INTEGRATED DEEP TRENCH CAPACITOR HAVING HIGH CAPACITANCE DENSITY AND VOLTAGE LINEARITY

    公开(公告)号:US20250142843A1

    公开(公告)日:2025-05-01

    申请号:US18498811

    申请日:2023-10-31

    Abstract: An integrated circuit including an integrated trench capacitor in a substrate. The trench capacitor includes a plurality of deep trenches extending into the substrate, the trenches filled with a conductive trench-fill material. A first subset of the trenches located in an N-type well and a second subset of the trenches located in a P-type well. A first capacitor terminal connects the conductive trench-fill material in the first subset of trenches and the conductive trench-fill material in the second subset of trenches. A second capacitor terminal connects the N-type well and the P-type well.

    MULTIPLE STATE PROGRAMMABLE MEMORY

    公开(公告)号:US20250048656A1

    公开(公告)日:2025-02-06

    申请号:US18228338

    申请日:2023-07-31

    Abstract: Described examples include an integrated circuit having a plurality of nominally identical polycrystalline silicon resistors over a semiconductor substrate. Each of the polysilicon resistors has a resistor body with a first end and a second end, wherein the first end is connected to a current source and the second end is connected to a resistance discriminator. A first proper subset of the resistors have a first resistance, and a second first proper subset of the resistors have a difference second resistance.

    ASYMMETRICAL CHANNEL FLOATING GATE THREE-STATE ONE-TIME PROGRAMMABLE NONVOLATILE MEMORY

    公开(公告)号:US20250081449A1

    公开(公告)日:2025-03-06

    申请号:US18240580

    申请日:2023-08-31

    Abstract: An electronic device with a non-volatile memory includes a non-volatile memory (NVM) cell selectively programmable to change a program state from a first state to a second state or to a third state, and may also include a write circuit configured to selectively program the NVM cell to change the program state from the first state to the second state by applying a programming voltage signal to a first source/drain region and to change the program state from the first state to the third state by applying the programming voltage signal to a second source/drain region. A read circuit is configured to identify the program state of the NVM memory cell as one of the first state, the second state, and the third state based on a cell voltage of the non-volatile memory cell.

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