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公开(公告)号:US08906778B2
公开(公告)日:2014-12-09
申请号:US13163378
申请日:2011-06-17
CPC分类号: H01L21/02658 , H01L21/0237 , H01L21/02458 , H01L21/0254 , H01L21/02639 , H01L21/02664 , H01L21/187 , H01L33/0079
摘要: The present invention related to a method for manufacturing a semiconductor, comprising steps of: providing a growing substrate; forming a semiconductor substrate on the growing substrate; forming a first structure with plural grooves and between the growing substrate and the semiconductor substrate; and changing the temperature of the growing substrate and the semiconductor substrate.
摘要翻译: 本发明涉及一种制造半导体的方法,包括以下步骤:提供生长衬底; 在生长衬底上形成半导体衬底; 形成具有多个凹槽的第一结构,并且在所述生长衬底和所述半导体衬底之间; 并且改变生长衬底和半导体衬底的温度。
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公开(公告)号:US20120231614A1
公开(公告)日:2012-09-13
申请号:US13163378
申请日:2011-06-17
CPC分类号: H01L21/02658 , H01L21/0237 , H01L21/02458 , H01L21/0254 , H01L21/02639 , H01L21/02664 , H01L21/187 , H01L33/0079
摘要: The present invention related to a method for manufacturing a semiconductor, comprising steps of: providing a growing substrate; forming a semiconductor substrate on the growing substrate; forming a first structure with plural grooves and between the growing substrate and the semiconductor substrate; and changing the temperature of the growing substrate and the semiconductor substrate.
摘要翻译: 本发明涉及一种制造半导体的方法,包括以下步骤:提供生长衬底; 在生长衬底上形成半导体衬底; 形成具有多个凹槽的第一结构,并且在所述生长衬底和所述半导体衬底之间; 并改变生长衬底和半导体衬底的温度。
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