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    Method and kit for calibrating a photoluminescence measurement system
    2.
    发明授权
    Method and kit for calibrating a photoluminescence measurement system 有权
    用于校准光致发光测量系统的方法和试剂盒

    公开(公告)号：US07947502B2

    公开(公告)日：2011-05-24

    申请号：US12729614

    申请日：2010-03-23

    申请人： Ute Resch-Genger ,  Dietmar Pfeifer ,  Christian Monte ,  Angelika Hoffmann ,  Pierre Nording ,  Bernhard Schönenberger ,  Katrin Hoffmann ,  Monika Spieles ,  Knut Rurack

    发明人： Ute Resch-Genger ,  Dietmar Pfeifer ,  Christian Monte ,  Angelika Hoffmann ,  Pierre Nording ,  Bernhard Schönenberger ,  Katrin Hoffmann ,  Monika Spieles ,  Knut Rurack

    IPC分类号： G01N31/00 ,  G01N21/76 ,  G01J1/58 ,  G01J1/10

    CPC分类号： G01N21/278 ,  G01N21/64 ,  G01N2021/6417 ,  Y10T436/10 ,  Y10T436/108331

    摘要： The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(λ), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(λ) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm−1. According to the method of the invention, partial correction functions Fi(λ) are generated by forming the quotient of the measured fluorescence spectra Ji(λ) and the corresponding corrected fluorescence spectra Ii(λ), which are then combined to form a total correction function F(λ) for a broad spectral range. The combination factors αi are hereby computed by statistical averaging of consecutive partial correction functions Fi(λ) over only a predefined, limited overlap region λi/i+1±ΔλOL about the mutual crossover wavelength λi/i+1.

    摘要翻译： 本发明涉及用于校准光致发光测量系统，特别是荧光测量系统的方法和试剂盒。 该试剂盒包括许多荧光标准品I及其校准和认证的荧光光谱Ii（λ），从而选择荧光标准品，以使其光谱校正的荧光光谱Ii（λ）覆盖高强度的宽光谱范围。 标准的特征在于它们的至少1400cm-1的带的宽半宽度FWHMi。 根据本发明的方法，通过形成测量的荧光光谱Ji（λ）和对应的校正荧光光谱Ii（λ）的商产生部分校正函数Fi（λ），然后将其组合以形成总校正 函数F（λ）用于宽光谱范围。 因此，通过仅关于相互交叉波长λi/ i + 1的预定义的有限重叠区域λi/ i + 1±＆Dgr;λOL的连续部分校正函数Fi（λ）的统计平均来计算组合因子αi。

    Method and kit for calibrating a photoluminescence measurement
    3.
    发明授权
    Method and kit for calibrating a photoluminescence measurement 有权
    用于校准光致发光测量系统的方法和试剂盒

    公开(公告)号：US07713741B2

    公开(公告)日：2010-05-11

    申请号：US11223202

    申请日：2005-09-09

    申请人： Ute Resch-Genger ,  Dietmar Pfeifer ,  Christian Monte ,  Angelika Hoffmann ,  Pierre Nording ,  Bernhard Schönenberger ,  Katrin Hoffmann ,  Monika Spieles ,  Knut Rurack

    发明人： Ute Resch-Genger ,  Dietmar Pfeifer ,  Christian Monte ,  Angelika Hoffmann ,  Pierre Nording ,  Bernhard Schönenberger ,  Katrin Hoffmann ,  Monika Spieles ,  Knut Rurack

    IPC分类号： G01N31/00 ,  G01N21/76 ,  G01J1/58

    CPC分类号： G01N21/278 ,  G01N21/64 ,  G01N2021/6417 ,  Y10T436/10 ,  Y10T436/108331

    摘要： The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(λ), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(λ) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm−1. According to the method of the invention, partial correction functions Fi(λ) are generated by forming the quotient of the measured fluorescence spectra Ji(λ) and the corresponding corrected fluorescence spectra Ii(λ), which are then combined to form a total correction function F(λ) for a broad spectral range. The combination factors αi are hereby computed by statistical averaging of consecutive partial correction functions Fi(λ) over only a predefined, limited overlap region λi/i+1±ΔλOL about the mutual crossover wavelength λi/i+1.

