-
公开(公告)号：US20140039664A1
公开(公告)日：2014-02-06
申请号：US13564337
申请日：2012-08-01
IPC分类号： G06F19/00
CPC分类号： G01R31/2894 , G01R31/2855 , G01R31/2868 , G01R31/287 , G01R31/2879 , G01R31/31718 , G05B19/41875 , Y02P90/14 , Y02P90/265
摘要： Methods and systems optimize power usage in an integrated circuit design by sorting the integrated circuit devices after manufacture into relatively slow integrated circuit devices and relatively fast integrated circuit devices to classify the integrated circuit devices into different voltage bins. The methods and systems establish a bin-specific reliability testing processes for each of the voltage bins and test the integrated circuit devices using a tester. This allows the methods and systems to identify as defective ones of the integrated circuit devices that fail the bin-specific integrated circuit reliability testing processes of a corresponding voltage bin. The methods and systems remove the defective ones of the integrated circuit devices to allow only non-defective integrated circuit devices to remain and supply the non-defective integrated circuit devices to a customer.
摘要翻译： 方法和系统通过将制造后的集成电路器件分类为相对较慢的集成电路器件和相对较快的集成电路器件来将集成电路器件分类到不同的电压仓中来优化集成电路设计中的功率利用。 方法和系统为每个电压仓建立一个二进制特定的可靠性测试过程，并使用测试仪测试集成电路器件。 这允许方法和系统将不合格的集成电路设备中的缺陷识别为相应电压仓的专用集成电路可靠性测试过程。 所述方法和系统移除集成电路器件中的有缺陷的集成电路器件，以便只允许无故障的集成电路器件保持并向客户提供无缺陷的集成电路器件。
-
公开(公告)号：US09429619B2
公开(公告)日：2016-08-30
申请号：US13564337
申请日：2012-08-01
IPC分类号： G06F19/00 , G01R31/28 , G05B19/418 , G01R31/317
CPC分类号： G01R31/2894 , G01R31/2855 , G01R31/2868 , G01R31/287 , G01R31/2879 , G01R31/31718 , G05B19/41875 , Y02P90/14 , Y02P90/265
摘要： Methods and systems optimize power usage in an integrated circuit design by sorting the integrated circuit devices after manufacture into relatively slow integrated circuit devices and relatively fast integrated circuit devices to classify the integrated circuit devices into different voltage bins. The methods and systems establish a bin-specific reliability testing processes for each of the voltage bins and test the integrated circuit devices using a tester. This allows the methods and systems to identify as defective ones of the integrated circuit devices that fail the bin-specific integrated circuit reliability testing processes of a corresponding voltage bin. The methods and systems remove the defective ones of the integrated circuit devices to allow only non-defective integrated circuit devices to remain and supply the non-defective integrated circuit devices to a customer.
摘要翻译： 方法和系统通过将制造后的集成电路器件分类为相对较慢的集成电路器件和相对较快的集成电路器件来将集成电路器件分类到不同的电压仓中来优化集成电路设计中的功率利用。 方法和系统为每个电压仓建立一个二进制特定的可靠性测试过程，并使用测试仪测试集成电路器件。 这允许方法和系统将不合格的集成电路设备中的缺陷识别为相应电压箱的专用集成电路可靠性测试过程。 所述方法和系统移除集成电路器件中的有缺陷的集成电路器件，以便只允许无故障的集成电路器件保持并向客户提供无缺陷的集成电路器件。
-
搜索结果
2 条记录 (耗时 0.026 秒)
