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公开(公告)号:US20140061828A1
公开(公告)日:2014-03-06
申请号:US13967340
申请日:2013-08-14
申请人: WOO CHANG LIM , SANGYONG KIM , Whankyun KIM , SANG HWAN PARK , JEONGHEON PARK
发明人: WOO CHANG LIM , SANGYONG KIM , Whankyun KIM , SANG HWAN PARK , JEONGHEON PARK
IPC分类号: H01L43/08
CPC分类号: H01L43/08 , G11C11/161 , G11C11/1659
摘要: A magnetic memory device according to embodiments includes a first reference magnetic layer on a substrate, a second reference magnetic layer on the first reference magnetic layer, a free layer between the first reference magnetic layer and the second reference magnetic layer, a first tunnel barrier layer between the first reference magnetic layer and the free layer, and a second tunnel barrier layer between the second reference magnetic layer and the free layer. The first reference magnetic, second reference magnetic and free layers each have a magnetization direction substantially perpendicular to a top surface of the substrate. A resistance-area product (RA) value of the first tunnel barrier layer is greater than that of the second tunnel barrier layer.
摘要翻译: 根据实施例的磁存储器件包括衬底上的第一参考磁性层,第一参考磁性层上的第二参考磁性层,第一参考磁性层和第二参考磁性层之间的自由层,第一隧道势垒层 在第一参考磁性层和自由层之间,以及在第二参考磁性层和自由层之间的第二隧道势垒层。 第一参考磁性,第二参考磁性和自由层各自具有基本上垂直于衬底顶表面的磁化方向。 第一隧道势垒层的电阻面积乘积(RA)值大于第二隧道势垒层的电阻面积积(RA)值。
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公开(公告)号:US20160027997A1
公开(公告)日:2016-01-28
申请号:US14874376
申请日:2015-10-02
申请人: SeChung OH , KI WOONG KIM , YOUNGHYUN KIM , Whankyun KIM , SANG HWAN PARK
发明人: SeChung OH , KI WOONG KIM , YOUNGHYUN KIM , Whankyun KIM , SANG HWAN PARK
CPC分类号: H01L43/10 , B82Y25/00 , G11C11/161 , G11C11/1659 , H01F10/123 , H01F10/3254 , H01F10/3272 , H01F10/3286 , H01F10/3295 , H01L27/224 , H01L27/226 , H01L27/228 , H01L43/08
摘要: Provided are magnetic memory devices with a perpendicular magnetic tunnel junction. The device includes a magnetic tunnel junction including a free layer structure, a pinned layer structure, and a tunnel barrier therebetween. The pinned layer structure may include a first magnetic layer having an intrinsic perpendicular magnetization property, a second magnetic layer having an intrinsic in-plane magnetization property, and an exchange coupling layer interposed between the first and second magnetic layers. The exchange coupling layer may have a thickness maximizing an antiferromagnetic exchange coupling between the first and second magnetic layers, and the second magnetic layer may exhibit a perpendicular magnetization direction, due at least in part to the antiferromagnetic exchange coupling with the first magnetic layer.
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公开(公告)号:US20150061059A1
公开(公告)日:2015-03-05
申请号:US14535315
申请日:2014-11-06
申请人: SeChung OH , KI WOONG KIM , YOUNGHYUN KIM , Whankyun KIM , SANG HWAN PARK
发明人: SeChung OH , KI WOONG KIM , YOUNGHYUN KIM , Whankyun KIM , SANG HWAN PARK
CPC分类号: H01L43/02 , B82Y25/00 , G11C11/161 , G11C11/1659 , H01F10/123 , H01F10/3254 , H01F10/3272 , H01F10/3286 , H01F10/3295 , H01L27/224 , H01L27/226 , H01L27/228 , H01L43/08 , H01L43/10
摘要: Provided are magnetic memory devices with a perpendicular magnetic tunnel junction. The device includes a magnetic tunnel junction including a free layer structure, a pinned layer structure, and a tunnel barrier therebetween. The pinned layer structure may include a first magnetic layer having an intrinsic perpendicular magnetization property, a second magnetic layer having an intrinsic in-plane magnetization property, and an exchange coupling layer interposed between the first and second magnetic layers. The exchange coupling layer may have a thickness maximizing an antiferromagnetic exchange coupling between the first and second magnetic layers, and the second magnetic layer may exhibit a perpendicular magnetization direction, due at least in part to the antiferromagnetic exchange coupling with the first magnetic layer.
摘要翻译: 提供了具有垂直磁性隧道结的磁存储器件。 该装置包括一个包括自由层结构,钉扎层结构和在它们之间的隧道屏障的磁性隧道结。 被钉扎层结构可以包括具有固有垂直磁化特性的第一磁性层,具有固有的面内磁化特性的第二磁性层以及置于第一和第二磁性层之间的交换耦合层。 交换耦合层可以具有最大化第一和第二磁性层之间的反铁磁交换耦合的厚度,并且由于至少部分地由于与第一磁性层的反铁磁交换耦合,第二磁性层可以呈现垂直的磁化方向。
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