Lap and lapping liquor
    6.
    发明授权
    Lap and lapping liquor 失效
    搭搭搭搭酒

    公开(公告)号:US5456736A

    公开(公告)日:1995-10-10

    申请号:US26576

    申请日:1993-03-05

    IPC分类号: B24B37/04 C09K11/68

    CPC分类号: B24B37/04 Y10S451/905

    摘要: This invention provides a lap capable of reducing the pole recession produced between the substrate and the magnetic film when the air-bearing surface of a thin-film magnetic head is lapped, a lapping liquor used for such lapping, and a thin-film magnetic head having its air-bearing surface lapped by using them. Lapping is carried out by using a lap made of a material having both a phase of tin and a phase of brass with a greater rigidity in supporting the abrasive grains than tin, and a lapping liquor prepared by mixing an anionic surfactant (15) and an ampholytic surfactant (16). According to the present invention, it is possible to reduce the pole recession in the thin-film magnetic heads and to accordingly shorten the recording bit length of the magnetic discs.

    摘要翻译: 本发明提供了一种能够减少在研磨薄膜磁头的空气轴承表面,用于研磨的研磨液和薄膜磁头的基板和磁性薄膜之间产生的极凹陷的搭接 通过使用它们的空气轴承表面进行研磨。 研磨是通过使用具有锡相和黄铜相的材料相比具有比锡更大的刚性支撑磨粒的材料制成的搭接,以及通过将阴离子表面活性剂(15)和 两性表面活性剂(16)。 根据本发明,可以减小薄膜磁头中的磁极退缩并相应地缩短磁盘的记录位长度。

    Thickness/depth measuring apparatus and method for measuring the
thickness of a film and the depth of a groove
    7.
    发明授权
    Thickness/depth measuring apparatus and method for measuring the thickness of a film and the depth of a groove 失效
    用于测量薄膜厚度和凹槽深度的厚度/深度测量装置和方法

    公开(公告)号:US5371582A

    公开(公告)日:1994-12-06

    申请号:US99450

    申请日:1993-07-30

    IPC分类号: G01B11/06 G01B11/22 G02B5/18

    CPC分类号: G01B11/0675 G01B11/22

    摘要: A thickness/depth measuring apparatus and method for measuring the thickness of a film forming a lattice-shaped mask and the depth of a groove formed on a workpiece during processing of the workpiece. The thickness/depth measuring apparatus and method provide for irradiating the workpiece with a coherent light beam, controlling the direction for linear polarization of the coherent light beam irradiated onto the workpiece, adjusting the incident angle of the coherent light beam irradiated onto the workpiece in a predetermined angular range, receiving and detecting reflected light reflected by the workpiece at different irradiated incident angles and including higher-order diffracted light; and calculating the thickness of the film and the depth of the groove in accordance with the intensity of the diffracted light detected.

    摘要翻译: 用于测量形成格子状掩模的膜的厚度和在工件加工期间在工件上形成的凹槽的深度的厚度/深度测量装置和方法。 厚度/深度测量装置和方法提供用相干光束照射工件,控制照射到工件上的相干光束的线性偏振的方向,调节照射到工件上的相干光束的入射角 预定的角度范围,以不同的照射入射角接收和检测被工件反射的反射光,并包括高阶衍射光; 并且根据所检测的衍射光的强度来计算膜的厚度和凹槽的深度。