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    METHOD OF PROGRAMMING A NON-VOLATILE MEMORY DEVICE
    4.
    发明申请
    METHOD OF PROGRAMMING A NON-VOLATILE MEMORY DEVICE 有权
    编程非易失性存储器件的方法

    公开(公告)号：US20080291716A1

    公开(公告)日：2008-11-27

    申请号：US12123827

    申请日：2008-05-20

    申请人： Takuya Futatsuyama ,  Koji Hosono ,  Toshiaki Edahiro ,  Naoya Tokiwa ,  Kazushige Kanda ,  Shigeo Ohshima

    发明人： Takuya Futatsuyama ,  Koji Hosono ,  Toshiaki Edahiro ,  Naoya Tokiwa ,  Kazushige Kanda ,  Shigeo Ohshima

    IPC分类号： G11C11/00

    CPC分类号： G11C11/36

    摘要： A method of programming a non-volatile memory device with memory cells formed of variable resistance elements and disposed between word lines and bit lines, includes: previously charging a selected word line and a selected bit line together with a non-selected word line and a non-selected bit line up to a certain voltage; and further charging the selected word line and the non-selected bit line up to a program voltage higher than the certain voltage and a program-block voltage, respectively, and simultaneously discharging the selected bit line.

    摘要翻译： 一种使用由可变电阻元件形成并且设置在字线和位线之间的存储单元来编程非易失性存储器件的方法包括：预先对所选择的字线和所选择的位线以及未选择的字线和 非选择位线达到一定电压; 并且进一步对所选字线和未选择的位线进行充电，直到分别高于特定电压和编程块电压的编程电压，并同时对所选择的位线进行放电。

    Method of programming a non-volatile memory device
    5.
    发明授权
    Method of programming a non-volatile memory device 有权
    编程非易失性存储器件的方法

    公开(公告)号：US07911823B2

    公开(公告)日：2011-03-22

    申请号：US12123827

    申请日：2008-05-20

    申请人： Takuya Futatsuyama ,  Koji Hosono ,  Toshiaki Edahiro ,  Naoya Tokiwa ,  Kazushige Kanda ,  Shigeo Ohshima

    发明人： Takuya Futatsuyama ,  Koji Hosono ,  Toshiaki Edahiro ,  Naoya Tokiwa ,  Kazushige Kanda ,  Shigeo Ohshima

    IPC分类号： G11C11/00 ,  G11C7/00 ,  G11C7/02 ,  G11C7/12 ,  G11C8/08

    CPC分类号： G11C11/36

    摘要： A method of programming a non-volatile memory device with memory cells formed of variable resistance elements and disposed between word lines and bit lines, includes: previously charging a selected word line and a selected bit line together with a non-selected word line and a non-selected bit line up to a certain voltage; and further charging the selected word line and the non-selected bit line up to a program voltage higher than the certain voltage and a program-block voltage, respectively, and simultaneously discharging the selected bit line.

    摘要翻译： 一种使用由可变电阻元件形成并且设置在字线和位线之间的存储单元来编程非易失性存储器件的方法包括：预先对所选择的字线和所选择的位线以及未选择的字线和 非选择位线达到一定电压; 并且进一步对所选字线和未选择的位线进行充电，直到分别高于特定电压和编程块电压的编程电压，并同时对所选择的位线进行放电。

    Non-volatile memory device
    6.
    发明授权
    Non-volatile memory device 有权
    非易失性存储器件

    公开(公告)号：US07817457B2

    公开(公告)日：2010-10-19

    申请号：US12132972

    申请日：2008-06-04

    申请人： Naoya Tokiwa ,  Kazushige Kanda ,  Toshiaki Edahiro ,  Koji Hosono ,  Takuya Futatsuyama ,  Shigeo Ohshima

    发明人： Naoya Tokiwa ,  Kazushige Kanda ,  Toshiaki Edahiro ,  Koji Hosono ,  Takuya Futatsuyama ,  Shigeo Ohshima

    IPC分类号： G11C11/00

    CPC分类号： G11C13/0069 ,  G11C13/0007 ,  G11C13/0097 ,  G11C2013/0092 ,  G11C2213/32 ,  G11C2213/72

    摘要： According to one embodiment, a nonvolatile memory device includes: a memory cell array including memory cells each having a variable resistance element for nonvolatilely storing data identified by an electrically rewritable resistance value; a first data latch storing write and erase data to be written on a given group of memory cells of the memory cell array for a write and erase operation; and a second data latch storing reference data for performing a compensation operation of the given group to compensate write and erase disturbance accompanied by the write or erase operation.

