摘要:
In a substrate-processing method including a step of forming a liquid immersion area of a liquid on a substrate and performing exposure for the substrate by irradiating an exposure light beam onto the substrate through the liquid in the liquid immersion area, a liquid contact time, during which the substrate is in contact with the liquid in the liquid immersion area, is managed. Accordingly, in a device producing process, it is possible to suppress the occurrence of device defect.
摘要:
A lithographic projection apparatus includes a substrate table configured to hold a substrate, a projection system arranged to project a patterned beam of radiation onto the substrate, a liquid supply system configured to supply liquid to a space between the projection system and the substrate, and a residual liquid detector configured to detect liquid remaining on the substrate and/or the substrate table after an exposure is completed. A device manufacturing method includes projecting, using a projection system of a lithographic apparatus, a patterned beam of radiation through a liquid onto a substrate, the substrate being held by a substrate table, and, after the projecting is complete, detecting residual liquid on the substrate and/or the substrate table.
摘要:
A lithographic projection apparatus includes a substrate table configured to hold a substrate, a projection system arranged to project a patterned beam of radiation onto the substrate, a liquid supply system configured to supply liquid to a space between the projection system and the substrate, and a residual liquid detector configured to detect liquid remaining on the substrate and/or the substrate table after an exposure is completed.
摘要:
A method of pattern forming includes forming a resist film on a substrate, transferring a pattern onto the resist film by an immersion lithography method using a liquid immersion fluid to form a latent image on the resist film, conducting a first inspection to inspect whether or not the liquid immersion fluid remains on the resist film after said forming the latent image, developing the resist film after the first inspection, and performing predetermined processing when residual of the liquid immersion fluid is found in the first inspection.
摘要:
An exposure apparatus for exposing a substrate by emitting exposure light thereto through a projection optical system and liquid, has a detection apparatus that detects whether the liquid is present on an object disposed lower than a front end of the projection optical system. Another detection apparatus has an emitting portion that emits detection light to an immersion area between the projection optical system and an object disposed on an image plane side thereof, and a light-receiving portion disposed at a predetermined position for the detection light; therein, at least one of size and shape of the immersion area is obtained based on light receiving results. The detection apparatus is used to detect the presence of liquid on such lower-disposed object, the state of the immersion area, or shape or contact angle of the liquid. Optimal measures are taken, based on detection results, for maintaining high exposure and measurement accuracies.
摘要:
A method for exposing a substrate includes holding the substrate on a substrate holding member, irradiating, via a liquid, a light beam to the substrate on the substrate holding member, and removing, after the exposure of the substrate via the liquid, a liquid remained on the substrate before supporting the substrate by a transferring member. The transferring member transfers the exposed substrate from the substrate holding member to outside of the substrate holding member.
摘要:
A system renting out file servers to many companies in a data center has a security problem so that the user cannot perform operation needing manager authorization in the file servers. An OS provides execution administrative area information of an application program designated by process information which can specify the range of an accessible device to operate the server system of the customer in the administrative area information.
摘要:
A load/unload-type head suspension is capable of suppressing frictional coefficient variations. The head suspension has a head and a tab that is slid and guided along a ramp block in a read/write apparatus, to move the head away from a hard disk to a retract position. The tab is provided with microscopic irregularities to suppress frictional coefficient variations when the tab is guided along the ramp block. A center line average roughness (Ra) of the microscopic irregularities being greater than 0.2 μm or smaller than 0.6 μm.
摘要:
A method of manufacturing a load beam precisely positions a slider on a dimple of a load beam according to precisely obtained positional data of the dimple, the method includes preparing a work which is a flat plate and serves as the load beam, irradiating at least a part of the work where the dimple is formed with a laser beam, to form a modified part at the irradiated part, carrying out plastic working on the modified part, to form the dimple having a concave curved surface at the modified part, taking an image of the concave curved surface of the dimple, obtaining the positional data of the dimple from the image, and positioning the slider on the dimple according to the positional data.