公开(公告)号：US12135350B2

公开(公告)日：2024-11-05

申请号：US17315313

申请日：2021-05-09

Applicant: Tzu-Ching Yang ,  Shih-Chao Lin

Inventor： Tzu-Ching Yang ,  Shih-Chao Lin

IPC: G01R31/28 ,  G01R31/317

Abstract: Herein disclosed are an electronic component testing system and a time certification method. The electronic component testing system comprising a testing device and an interface device. The testing device comprises a backboard, and the backboard electrically connected to at least one test board and comprising a time certification component. The interface device, electrically connected to the testing device, provides a test instruction. Wherein the time certification component stores an authorization start time and an authorization end time. Wherein the testing device starts a test procedure according to the test instruction, the time certification component updates the authorization start time to a first stop time of the test procedure after the test procedure is completed.

公开(公告)号：US07893384B2

公开(公告)日：2011-02-22

申请号：US11160270

申请日：2005-06-16

Applicant: Shih-Chao Lin

Inventor： Shih-Chao Lin

IPC: B23K26/00 ,  B23K26/02

CPC classification number: B23K26/032 ,  B23K26/03 ,  B23K26/0624 ,  B23K26/066

Abstract: A laser material manipulation system is provided for material processing, such as laser ablation, laser deposition and laser machining. The system includes a laser for emitting laser pulses and a laser imaging device having an array of controllable imaging elements. The laser imaging device receives the laser pulses emitted from the laser, forms a laser image through the controllable imaging elements, and projects the laser image onto a target material which is to be processed. The projected laser image processes the material according to a desired pattern. The laser can be a femtosecond laser. The laser imaging device can be a liquid crystal display (LCD) or a digital micromirror device (DMD). An SEM can be used for monitoring the material distribution and dynamically adjust the laser image according to the monitor result.

Abstract translation: 提供激光材料操作系统，用于材料加工，如激光烧蚀，激光沉积和激光加工。 该系统包括用于发射激光脉冲的激光器和具有可控成像元件阵列的激光成像装置。 激光成像装置接收从激光发射的激光脉冲，通过可控成像元件形成激光图像，并将激光图像投影到待处理的目标材料上。 投影的激光图像根据期望的图案处理材料。 激光可以是飞秒激光。 激光成像装置可以是液晶显示器（LCD）或数字微镜装置（DMD）。 SEM可用于监测材料分布，并根据监测结果动态调整激光图像。

公开(公告)号：US20060119743A1

公开(公告)日：2006-06-08

申请号：US11160270

申请日：2005-06-16

Applicant: Shih-Chao Lin

Inventor： Shih-Chao Lin

IPC: H04N5/74

CPC classification number: B23K26/032 ,  B23K26/03 ,  B23K26/0624 ,  B23K26/066

Abstract: A laser material manipulation system is provided for material manipulations such as laser ablation, laser deposition and laser machining. The system includes a laser for emitting laser pulses and a laser imaging device having an array of controllable imaging elements. The laser imaging device receives the laser pulses emitted from the laser, forms a laser image through the controllable imaging elements, and projects the laser image onto a target material which needs to be manipulated. The projected laser image manipulates the material according to a desired manipulation pattern. The laser can be a femtosecond laser. The laser imaging device can be a liquid crystal display (LCD) or a digital micromirror device (DMD). An SEM can be used for monitoring the material distribution and dynamically adjust the laser image according to the monitor result.

Abstract translation: 为激光烧蚀，激光沉积和激光加工等材料操作提供激光材料操纵系统。 该系统包括用于发射激光脉冲的激光器和具有可控成像元件阵列的激光成像装置。 激光成像装置接收从激光发射的激光脉冲，通过可控成像元件形成激光图像，并将激光图像投影到需要操纵的目标材料上。 投影的激光图像根据期望的操作模式来操纵材料。 激光可以是飞秒激光。 激光成像装置可以是液晶显示器（LCD）或数字微镜装置（DMD）。 SEM可用于监测材料分布，并根据监测结果动态调整激光图像。

公开(公告)号：US5216235A

公开(公告)日：1993-06-01

申请号：US873361

申请日：1992-04-24

Applicant: Shih-Chao Lin

Inventor： Shih-Chao Lin

IPC: G01B11/02 ,  G01Q20/00 ,  G02B7/198 ,  G02B7/28 ,  H01J37/21 ,  H01J37/22

CPC classification number: G01B11/026 ,  G02B7/28 ,  H01J37/22 ,  H01J2237/20235 ,  H01J2237/21 ,  H01J2237/216 ,  H01J2237/2482 ,  H01J2237/28

Abstract: The disclosed apparatus comprises a charged particle beam system and method including a particle beam generator for forming a beam of electrons, ions or other charged particles and for directing the beam along a predetermined axis to a focal point. Object support means support an object on the particle beam axis with the focal point on a surface of the object. There is provided an optical beam system forming part of an autofocusing system for maintaining the relative positions of the beam generating means and the object support means along the particle beam axis. The optical beam system comprises means for developing an optical beam, and means for directing the optical beam transversely to the particle beam axis and at an acute angle to the object surface. Means are provided for forming an optical beam first focus on a surface of the object. Optical image forming mirror means collects radiation from the optical beam first focus and forms a beam second focus in the vicinity of the beam first focus such that a change in the height or vertical position of the object surface along the particle beam axis produces a change in the position of the second focus indicative of the object surface height or position change.