公开(公告)号：US07885381B2

公开(公告)日：2011-02-08

申请号：US12108183

申请日：2008-04-23

申请人： Yasushi Nagumo ,  Jun Nukaga ,  Hiroshi Kamimura ,  Noriyuki Sadaoka ,  Satoshi Takemori ,  Kojirou Kodaira

发明人： Yasushi Nagumo ,  Jun Nukaga ,  Hiroshi Kamimura ,  Noriyuki Sadaoka ,  Satoshi Takemori ,  Kojirou Kodaira

IPC分类号： G01N23/04

CPC分类号： G01B15/025 ,  G01N23/046 ,  G01N2223/419 ,  G01N2223/628

摘要： The pipe inspection method and apparatus can be used to implement rapid, tomographic inspection of a pipe set up at a narrow location. The pipe inspection method includes: a first step for scanning the pipe by translating a radiation source and radiation detector arranged opposedly to the pipe; a second step for the radiation detector to detect radiation that the radiation source has emitted, at given scanning distance intervals; a third step for creating a transmission image of the pipe, based on a radiation dose that the radiation detector has detected; and a fourth step for constructing a tomogram or stereoscopic image of the pipe, based on the transmission image. Thus, it is possible to provide the pipe inspection method and apparatus that can be used to implement rapid, tomographic inspection of the pipe set up at a narrow location.

摘要翻译： 管道检查方法和装置可用于对位于狭窄位置的管道进行快速，断层扫描检查。 管道检查方法包括：第一步骤，通过平移与管道相对设置的辐射源和辐射检测器来扫描管道; 辐射探测器以给定的扫描距离间隔检测辐射源发射的辐射的第二步骤; 基于所述放射线检测器已经检测到的辐射剂量来创建所述管道的透射图像的第三步骤; 以及第四步骤，用于基于透射图像构造管道的断层图像或立体图像。 因此，可以提供可用于对在狭窄位置设置的管道进行快速，断层扫描检查的管道检查方法和装置。

公开(公告)号：US20080267345A1

公开(公告)日：2008-10-30

申请号：US12108183

申请日：2008-04-23

申请人： Yasushi NAGUMO ,  Jun Nukaga ,  Hiroshi Kamimura ,  Noriyuki Sadaoka ,  Satoshi Takemori ,  Kojirou Kodaira

发明人： Yasushi NAGUMO ,  Jun Nukaga ,  Hiroshi Kamimura ,  Noriyuki Sadaoka ,  Satoshi Takemori ,  Kojirou Kodaira

IPC分类号： A61B6/02 ,  G21K1/12

CPC分类号： G01B15/025 ,  G01N23/046 ,  G01N2223/419 ,  G01N2223/628

摘要： The pipe inspection method and apparatus can be used to implement rapid, tomographic inspection of a pipe set up at a narrow location. The pipe inspection method of the present invention includes: a first step for scanning the pipe by translating a radiation source and radiation detector arranged opposedly to the pipe; a second step for the radiation detector to detect radiation that the radiation source has emitted, at given scanning distance intervals; a third step for creating a transmission image of the pipe, based on a radiation dose that the radiation detector has detected; and a fourth step for constructing a tomogram or stereoscopic image of the pipe, based on the transmission image. According to this invention, it is possible to provide the pipe inspection method and apparatus that can be used to implement rapid, tomographic inspection of the pipe set up at a narrow location.

摘要翻译： 管道检查方法和装置可用于对位于狭窄位置的管道进行快速，断层扫描检查。 本发明的管道检查方法包括：第一步骤，通过平移与管道相对设置的辐射源和辐射检测器来扫描管道; 辐射探测器以给定的扫描距离间隔检测辐射源发射的辐射的第二步骤; 基于所述放射线检测器已经检测到的辐射剂量来创建所述管道的透射图像的第三步骤; 以及第四步骤，用于基于透射图像构造管道的断层图像或立体图像。 根据本发明，可以提供可用于对在狭窄位置设置的管道进行快速，断层扫描检查的管道检查方法和装置。

公开(公告)号：US20070009082A1

公开(公告)日：2007-01-11

申请号：US11519876

申请日：2006-09-13

申请人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

发明人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

IPC分类号： H05G1/60 ,  A61B6/00 ,  G01N23/00 ,  G21K1/12

CPC分类号： H04N5/32 ,  G01N23/046 ,  G01N2223/419 ,  G06F19/00 ,  G06Q50/22 ,  G06Q50/24 ,  H04N5/361 ,  Y10S378/901

摘要： An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first condenser having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first condenser, and an integrator having a second resistor and a second condenser each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first condenser are returned to a steady state after irradiation of the pulsed X-ray.