    摘要翻译： 根据一个实施例，非易失性存储器件包括：存储单元阵列，其包括各自具有用于非易失性地存储由电可重写电阻值识别的数据的可变电阻元件的存储单元; 存储要写入存储单元阵列的给定组的存储单元的用于写入和擦除操作的写入和擦除数据的第一数据锁存器; 以及第二数据锁存器，存储用于执行给定组的补偿操作以补偿伴随着写入或擦除操作的写入和擦除干扰的参考数据。

    NON-VOLATILE MEMORY DEVICE
    8.
    发明申请
    NON-VOLATILE MEMORY DEVICE 有权
    非易失性存储器件

    公开(公告)号：US20090010039A1

    公开(公告)日：2009-01-08

    申请号：US12132972

    申请日：2008-06-04

    申请人： Naoya Tokiwa ,  Kazushige Kanda ,  Toshiaki Edahiro ,  Koji Hosono ,  Takuya Futatsuyama ,  Shigeo Ohsima

    发明人： Naoya Tokiwa ,  Kazushige Kanda ,  Toshiaki Edahiro ,  Koji Hosono ,  Takuya Futatsuyama ,  Shigeo Ohsima

    IPC分类号： G11C11/00 ,  G11C7/00

    CPC分类号： G11C13/0069 ,  G11C13/0007 ,  G11C13/0097 ,  G11C2013/0092 ,  G11C2213/32 ,  G11C2213/72

    摘要： According to one embodiment, a nonvolatile memory device includes: a memory cell array including memory cells each having a variable resistance element for nonvolatilely storing data identified by an electrically rewritable resistance value; a first data latch storing write and erase data to be written on a given group of memory cells of the memory cell array for a write and erase operation; and a second data latch storing reference data for performing a compensation operation of the given group to compensate write and erase disturbance accompanied by the write or erase operation.

    摘要翻译： 根据一个实施例，非易失性存储器件包括：存储单元阵列，其包括各自具有用于非易失性地存储由电可重写电阻值识别的数据的可变电阻元件的存储单元; 存储要写入存储单元阵列的给定组的存储单元的用于写入和擦除操作的写入和擦除数据的第一数据锁存器; 以及第二数据锁存器，存储用于执行给定组的补偿操作以补偿伴随着写入或擦除操作的写入和擦除干扰的参考数据。

    NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
    9.
    发明申请
    NONVOLATILE SEMICONDUCTOR MEMORY DEVICE 有权
    非易失性半导体存储器件

    公开(公告)号：US20100188920A1

    公开(公告)日：2010-07-29

    申请号：US12693824

    申请日：2010-01-26

    申请人： Takuya FUTATSUYAMA ,  Naoya Tokiwa

    发明人： Takuya FUTATSUYAMA ,  Naoya Tokiwa

    IPC分类号： G11C5/14

    CPC分类号： G11C5/147 ,  G11C16/30

    摘要： A nonvolatile semiconductor memory device has an internal step-down power generation circuit and a memory circuit. The internal step-down power generation circuit generates a first internal power supply voltage from an external power supply voltage in an active state, and generates a second internal power supply voltage different from the first internal power supply voltage from the external power supply voltage in a standby state. The memory circuit includes a cell array containing a nonvolatile memory cell and a sense amplifier detecting data read from the cell array. The sense amplifier is supplied with a voltage generated by the internal step-down power generation circuit as an internal power supply voltage.

    摘要翻译： 非易失性半导体存储器件具有内部降压发电电路和存储电路。 内部降压发电电路从活动状态的外部电源电压产生第一内部电源电压，并且从外部电源电压生成与第一内部电源电压不同的第二内部电源电压 待机状态。 存储电路包括一个包含非易失性存储单元的单元阵列和一个检测从该单元阵列读出的数据的读出放大器。 感测放大器被提供有由内部降压发电电路产生的电压作为内部电源电压。

    Nonvolatile semiconductor memory device
    10.
    发明授权
    Nonvolatile semiconductor memory device 有权
    非易失性半导体存储器件

    公开(公告)号：US08289800B2

    公开(公告)日：2012-10-16

    申请号：US12693824

    申请日：2010-01-26

    申请人： Takuya Futatsuyama ,  Naoya Tokiwa

    发明人： Takuya Futatsuyama ,  Naoya Tokiwa

    IPC分类号： G11C5/14

    CPC分类号： G11C5/147 ,  G11C16/30

    摘要： A nonvolatile semiconductor memory device has an internal step-down power generation circuit and a memory circuit. The internal step-down power generation circuit generates a first internal power supply voltage from an external power supply voltage in an active state, and generates a second internal power supply voltage different from the first internal power supply voltage from the external power supply voltage in a standby state. The memory circuit includes a cell array containing a nonvolatile memory cell and a sense amplifier detecting data read from the cell array. The sense amplifier is supplied with a voltage generated by the internal step-down power generation circuit as an internal power supply voltage.

    摘要翻译： 非易失性半导体存储器件具有内部降压发电电路和存储电路。 内部降压发电电路从活动状态的外部电源电压产生第一内部电源电压，并且从外部电源电压生成与第一内部电源电压不同的第二内部电源电压 待机状态。 存储电路包括一个包含非易失性存储单元的单元阵列和一个检测从该单元阵列读出的数据的读出放大器。 感测放大器被提供有由内部降压发电电路产生的电压作为内部电源电压。