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12 条记录 (耗时 0.033 秒)

    DAMPING APPARATUS FOR REDUCING VIBRATION OF AUTOMOBILE BODY
    3.
    发明申请
    DAMPING APPARATUS FOR REDUCING VIBRATION OF AUTOMOBILE BODY 有权
    用于减少汽车车身振动的阻尼装置

    公开(公告)号：US20120197490A1

    公开(公告)日：2012-08-02

    申请号：US13443352

    申请日：2012-04-10

    申请人： Yasushi MURAGISHI ,  Hideaki MORIYA ,  Yushi SATO ,  Takashi FUKUNAGA ,  Katsuyoshi NAKANO ,  Hiroshi NAKAGAWA ,  Takayoshi FUJII ,  Takashi ONOUE ,  Masaaki NARIHISA

    发明人： Yasushi MURAGISHI ,  Hideaki MORIYA ,  Yushi SATO ,  Takashi FUKUNAGA ,  Katsuyoshi NAKANO ,  Hiroshi NAKAGAWA ,  Takayoshi FUJII ,  Takashi ONOUE ,  Masaaki NARIHISA

    IPC分类号： B60G17/018 ,  B60G17/015

    CPC分类号： F16F7/1005 ,  B60G17/018 ,  F16F15/002 ,  G05D19/02 ,  G06F7/76

    摘要： A damping apparatus for an automobile is provided, capable of ensuring a high level of reliability while obtaining excellent damping effect with simple configuration. The damping apparatus for an automobile that reduces vibrations of an automobile body may include an actuator that is attached to the automobile body and drives an auxiliary mass; a current detector that detects a current flowing through an armature of the actuator; a section that detects a terminal voltage applied to the actuator; a calculation circuit that calculates an induced voltage of the actuator, and further calculates at least one of the relative velocity, relative displacement, and relative acceleration of the actuator, based on a current detected by the current detector and the terminal voltage; and a control circuit that drive-controls the actuator based on at least one of the relative velocity, relative displacement, and relative acceleration of the actuator calculated by the calculation circuit.

    摘要翻译： 提供了一种用于汽车的阻尼装置，其能够以简单的构造获得优异的阻尼效果，从而确保高可靠性。 用于减轻汽车车身振动的汽车的阻尼装置可以包括附接到汽车车身并驱动辅助车体的致动器; 电流检测器，其检测流过致动器的电枢的电流; 检测施加到所述致动器的端子电压的部分; 计算所述致动器的感应电压的计算电路，并且基于由所述电流检测器检测出的电流和所述端子电压，进一步计算所述致动器的相对速度，相对位移和相对加速度中的至少一个; 以及控制电路，其基于由所述计算电路计算出的所述致动器的相对速度，相对位移和相对加速度中的至少一个来驱动所述致动器。

    VIBRATION DAMPING APPARATUS, ELECTRIC ACTUATOR DRIVING APPARATUS AND VEHICLE
    6.
    发明申请
    VIBRATION DAMPING APPARATUS, ELECTRIC ACTUATOR DRIVING APPARATUS AND VEHICLE 有权
    振动阻尼装置，电动执行器驱动装置和车辆

    公开(公告)号：US20120293094A1

    公开(公告)日：2012-11-22

    申请号：US13532977

    申请日：2012-06-26

    申请人： Hideaki MORIYA ,  Takeshi TOMIZAKI ,  Takeo ITO ,  Yasushi MURAGISHI ,  Takayoshi FUJII

    发明人： Hideaki MORIYA ,  Takeshi TOMIZAKI ,  Takeo ITO ,  Yasushi MURAGISHI ,  Takayoshi FUJII

    IPC分类号： H02P25/06

    CPC分类号： H02K41/03 ,  F16F15/002 ,  G05B5/01 ,  G05B13/021 ,  G05D19/02

    摘要： A vibration damping apparatus including reference wave production section that produces a reference wave; a fundamental order adaptive algorithm block that calculates fundamental order adaptive filter factors from a vibration detection signal and the reference wave and produces a fundamental order vibration damping current instruction; an amplitude detection section that calculates a peak current value of the fundamental order vibration damping current instruction; and a fundamental order current excess detection section that derives a fundamental order current upper limit value from the fundamental frequency to produce a fundamental order current upper limit excess signal that is output to the fundamental order adaptive algorithm block, which revises the fundamental order adaptive filter factors in a direction in which the vibration damping current instruction is limited within a range.