摘要翻译： 一种用于处理半导体X射线传感器的输出信号的工业X射线CT装置的X射线传感器信号处理电路和方法，该半导体X射线传感器检测从加速器发出的脉冲X射线并通过待检查物体 。 该电路包括：第一电阻器，其一端连接到X射线传感器，另一端连接到地;第一电容器，其一端连接到X射线传感器和第一电阻的连接点，运算放大器 具有连接到第一电容器的另一个端子的反相输入端和具有并联连接到运算放大器的第二电阻器和第二电容器的积分器。 电路被配置为使得至少在X射线照射之后X射线传感器和第一冷凝器的偏置状态恢复到稳定状态。

公开(公告)号：US06925143B2

公开(公告)日：2005-08-02

申请号：US10864782

申请日：2004-06-10

申请人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

发明人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

IPC分类号： G01N23/04 ,  A61B6/03

CPC分类号： H04N5/32 ,  G01N23/046 ,  G01N2223/419 ,  G06F19/00 ,  G06Q50/22 ,  G06Q50/24 ,  H04N5/361 ,  Y10S378/901

摘要： An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray semiconductor sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray semiconductor sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray semiconductor sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray semiconductor sensor, and an integration circuit for integrating an output signal of the X-ray semiconductor sensor from which the DC component is removed by the filter.

摘要翻译： 一种X射线CT装置，具有用于将X射线照射到待检查对象的X射线照射器，X射线半导体传感器，用于检测通过被检查物体的X射线，X射线传感器信号 用于处理来自X射线半导体传感器的输出信号的处理电路，以及CT控制装置，用于根据通过X射线处理的X射线半导体传感器的输出信号重建被检查物体的图像 传感器信号处理电路。 X射线传感器信号处理电路包括用于从X射线半导体传感器的输出信号中去除DC分量的滤波器，以及积分电路，用于对直流成分为直流成分的X射线半导体传感器的输出信号进行积分 由过滤器去除。

公开(公告)号：US07113563B2

公开(公告)日：2006-09-26

申请号：US11250484

申请日：2005-10-17

申请人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

发明人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

IPC分类号： A61B6/03

CPC分类号： H04N5/32 ,  G01N23/046 ,  G01N2223/419 ,  G06F19/00 ,  G06Q50/22 ,  G06Q50/24 ,  H04N5/361 ,  Y10S378/901

摘要： An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit removes a DC component from the output signal of the X-ray sensor and integrates the output signal of the X-ray sensor having the DC component removed therefrom.

摘要翻译： 一种X射线CT装置，其具有用于将X射线照射到待检查对象的X射线照射器，用于检测穿过被检查物体的X射线的X射线传感器，X射线传感器信号处理 用于处理来自X射线传感器的输出信号的电路，以及CT控制装置，用于根据通过X射线传感器信号处理处理的X射线传感器的输出信号重建被检查物体的图像 电路。 X射线传感器信号处理电路从X射线传感器的输出信号中除去DC分量，并对从其中除去直流分量的X射线传感器的输出信号进行积分。

公开(公告)号：US06975700B2

公开(公告)日：2005-12-13

申请号：US10864641

申请日：2004-06-10

申请人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

发明人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

IPC分类号： G01N23/04 ,  A61B6/03

CPC分类号： H04N5/32 ,  G01N23/046 ,  G01N2223/419 ,  G06F19/00 ,  G06Q50/22 ,  G06Q50/24 ,  H04N5/361 ,  Y10S378/901

摘要： An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor, and an integration circuit for integrating the output signal of the X-ray sensor from which the DC component is removed by the filter.

摘要翻译： 一种X射线CT装置，具有用于将X射线照射到待检查对象的X射线照射器，用于检测通过被检查物体的X射线的X射线传感器，X射线传感器信号处理 用于处理来自X射线传感器的输出信号的电路，以及CT控制装置，用于根据通过X射线传感器信号处理处理的X射线传感器的输出信号重建被检查物体的图像 电路。 X射线传感器信号处理电路包括用于从X射线传感器的输出信号中去除DC分量的滤波器，以及积分电路，用于对从其中除去DC分量的X射线传感器的输出信号进行积分， 过滤器。

公开(公告)号：US07260176B2

公开(公告)日：2007-08-21

申请号：US11519876

申请日：2006-09-13

申请人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

发明人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

IPC分类号： A61B6/03

CPC分类号： H04N5/32 ,  G01N23/046 ,  G01N2223/419 ,  G06F19/00 ,  G06Q50/22 ,  G06Q50/24 ,  H04N5/361 ,  Y10S378/901

摘要： An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first capacitor having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first capacitor, and an integrator having a second resistor and a second capacitor each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first capacitor are returned to a steady state after irradiation of the pulsed X-ray.

