公开(公告)号：US20170147423A9

公开(公告)日：2017-05-25

申请号：US14602933

申请日：2015-01-22

Applicant: Texas Instruments Incorporated

Inventor： Yanyang Xiao ,  Alexandre Pierre Palus ,  Karl Friedrich Greb ,  Kevin Patrick Lavery ,  Paul Krause

IPC: G06F11/07

CPC classification number: G06F11/0763 ,  G06F9/3004 ,  G06F9/30076 ,  G06F11/1008 ,  G06F11/1016 ,  G06F11/1048 ,  G06F11/1068 ,  G06F11/1641 ,  G06F11/1654 ,  G06F11/28 ,  G06F13/4013 ,  G06K9/00986 ,  G11C29/00 ,  G11C29/14 ,  G11C29/48 ,  G11C29/52 ,  G11C2029/0411 ,  H03M13/13 ,  H03M13/27

Abstract: An electronic circuit includes a microcontroller processor (410), a peripheral (420) coupled with the processor, an endian circuit (470) coupled with the processor and the peripheral to selectively provide different endianess modes of operation, and a detection circuit (140) to detect a failure to select a given endianess, whereby inadvertent switch of endianess due to faults is avoided. Other circuits, devices, systems, methods of operation and processes of manufacture are also disclosed.

公开(公告)号：US09710318B2

公开(公告)日：2017-07-18

申请号：US14602933

申请日：2015-01-22

Applicant: Texas Instruments Incorporated

Inventor： Yanyang Xiao ,  Alexandre Pierre Palus ,  Karl Friedrich Greb ,  Kevin Patrick Lavery ,  Paul Krause

IPC: G06F11/07 ,  G11C29/52 ,  G11C29/00 ,  G11C29/48 ,  G06F11/10 ,  G11C29/14 ,  H03M13/27 ,  G06F13/40 ,  G06K9/00 ,  G06F9/30 ,  G06F11/28 ,  G06F11/16 ,  H03M13/13 ,  G11C29/04

CPC classification number: G06F11/0763 ,  G06F9/3004 ,  G06F9/30076 ,  G06F11/1008 ,  G06F11/1016 ,  G06F11/1048 ,  G06F11/1068 ,  G06F11/1641 ,  G06F11/1654 ,  G06F11/28 ,  G06F13/4013 ,  G06K9/00986 ,  G11C29/00 ,  G11C29/14 ,  G11C29/48 ,  G11C29/52 ,  G11C2029/0411 ,  H03M13/13 ,  H03M13/27

Abstract: An electronic circuit includes a microcontroller processor (410), a peripheral (420) coupled with the processor, an endian circuit (470) coupled with the processor and the peripheral to selectively provide different endianess modes of operation, and a detection circuit (140) to detect a failure to select a given endianess, whereby inadvertent switch of endianess due to faults is avoided. Other circuits, devices, systems, methods of operation and processes of manufacture are also disclosed.

公开(公告)号：US20150143181A1

公开(公告)日：2015-05-21

申请号：US14602933

申请日：2015-01-22

Applicant: Texas Instruments Incorporated

Inventor： Yanyang Xiao ,  Alexandre Pierre Palus ,  Karl Friedrich Greb ,  Kevin Patrick Lavery ,  Paul Krause

IPC: G06F11/07

CPC classification number: G06F11/0763 ,  G06F9/3004 ,  G06F9/30076 ,  G06F11/1008 ,  G06F11/1016 ,  G06F11/1048 ,  G06F11/1068 ,  G06F11/1641 ,  G06F11/1654 ,  G06F11/28 ,  G06F13/4013 ,  G06K9/00986 ,  G11C29/00 ,  G11C29/14 ,  G11C29/48 ,  G11C29/52 ,  G11C2029/0411 ,  H03M13/13 ,  H03M13/27

Abstract: An electronic circuit includes a microcontroller processor (410), a peripheral (420) coupled with the processor, an endian circuit (470) coupled with the processor and the peripheral to selectively provide different endianess modes of operation, and a detection circuit (140) to detect a failure to select a given endianess, whereby inadvertent switch of endianess due to faults is avoided. Other circuits, devices, systems, methods of operation and processes of manufacture are also disclosed.

Abstract translation: 电子电路包括微处理器（410），与处理器耦合的外围设备（420），与处理器和外围设备耦合的端电路（470），以选择性地提供不同的端对端操作模式;以及检测电路（140） 检测到无法选择给定的字节码，从而避免了由于故障导致的无意识切换。 还公开了其它电路，装置，系统，操作方法和制造方法。