摘要:
The non-volatile semiconductor memory device has a circuit which maintains and holds the potentials of bit lines, and either ones of even-bit lines or odd-bit lines are connected to the circuit. When the bit line potential holding circuit is connected to even-bit lines and a block copy is performed, data is first outputted to the even-bit lines, and after the potential of the even-bit line is determined, the bit line potential holding circuit operates. Then, biasing of the potential of the even-bit lines is carried out by the bit line potential holding circuit, the potentials of the bit lines are maintained and held. At the same time, data is outputted to the odd-bit lines and the potentials of the odd-bit lines are determined. Then, a program voltage is supplied to a selected word line, and data is simultaneously written (programmed) in the memory cells connected to the even-bit lines, and the memory cells connected to the odd-bit lines.
摘要:
The non-volatile semiconductor memory device has a circuit which maintains and holds the potentials of bit lines, and either ones of even-bit lines or odd-bit lines are connected to the circuit. When the bit line potential holding circuit is connected to even-bit lines and a block copy is performed, data is first outputted to the even-bit lines, and after the potential of the even-bit line is determined, the bit line potential holding circuit operates. Then, biasing of the potential of the even-bit lines is carried out by the bit line potential holding circuit, the potentials of the bit lines are maintained and held. At the same time, data is outputted to the odd-bit lines and the potentials of the odd-bit lines are determined. Then, a program voltage is supplied to a selected word line, and data is simultaneously written (programmed) in the memory cells connected to the even-bit lines, and the memory cells connected to the odd-bit lines.
摘要:
The non-volatile semiconductor memory device has a circuit which maintains and holds the potentials of bit lines, and either ones of even-bit lines or odd-bit lines are connected to the circuit. When the bit line potential holding circuit is connected to even-bit lines and a block copy is performed, data is first outputted to the even-bit lines, and after the potential of the even-bit line is determined, the bit line potential holding circuit operates. Then, biasing of the potential of the even-bit lines is carried out by the bit line potential holding circuit, the potentials of the bit lines are maintained and held. At the same time, data is outputted to the odd-bit lines and the potentials of the odd-bit lines are determined. Then, a program voltage is supplied to a selected word line, and data is simultaneously written (programmed) in the memory cells connected to the even-bit lines, and the memory cells connected to the odd-bit lines.
摘要:
The non-volatile semiconductor memory device has a circuit which maintains and holds the potentials of bit lines, and either ones of even-bit lines or odd-bit lines are connected to the circuit. When the bit line potential holding circuit is connected to even-bit lines and a block copy is performed, data is first outputted to the even-bit lines, and after the potential of the even-bit line is determined, the bit line potential holding circuit operates. Then, biasing of the potential of the even-bit lines is carried out by the bit line potential holding circuit, the potentials of the bit lines are maintained and held. At the same time, data is outputted to the odd-bit lines and the potentials of the odd-bit lines are determined. Then, a program voltage is supplied to a selected word line, and data is simultaneously written (programmed) in the memory cells connected to the even-bit lines, and the memory cells connected to the odd-bit lines.
摘要:
A semiconductor memory device disclosed herein includes: a first select gate line, a gate electrode of a first select transistor connected to the first select gate line; a second select gate line, a gate electrode of a second select transistor connected to the second select gate line; and word lines between the first select gate line and the second select gate line, gate electrodes of memory cells being respectively connected to the word lines, wherein when data in a memory cell connected to a first adjacent word line which is adjacent to the first select gate line is read, a voltage of the second select gate line is increased after a voltage of the first select gate line is increased, and when data in a memory cell connected to a second adjacent word line adjacent to the second select gate line is read, the voltage of the first select gate line is increased after the voltage of the second gate line is increased.
摘要:
A level shifter circuit comprises a first output MIS transistor of a first conductivity, and a second output MIS transistor of a second conductivity type having a second threshold voltage. The former has a first threshold voltage, wherein the output voltage is positively fed back to a gate terminal and the power supply voltage is applied to a first terminal to generate a first voltage at a second terminal. In the latter, the first voltage is applied to a first terminal and a second voltage is applied to a gate terminal to control conduction to generate the output voltage at a second terminal. The first and second charge type MIS transistors and the discharge MIS transistor are connected between the first terminal and gate terminal of the second output MIS transistor to charge or discharge the potential of the gate terminal of the second output MIS transistor.
摘要:
A semiconductor memory device disclosed herein includes: a first select gate line, a gate electrode of a first select transistor connected to the first select gate line; a second select gate line, a gate electrode of a second select transistor connected to the second select gate line; and word lines between the first select gate line and the second select gate line, gate electrodes of memory cells being respectively connected to the word lines, wherein when data in a memory cell connected to a first adjacent word line which is adjacent to the first select gate line is read, a voltage of the second select gate line is increased after a voltage of the first select gate line is increased, and when data in a memory cell connected to a second adjacent word line adjacent to the second select gate line is read, the voltage of the first select gate line is increased after the voltage of the second gate line is increased.
摘要:
A nonvolatile semiconductor memory device includes a memory cell array, read circuit, program circuit, read voltage generating circuit, memory circuit and switching circuit. The read voltage generating circuit generates and supplies a read voltage to the read circuit. The memory circuit stores information which changes the temperature characteristic of a memory cell in the memory cell array. The switching circuit changes the temperature dependency of read voltage generated from the read voltage generating circuit based on information stored in the memory circuit.
摘要:
A nonvolatile semiconductor memory device includes a memory cell array, read circuit, program circuit, read voltage generating circuit, memory circuit and switching circuit. The read voltage generating circuit generates and supplies a read voltage to the read circuit. The memory circuit stores information which changes the temperature characteristic of a memory cell in the memory cell array. The switching circuit changes the temperature dependency of read voltage generated from the read voltage generating circuit based on information stored in the memory circuit.
摘要:
A level shifter circuit comprises a first output MIS transistor of a first conductivity, and a second output MIS transistor of a second conductivity type having a second threshold voltage. The former has a first threshold voltage, wherein the output voltage is positively fed back to a gate terminal and the power supply voltage is applied to a first terminal to generate a first voltage at a second terminal. In the latter, the first voltage is applied to a first terminal and a second voltage is applied to a gate terminal to control conduction to generate the output voltage at a second terminal. The first and second charge type MIS transistors and the discharge MIS transistor are connected between the first terminal and gate terminal of the second output MIS transistor to charge or discharge the potential of the gate terminal of the second output MIS transistor.