摘要翻译： 一种用于处理半导体X射线传感器的输出信号的工业X射线CT装置的X射线传感器信号处理电路和方法，该半导体X射线传感器检测从加速器发出的脉冲X射线并通过待检查物体 。 该电路包括：第一电阻器，其一端连接到X射线传感器，另一端连接到地;第一电容器，其一端连接到X射线传感器和第一电阻的连接点，运算放大器 具有连接到第一电容器的另一端的反相输入端和具有并联连接到运算放大器的第二电阻器和第二电容器的积分器。 电路被配置为使得至少在X射线照射之后X射线传感器和第一电容器的偏置条件恢复到稳定状态。

公开(公告)号：US20060034420A1

公开(公告)日：2006-02-16

申请号：US11250484

申请日：2005-10-17

申请人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

发明人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

IPC分类号： H05G1/60 ,  A61B6/00

CPC分类号： H04N5/32 ,  G01N23/046 ,  G01N2223/419 ,  G06F19/00 ,  G06Q50/22 ,  G06Q50/24 ,  H04N5/361 ,  Y10S378/901

摘要： An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit removes a DC component from the output signal of the X-ray sensor and integrates the output signal of the X-ray sensor having the DC component removed therefrom.

摘要翻译： 一种X射线CT装置，其具有用于将X射线照射到待检查对象的X射线照射器，用于检测穿过被检查物体的X射线的X射线传感器，X射线传感器信号处理 用于处理来自X射线传感器的输出信号的电路，以及CT控制装置，用于根据通过X射线传感器信号处理处理的X射线传感器的输出信号重建被检查物体的图像 电路。 X射线传感器信号处理电路从X射线传感器的输出信号中除去DC分量，并对从其中除去直流分量的X射线传感器的输出信号进行积分。

公开(公告)号：US06928138B2

公开(公告)日：2005-08-09

申请号：US10864630

申请日：2004-06-10

申请人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

发明人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

IPC分类号： G01N23/04 ,  A61B6/03

CPC分类号： H04N5/32 ,  G01N23/046 ,  G01N2223/419 ,  G06F19/00 ,  G06Q50/22 ,  G06Q50/24 ,  H04N5/361 ,  Y10S378/901

摘要： An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor and a circuit for obtaining a difference between a voltage corresponding to a current including a dark current generated in the X-ray sensor by incidence of the X-ray and a voltage corresponding to the dark current.

摘要翻译： 一种X射线CT装置，具有用于将X射线照射到待检查对象的X射线照射器，用于检测通过被检查物体的X射线的X射线传感器，X射线传感器信号处理 用于处理来自X射线传感器的输出信号的电路，以及CT控制装置，用于根据由X射线传感器信号处理处理的X射线传感器的输出信号重构被检查物体的图像 电路。 X射线传感器信号处理电路包括用于从X射线传感器的输出信号中除去DC分量的滤波器和用于获得与包括在X射线中产生的暗电流的电流相对应的电压之间的差的电路 传感器通过X射线的入射和对应于暗电流的电压。

公开(公告)号：US06859511B2

公开(公告)日：2005-02-22

申请号：US10067914

申请日：2002-02-08

申请人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

发明人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

IPC分类号： G01N23/04 ,  A61B6/03

CPC分类号： H04N5/32 ,  G01N23/046 ,  G01N2223/419 ,  G06F19/00 ,  G06Q50/22 ,  G06Q50/24 ,  H04N5/361 ,  Y10S378/901

摘要： An X-ray sensor signal processor including capacitors 114 for removing DC components (dark currents) from output signals of semiconductor sensors 21 to 2n detecting pulse-like X-rays passed through an object, and integrators (each of which is constituted by a combination of an operational amplifier 115, a resistor 116 and a capacitor 117) for integrating the output signals of the X-ray sensors after removal of the DC components by the capacitors 114. By this, a value proportional to the average number of photons in X-rays can be obtained even in the case where a small number of incident photons are given, and an X-ray CT system using the X-ray sensor signal processor.

摘要翻译： 一种X射线传感器信号处理器，包括用于从半导体传感器21的输出信号到2n检测通过物体的脉冲状X射线的直流分量（暗电流）的电容器114和积分器（各由组合 运算放大器115，电阻器116和电容器117），用于在由电容器114去除DC分量之后对X射线传感器的输出信号进行积分。由此，与X中的光子的平均数成比例的值 即使在给出少量入射光子的情况下也可以获得射线，以及使用X射线传感器信号处理器的X射线CT系统。