    摘要翻译： 一种包括产生参考波的参考波产生部分的减振装置; 基本顺序自适应算法块，从振动检测信号和参考波计算基本顺序自适应滤波因子，并产生基本阶衰减电流指令; 振幅检测部，其计算所述基本阶衰减电流指令的峰值电流值; 基本阶数电流过剩检测部，从基频导出基本阶数电流上限值，生成输出到基本阶自适应算法块的基本阶数电流上限多余信号，修正基本阶自适应滤波因子 在减振电流指令被限制在一个范围内的方向。

    SOLID STATE IMAGING DEVICE AND METHOD FOR MANUFACTURING THE SAME
    7.
    发明申请
    SOLID STATE IMAGING DEVICE AND METHOD FOR MANUFACTURING THE SAME 审中-公开
    固态成像装置及其制造方法

    公开(公告)号：US20130032915A1

    公开(公告)日：2013-02-07

    申请号：US13564382

    申请日：2012-08-01

    申请人： Junichi TONOTANI ,  Takayoshi FUJII ,  Kenji SASAKI ,  Yusaku KONNO

    发明人： Junichi TONOTANI ,  Takayoshi FUJII ,  Kenji SASAKI ,  Yusaku KONNO

    IPC分类号： H01L31/0232 ,  H01L31/18

    CPC分类号： H01L27/14621 ,  H01L27/14627 ,  H01L27/1464

    摘要： According to one embodiment, a solid state imaging device includes a substrate, and a plurality of interference filters. The substrate includes a plurality of photoelectric conversion units. The plurality of interference filters is provided individually for the plurality of photoelectric conversion units. The plurality of interference filters includes a plurality of layers with different refractive indices stacked. The plurality of interference filters is configured to selectively transmit light in a prescribed wavelength range. A space is provided between adjacent ones of the interference filters.

    摘要翻译： 根据一个实施例，固态成像装置包括衬底和多个干涉滤光器。 基板包括多个光电转换单元。 为多个光电转换单元分别设置多个干涉滤光器。 多个干涉滤光器包括堆叠不同折射率的多个层。 多个干涉滤光器被配置为选择性地透射规定波长范围的光。 在相邻的干扰滤波器之间提供空间。

    PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
    8.
    发明申请
    PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD 有权
    图案检查装置和图案检查方法

    公开(公告)号：US20120243770A1

    公开(公告)日：2012-09-27

    申请号：US13308719

    申请日：2011-12-01

    申请人： Makoto KANEKO ,  Takayoshi FUJII ,  Yusaku KONNO ,  Mitsutoshi WATABIKI ,  Yusuke IIDA ,  Shinichi IMAI ,  Yuichiro YAMAZAKI

    发明人： Makoto KANEKO ,  Takayoshi FUJII ,  Yusaku KONNO ,  Mitsutoshi WATABIKI ,  Yusuke IIDA ,  Shinichi IMAI ,  Yuichiro YAMAZAKI

    IPC分类号： G06K9/00

    CPC分类号： G01N21/95607 ,  G01N21/9501

    摘要： In accordance with an embodiment, a pattern inspection method includes: applying a light generated from a light source to the same region of a substrate in which an inspection target pattern is formed; guiding, imaging and then detecting a reflected light from the substrate, and acquiring a detection signal for each of a plurality of different wavelengths; and adding the detection signals of the different wavelengths in association with an incident position of an imaging surface to generate added image data including information on a wavelength and signal intensity, judging, by the added image data, whether the inspection target pattern has any defect, and when judging that the inspection target pattern has a defect, detecting the position of the defect in a direction perpendicular to the substrate.