    摘要翻译： 本发明涉及用于校准光致发光测量系统，特别是荧光测量系统的方法和试剂盒。 该试剂盒包括许多荧光标准品I及其校准和认证的荧光光谱Ii（λ），从而选择荧光标准品，以使其光谱校正的荧光光谱Ii（λ）覆盖高强度的宽光谱范围。 标准的特征在于它们的至少1400cm-1的带的宽半宽度FWHMi。 根据本发明的方法，通过形成测量的荧光光谱Ji（λ）和对应的校正荧光光谱Ii（λ）的商产生部分校正函数Fi（λ），然后将其组合以形成总校正 函数F（λ）用于宽光谱范围。 因此，通过仅关于相互交叉波长λi/ i + 1的预定义的有限重叠区域λi/ i + 1±＆Dgr;λOL的连续部分校正函数Fi（λ）的统计平均来计算组合因子αi。

    Method and kit for calibrating a photoluminescence measurement
    4.
    发明申请
    Method and kit for calibrating a photoluminescence measurement 有权
    用于校准光致发光测量系统的方法和试剂盒

    公开(公告)号：US20060214112A1

    公开(公告)日：2006-09-28

    申请号：US11223202

    申请日：2005-09-09

    申请人： Ute Resch-Genger ,  Dietmar Pfeifer ,  Christian Monte ,  Angelika Hoffmann ,  Pierre Nording ,  Bernhard Schoenenberger ,  Katrin Hoffmann ,  Monika Spieles ,  Knut Rurack

    发明人： Ute Resch-Genger ,  Dietmar Pfeifer ,  Christian Monte ,  Angelika Hoffmann ,  Pierre Nording ,  Bernhard Schoenenberger ,  Katrin Hoffmann ,  Monika Spieles ,  Knut Rurack

    IPC分类号： G01J1/58 ,  G01N31/00

    CPC分类号： G01N21/278 ,  G01N21/64 ,  G01N2021/6417 ,  Y10T436/10 ,  Y10T436/108331

    摘要： The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(λ), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(λ) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm−1. According to the method of the invention, partial correction functions Fi(λ) are generated by forming the quotient of the measured fluorescence spectra Ji(λ) and the corresponding corrected fluorescence spectra Ii(λ), which are then combined to form a total correction function F(λ) for a broad spectral range. The combination factors αi are hereby computed by statistical averaging of consecutive partial correction functions Fi(λ) over only a predefined, limited overlap region λi/i+1±ΔλOL about the mutual crossover wavelength λi/i+1.

    摘要翻译： 本发明涉及用于校准光致发光测量系统，特别是荧光测量系统的方法和试剂盒。 该试剂盒包括许多荧光标准品i及其校准和认证的荧光光谱Iλ（λ），由此选择荧光标准品i，使得它们的光谱校正的荧光光谱I i < / SUB（λ）覆盖了具有高强度的宽光谱范围。 这些标准的特征在于它们的至少1400cm -1的波段的大半宽度FWHMi 。 根据本发明的方法，通过形成所测量的荧光光谱λ（λ）的商和对应的校正函数来产生部分校正函数F（λ） 荧光光谱I（λ），然后将其组合以形成宽光谱范围的总校正函数F（λ）。 因此，通过仅在预定义的有限重叠区域λi / i上的连续部分校正函数F（i）的统计平均来计算组合因子αi i i 关于相互交叉波长λ1/ i + 1的+1 + / / / / -

    METHOD AND KIT FOR CALIBRATING A PHOTOLUMINESCENCE MEASUREMENT SYSTEM
    5.
    发明申请
    METHOD AND KIT FOR CALIBRATING A PHOTOLUMINESCENCE MEASUREMENT SYSTEM 有权
    用于校准光致发光测量系统的方法和工具

    公开(公告)号：US20100219333A1

    公开(公告)日：2010-09-02

    申请号：US12729614

    申请日：2010-03-23

    申请人： Ute Resch-Genger ,  Dietmar Pfeifer ,  Christian Monte ,  Angelika Hoffmann ,  Pierre Nording ,  Bernhard Schönenberger ,  Katrin Hoffmann ,  Monika Spieles ,  Knut Rurack

    发明人： Ute Resch-Genger ,  Dietmar Pfeifer ,  Christian Monte ,  Angelika Hoffmann ,  Pierre Nording ,  Bernhard Schönenberger ,  Katrin Hoffmann ,  Monika Spieles ,  Knut Rurack

    IPC分类号： G01J1/58 ,  G12B13/00 ,  G01J1/10

    CPC分类号： G01N21/278 ,  G01N21/64 ,  G01N2021/6417 ,  Y10T436/10 ,  Y10T436/108331

    摘要： The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(λ), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(λ) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm−1. According to the method of the invention, partial correction functions Fi(λ) are generated by forming the quotient of the measured fluorescence spectra Ji(λ) and the corresponding corrected fluorescence spectra Ii(λ), which are then combined to form a total correction function F(λ) for a broad spectral range. The combination factors αi are hereby computed by statistical averaging of consecutive partial correction functions Fi(λ) over only a predefined, limited overlap region λi/i+1±ΔλOL about the mutual crossover wavelength λi/i+1.

