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公开(公告)号：US20230410047A1
公开(公告)日：2023-12-21
申请号：US17866595
申请日：2022-07-18
Applicant: UNITED MICROELECTRONICS CORP.
Inventor： Ching-Pei LIN , Te-Hsuan CHEN
CPC classification number: G06Q10/103 , G06Q10/06 , H04L12/1822
Abstract: An execution method of an online discussion board and a server using the same are provided. The server includes an information collection unit, an analyzing unit, a discussion board management unit and a recording unit. The information collection unit is configured to obtain a plurality of process problem messages. The analyzing unit is configured to automatically obtain a process analysis report according to the process problem messages. The discussion board management unit is configured to automatically create the online discussion board. At least two users are invited to enter the online discussion board. The process analysis report is shown in the online discussion board. The recording unit is configured to store a discussion record on the online discussion board. The online discussion board is held for a period of time.
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2.发明公开公开(公告)号：US20230238262A1
公开(公告)日：2023-07-27
申请号：US17695299
申请日：2022-03-15
Applicant: UNITED MICROELECTRONICS CORP.
Inventor： Hsiao-Ying YANG , Ching-Pei LIN , Chung-Yi CHIU , Ming-Wei CHEN , Te-Hsuan CHEN , Chia-Wei CHEN , Wen-Shan HUANG
CPC classification number: H01L21/67276 , G06N20/00
Abstract: A semiconductor manufacturing process prediction method and a semiconductor manufacturing process prediction device are provided. The semiconductor manufacturing process prediction method includes the following steps. A plurality of process data are obtained. According to the process data, a machine learning model is used to execute prediction and obtain a prediction confidence and a prediction yield. Whether the prediction confidence is lower than a predetermined level is determined. If the prediction confidence is lower than the predetermined level, the machine learning model is modified. According to the process data, the prediction yield is adjusted.
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公开(公告)号：US20230236553A1
公开(公告)日：2023-07-27
申请号：US17695255
申请日：2022-03-15
Applicant: UNITED MICROELECTRONICS CORP.
Inventor： Chia-Wei CHEN , Ching-Pei LIN , Chung-Yi CHIU , Te-Hsuan CHEN , Ming-Wei CHEN , Hsiao-Ying YANG
CPC classification number: G05B13/048 , H01L22/14 , H01L22/12
Abstract: A training method of a semiconductor process prediction model, a semiconductor process prediction device, and a semiconductor process prediction method are provided. The training method of the semiconductor process prediction model includes the following steps. The semiconductor process was performed on several samples. A plurality of process data of the samples are obtained. A plurality of electrical measurement data of the samples are obtained. Some of the samples having physical defects are filtered out according to the process data. The semiconductor process prediction model is trained according to the process data and the electrical measurement data of the filtered samples.
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公开(公告)号：US20220222162A1
公开(公告)日：2022-07-14
申请号：US17180897
申请日：2021-02-22
Applicant: UNITED MICROELECTRONICS CORP.
Inventor： Ching-Pei LIN , Ji-Fu KUNG , Te-Hsuan CHEN , Yi-Lin HUNG
Abstract: An operation method and an operation device of a failure detection and classification (FDC) model are provided. The operation method of the FDC model includes the following steps. A plurality of raw traces are continuously obtained. If the raw traces have started to be changed from the first waveform to the second waveform, whether at least N pieces in the race traces have been changed to the second waveform is determined. If at least N pieces in the raw traces have been changed to the second waveform, the raw traces which have been changed to the second waveform are automatically segmented to obtain several windows. An algorithm is automatically set for each of the windows. Through each of the algorithms, an indicator of each of the windows is obtained. The FDC model is retrained based on these indicators.
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