    摘要翻译： 根据实施例，图案检查方法包括：将从光源产生的光施加到形成有检查对象图案的基板的相同区域; 引导，成像，然后检测来自基板的反射光，并获取多个不同波长中的每一个的检测信号; 并且与成像面的入射位置相关联地添加不同波长的检测信号，以生成包括关于波长和信号强度的信息的附加图像数据，通过添加的图像数据判断检查对象图案是否具有任何缺陷， 并且当判断为检查对象图案有缺陷时，检测出与基板垂直的方向上的缺陷的位置。

    DRY PROCESSING METHOD AND SYSTEM FOR CONVERTER SLAG IN COPPER SMELTING
    9.
    发明申请
    DRY PROCESSING METHOD AND SYSTEM FOR CONVERTER SLAG IN COPPER SMELTING 审中-公开
    干燥处理方法和系统在铜熔炼中的转炉渣

    公开(公告)号：US20120073405A1

    公开(公告)日：2012-03-29

    申请号：US13105514

    申请日：2011-05-11

    申请人： Takafumi SASAKI ,  Makoto HAMAMOTO ,  Takayoshi FUJII

    发明人： Takafumi SASAKI ,  Makoto HAMAMOTO ,  Takayoshi FUJII

    IPC分类号： C22B1/00

    CPC分类号： C22B7/04 ,  Y02P10/212

    摘要： The present invention provides a processing method for converting slag ejected from a converter in a copper smelting process to raw materials for iron manufacture. The processing method is for converter slag containing 1 mass % or more of Cu produced in a copper smelting process. The processing method comprises a step of charging the converter slag in a reduction furnace, and a step of conducting a heat reduction of a zinc content and a copper content contained in the slag and removing a reduced zinc by volatilization in the reduction furnace. The removal of the reduced zinc by volatilization is conducted in a condition in which an air fuel ratio of a volume of air blowing to an input of a reductant is controlled to 0.25 to 1.0.

    摘要翻译： 本发明提供一种将从铜冶炼工艺中的转炉排出的炉渣转换成铁制造原料的加工方法。 该处理方法是用于在铜冶炼过程中产生的Cu含量为1质量％以上的转炉炉渣。 该处理方法包括对还原炉中的转炉炉渣进行加料的步骤，以及在还原炉中通过挥发除去锌渣中含有的锌含量和铜含量的热量还原而除去还原锌的步骤。 通过挥发除去还原锌是在吹送到还原剂输入的空气的空气燃料比被控制在0.25〜1.0的条件下进行的。

    PATTERN INSPECTION APPARATUS AND METHOD
    10.
    发明申请
    PATTERN INSPECTION APPARATUS AND METHOD 审中-公开
    图案检查装置及方法

    公开(公告)号：US20130063721A1

    公开(公告)日：2013-03-14

    申请号：US13414945

    申请日：2012-03-08

    申请人： Takayoshi FUJII ,  Yusaku KONNO ,  Makoto KANEKO ,  Yuichiro YAMAZAKI ,  Mitsutoshi WATABIKI ,  Kiminori YOSHINO ,  Yusuke IIDA

    发明人： Takayoshi FUJII ,  Yusaku KONNO ,  Makoto KANEKO ,  Yuichiro YAMAZAKI ,  Mitsutoshi WATABIKI ,  Kiminori YOSHINO ,  Yusuke IIDA

    IPC分类号： G01J3/42

    CPC分类号： G01J3/42 ,  G01J3/2803 ,  G01J5/0007 ,  G01N21/95607

    摘要： In one embodiment, a pattern inspection apparatus includes a light source configured to generate light, and a condenser configured to shape the light into a line beam to illuminate a wafer with the line beam. The apparatus further includes a spectrometer configured to disperse the line beam reflected from the wafer. The apparatus further includes a two-dimensional detector configured to detect the line beam dispersed by the spectrometer, and output a signal including spectrum information of the line beam. The apparatus further includes a comparison unit configured to compare the spectrum information obtained from corresponding places of a repetitive pattern on the wafer with each other, and a determination unit configured to determine whether the wafer includes a defect, based on a comparison result of the spectrum information.

    摘要翻译： 在一个实施例中，图案检查装置包括被配置为产生光的光源和被配置为将光线成形为线束以用线束照射晶片的聚光器。 该装置还包括配置成分散从晶片反射的线束的光谱仪。 该装置还包括二维检测器，被配置为检测由光谱仪分散的线束，并输出包括线束的光谱信息的信号。 该装置还包括：比较单元，被配置为将从晶片上的重复图案的相应位置获得的频谱信息彼此进行比较;以及确定单元，被配置为基于频谱的比较结果来确定晶片是否包括缺陷 信息。