-
1.
公开(公告)号:US20180226268A1
公开(公告)日:2018-08-09
申请号:US15697615
申请日:2017-09-07
发明人: Takashi Izumi , Fumitoshi Ikegaya
IPC分类号: H01L21/3213 , H01L21/67 , C25D17/00
CPC分类号: H01L21/32134 , C25D5/48 , C25D17/001 , H01L21/02087 , H01L21/67023 , H01L21/67051
摘要: A semiconductor manufacturing apparatus according to the present embodiment has a mount unit capable of mounting a substrate. A first supplier supplies a chemical solution onto the substrate. A first protection plate is provided along an outer circumference of the substrate, to receive the chemical solution splashing from the substrate. A second supplier is provided above the first protection plate, to supply a cleaning solution to an inner surface of the first protection plate.
-
公开(公告)号:US10483126B2
公开(公告)日:2019-11-19
申请号:US15697615
申请日:2017-09-07
发明人: Takashi Izumi , Fumitoshi Ikegaya
IPC分类号: H01L21/3213 , H01L21/67 , C25D17/00 , C25D5/48 , H01L21/02
摘要: A semiconductor manufacturing apparatus according to the present embodiment has a mount unit capable of mounting a substrate. A first supplier supplies a chemical solution onto the substrate. A first protection plate is provided along an outer circumference of the substrate, to receive the chemical solution splashing from the substrate. A second supplier is provided above the first protection plate, to supply a cleaning solution to an inner surface of the first protection plate.
-
公开(公告)号:US10738389B2
公开(公告)日:2020-08-11
申请号:US14847374
申请日:2015-09-08
发明人: Takashi Izumi , Fumitoshi Ikegaya
摘要: A semiconductor manufacturing apparatus according to an embodiment comprises a container contains a mixed solution that includes a processing solution for plating processing of a substrate and an additive and being capable of draining a part of the mixed solution when a first condition is satisfied. A first supplier supplies the processing solution to the container. A second supplier supplies the additive to the container when the first condition is satisfied and drainage of a part of the mixed solution is finished.
-
-