摘要:
The invention relates to a method for determining engine oil servicing dates for a motor vehicle engine as a function of recorded engine operating parameters. According to the invention, the number of engine revolutions and at least one engine other operating parameter relevant to engine oil ageing are continuously recorded and, on the basis of this, a fictitious distance is determined by associating the recorded engine revolutions with the evaluation factors dependent on recorded engine operating parameter(s) relevant to engine oil ageing in accordance with a predeterminable association relationship. From this, a remaining operating distance until the next engine oil servicing date is then calculated by subtracting the determined fictitious distance from a specified total distance potential.
摘要:
A first semiconductor zone of a first conduction type is formed from a semiconductor base material doped with first and second dopants. The first and second dopants are different substances and also different from the semiconductor base material. The first dopant is electrically active and causes a doping of the first conduction type in the semiconductor base material, and causes either a decrease or an increase of a lattice constant of the pure, undoped first semiconductor zone. The second dopant may be electrically active, and may be of the same doping type as the first dopant, causes one or both of: a hardening of the first semiconductor zone; an increase of the lattice constant of the pure, undoped first semiconductor zone if the first dopant causes a decrease, and a decrease of the lattice constant of the pure, undoped first semiconductor zone if the first dopant causes an increase, respectively.
摘要:
A first semiconductor zone of a first conduction type is formed from a semiconductor base material doped with first and second dopants. The first and second dopants are different substances and also different from the semiconductor base material. The first dopant is electrically active and causes a doping of the first conduction type in the semiconductor base material, and causes either a decrease or an increase of a lattice constant of the pure, undoped first semiconductor zone. The second dopant may be electrically active, and may be of the same doping type as the first dopant, causes one or both of: a hardening of the first semiconductor zone; an increase of the lattice constant of the pure, undoped first semiconductor zone if the first dopant causes a decrease, and a decrease of the lattice constant of the pure, undoped first semiconductor zone if the first dopant causes an increase, respectively.