摘要:
A thin film transistor liquid crystal display is designed such that TFTs for driving green pixels are formed in the blue pixel regions. This improves the overall brightness of the liquid crystal display based on the human view-sensitive characteristics.
摘要:
A novel method and apparatus inspects liquid crystal display. The method and apparatus for inspecting the flat display device scans at least one signal wire by using a magnetic sensor and detects a resistance change of the magnetic sensor to perceive a short in the signal wire. Pixels can be tested using an array of magnetic sensors configured such that each sensor in the array is smaller than the pixel.
摘要:
A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.
摘要:
A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing a substrate to inspect, wherein the substrate includes signal wirings, drive switches and capacitors formed in an effective display area of the substrate; radiating a light onto an inspection switch device and thereby supplying an inspection voltage from an inspection line to one of the drive switches through the signal wirings, so as to charge one of the capacitors; and determining if there is a defect in the effective display area of the substrate by reading the charged voltage of the capacitor.
摘要:
A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.
摘要:
A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.
摘要:
A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.
摘要:
A method and apparatus tests a flat display device to inspect for shorts and open circuits in a signal wire by using a magnetic sensor. The inspection method and apparatus scans the magnetic sensor along signal wires in a scan direction crossing multiple signal wires and detects at least one of a short or an open circuit in the signal wires based on current detected by the magnetic sensor.
摘要:
A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.
摘要:
A method of manufacturing a thin film transistor array substrate to prevent damage to a pad is disclosed. The method includes forming gate lines and data lines that cross each other on a lower substrate, a gate insulating film located between the gate and data lines, a thin film transistor formed at every crossing, a lower gate pad electrode connected to the gate, and a lower data pad electrode; forming a passivation film on the substrate provided with the gate insulating film; forming a photo-resist pattern on the substrate provided with the passivation film; forming a first hole passing through a portion of the passivation film and a portion of the gate insulating film; removing the photo-resist pattern; forming a second hole exposing the lower gate pad electrode; and forming a transparent electrode pattern including an upper gate pad electrode connected to the exposed lower gate pad electrode.