    摘要翻译： 本发明涉及用于校准光致发光测量系统，特别是荧光测量系统的方法和试剂盒。 该试剂盒包括许多荧光标准品I及其校准和认证的荧光光谱Ii（λ），从而选择荧光标准品，以使其光谱校正的荧光光谱Ii（λ）覆盖高强度的宽光谱范围。 标准的特征在于它们的至少1400cm-1的带的宽半宽度FWHMi。 根据本发明的方法，通过形成测量的荧光光谱Ji（λ）和对应的校正荧光光谱Ii（λ）的商产生部分校正函数Fi（λ），然后将其组合以形成总校正 函数F（λ）用于宽光谱范围。 因此，通过仅关于相互交叉波长λi/ i + 1的预定义的有限重叠区域λi/ i + 1±＆Dgr;λOL的连续部分校正函数Fi（λ）的统计平均来计算组合因子αi。

    Multi-functional calibration system and kit, and their uses for characterizing luminescence measurement systems
    7.
    发明授权
    Multi-functional calibration system and kit, and their uses for characterizing luminescence measurement systems 有权
    多功能校准系统和套件，以及其用于表征发光测量系统的用途

    公开(公告)号：US07544926B2

    公开(公告)日：2009-06-09

    申请号：US11377593

    申请日：2006-03-15

    申请人： Ute Resch-Genger ,  Katrin Hoffmann ,  Roland Nitschke ,  Axel Engel

    发明人： Ute Resch-Genger ,  Katrin Hoffmann ,  Roland Nitschke ,  Axel Engel

    IPC分类号： G12B13/00

    CPC分类号： G01N21/6458 ,  G01N21/278 ,  G02B21/0076

    摘要： The invention relates to a multi-functional calibration system (10) for characterizing luminescence measurement systems, in particular spectrally resolving, wide-field and/or confocal imaging systems, with (a) a baseplate (12), (b) at least one calibration module (24) arranged on the baseplate (12) and including at least one calibration and/or characterization function, and (c) at least one focusing device (20) integrated in the baseplate (12) with a focusing surface (22) for setting a defined measurement beam focus of the luminescence measurement systems to be calibrated, the focusing surface (22) arranged in a common plane with the at least one calibration module (24).

    摘要翻译： 本发明涉及用于表征发光测量系统，特别是光谱分辨，宽场和/或共焦成像系统的多功能校准系统（10），其中（a）底板（12），（b）至少一个 校准模块（24），其布置在所述基板（12）上并且包括至少一个校准和/或表征功能，以及（c）集成在所述基板（12）中的至少一个聚焦装置（20） 用于设置待校准的发光测量系统的定义的测量束聚焦，所述聚焦表面（22）与所述至少一个校准模块（24）布置在公共平面中。

    Optical standard for the calibration and characterization of optical measuring devices
    9.
    发明授权
    Optical standard for the calibration and characterization of optical measuring devices 有权
    用于光学测量装置的校准和表征的光学标准

    公开(公告)号：US07919744B2

    公开(公告)日：2011-04-05

    申请号：US12505660

    申请日：2009-07-20

    申请人： Ute Resch-Genger ,  Katrin Hoffmann ,  Thomas Behnke ,  Christian Wuerth

    发明人： Ute Resch-Genger ,  Katrin Hoffmann ,  Thomas Behnke ,  Christian Wuerth

    IPC分类号： G01D18/00

    CPC分类号： G01N21/278 ,  G01N21/64

    摘要： The invention relates to an optical standard (10) for the calibration or characterization of optical measuring devices and as a reference system for intensities and intensity measurements. The standard (10) according to the invention, constructed sandwich-like, comprises a combination of at least two layer-like optical standard modules (12) having defined optical properties, joinable or joined together plane-parallel, wherein the standard modules (12) in each instance differ from each other by at least one optical property, namely, by their absorption, emission, scatter and/or reflection properties, and the standard modules (12) are made so that they enter into physical interaction with electromagnetic radiation striking one of their two principal surfaces (12.1).

    摘要翻译： 本发明涉及一种用于光学测量装置的校准或表征的光学标准（10）以及用于强度和强度测量的参考系统。 根据本发明的构造的夹层状的标准（10）包括具有限定的光学性能的至少两层层状光学标准模块（12）的组合，可以平行或并联在一起，其中标准模块（12 ）在每种情况下通过至少一种光学性质，即通过它们的吸收，发射，散射和/或反射特性而彼此不同，并且标准模块（12）被制成使得它们进入与电磁辐射撞击的物理相互作用 他们的两个主表面之一（12.1）。