlled to happen at the doped layer.

    摘要翻译: 将单晶薄层从第一衬底转移到第二衬底上的方法包括在衬底上沉积掺杂半导体层,并在掺杂层上沉积薄的单晶半导体层。 在将薄的外延单晶半导体层接合到第二衬底之后,将氢引入到掺杂层中,并且薄层被切割并转移到第二衬底,其中解理被控制在掺杂层发生。

    Extendable article holding apparatus
    6.
    发明申请
    Extendable article holding apparatus 审中-公开
    可扩展物品保持装置

    公开(公告)号:US20050248087A1

    公开(公告)日:2005-11-10

    申请号:US11087254

    申请日:2005-03-23

    IPC分类号: A63F1/10 A63F3/06

    摘要: An article holding apparatus comprises a telescoping support structure, a clip device and a mounting structure. The clip device is attached to a first end region of the telescoping support structure. The mounting structure is attached to a second end region of the telescoping support structure. The telescoping support structure is extendable from a fully retracted length to a length of more than 2 times the fully retracted length. The clip device is specifically-configured for compressively holding articles made from one or more relatively thin sheets of material.

    摘要翻译: 物品保持装置包括伸缩支撑结构,夹子装置和安装结构。 夹持装置附接到伸缩支撑结构的第一端部区域。 安装结构附接到伸缩式支撑结构的第二端部区域。 伸缩支撑结构可以从完全缩回的长度延伸到超过完全缩回长度的2倍的长度。 夹具装置专门用于压缩地保持由一个或多个相对薄的材料片制成的物品。

    Thin Film Devices and Low Temperature Process To Make Thin Film Devices
    7.
    发明申请
    Thin Film Devices and Low Temperature Process To Make Thin Film Devices 有权
    薄膜器件和低温工艺制作薄膜器件

    公开(公告)号:US20140367858A1

    公开(公告)日:2014-12-18

    申请号:US14303063

    申请日:2014-06-12

    IPC分类号: H01L23/532 H01L21/768

    摘要: A method for preparing a device having a film on a substrate is disclosed. In the method, a film is deposited on a substrate. The film includes a first and a second metal. The first and the second metals in the film are converted to an intermetallic compound using microwave radiation. One example device prepared by the method includes a silicon substrate and a film on the substrate, wherein the film includes semiconducting copper germanide as the intermetallic compound.

    摘要翻译: 公开了一种在衬底上制备具有膜的器件的方法。 在该方法中,将膜沉积在基板上。 该膜包括第一和第二金属。 使用微波辐射将膜中的第一和第二金属转化为金属间化合物。 通过该方法制备的一个示例性器件包括硅衬底和衬底上的膜,其中该膜包括作为金属间化合物的半导体锗锗。

    Thin Film Devices and Methods for Preparing Thin Film Devices
    8.
    发明申请
    Thin Film Devices and Methods for Preparing Thin Film Devices 有权
    薄膜器件和制备薄膜器件的方法

    公开(公告)号:US20140272396A1

    公开(公告)日:2014-09-18

    申请号:US14205933

    申请日:2014-03-12

    IPC分类号: C23C14/58 C23C14/35 C23C14/20

    摘要: A method for preparing a device having a film on a substrate is disclosed. In the method, a film is deposited on a polymeric substrate. The film includes at least one metal. A metal in the film is converted to a metal oxide using microwave radiation. One example device prepared by the method includes a polyethylene napthalate substrate and a film on the substrate, wherein the film includes a semiconducting copper oxide and silver as a dopant.

    摘要翻译: 公开了一种在衬底上制备具有膜的器件的方法。 在该方法中,将膜沉积在聚合物基底上。 该膜包括至少一种金属。 使用微波辐射将膜中的金属转化为金属氧化物。 通过该方法制备的一个示例性装置包括聚萘二甲酸乙二醇酯基材和在基材上的膜,其中该膜包括半导体氧化铜和作为掺杂剂的银。

    Cladded silver and silver alloy metallization for improved adhesion and electromigration resistance
    9.
    发明申请
    Cladded silver and silver alloy metallization for improved adhesion and electromigration resistance 有权
    银和银合金金属镀层,提高了附着力和电迁移率

    公开(公告)号:US20060199360A1

    公开(公告)日:2006-09-07

    申请号:US11208251

    申请日:2005-08-18

    IPC分类号: H01L21/44 H01L23/48

    摘要: In semiconductor integrated circuit and device fabrication interconnect metallization is accomplished by a clad Ag deposited on a SiO2 level on a Si surface. The clad Ag has a layer of an alloy of Ag and Al (5 atomic %) contacting the SiO2, a layer of substantially pure Ag and an outer layer of the Ag and Al alloy. The alloy improves adhesion to the SiO2, avoids agglomeration of the Ag, reduces or eliminates diffusion at the SiO2 surface, reduces electromigration and presents a passive exterior surface.

    摘要翻译: 在半导体集成电路和器件制造互连中,通过沉积在Si表面上的SiO2层上的包层Ag来实现金属化。 包层Ag具有与SiO 2接触的Ag和Al(5原子%)的合金层,基本上纯的Ag的层和Ag和Al合金的外层。 该合金提高了与SiO2的粘附性,避免了Ag的聚集,减少或消除了SiO 2表面的扩散,减少了电迁移并呈现了被动的外表面。