公开(公告)号：US5748606A

公开(公告)日：1998-05-05

申请号：US400012

申请日：1995-03-06

申请人： Yoshiaki Nakagawa ,  Takashi Suzuki ,  Seiji Nakama ,  Masataka Kaneda ,  Masakazu Kashikawa ,  Satoshi Kawata ,  Shunichi Iida ,  Hiroto Nishida ,  Hiroyuki Matsuda

发明人： Yoshiaki Nakagawa ,  Takashi Suzuki ,  Seiji Nakama ,  Masataka Kaneda ,  Masakazu Kashikawa ,  Satoshi Kawata ,  Shunichi Iida ,  Hiroto Nishida ,  Hiroyuki Matsuda

IPC分类号： G11B17/028 ,  G11B17/04 ,  G11B17/22 ,  G11B17/08

CPC分类号： G11B17/056 ,  G11B17/0286 ,  G11B17/0288 ,  G11B17/22 ,  G11B17/221

摘要： A disc player device includes a tray transfer mechanism for transferring a tray, supporting a disc thereon, from a magazine, a clamper for holding the disc, and a clamper drive mechanism for transferring the clamper to a turntable. The disc is held by the turntable with the clamper transfer mechanism held out of contact with the clamper, and in this condition a playback of the disc is carried out. After the playback of the disc is finished, the disc is again clamped, and is returned to a predetermined position by the clamper transfer mechanism. The tray transfer mechanism, the clamper, the clamper drive mechanism are driven by a common motor.

摘要翻译： 光盘播放器装置包括用于传送托盘的托盘传送机构，用于从盒子中支撑其上的盘，用于保持盘的夹持器，以及用于将夹持器传送到转台的夹持器驱动机构。 光盘由转盘固定，夹持器传送机构与夹持器保持不接触，并且在该状态下，执行盘的重放。 在盘的重放完成之后，再次夹紧盘，并通过夹持器传送机构返回到预定位置。 托盘传送机构，夹持器，夹持器驱动机构由公共马达驱动。

公开(公告)号：US5793219A

公开(公告)日：1998-08-11

申请号：US691173

申请日：1996-08-01

申请人： Shunichi Iida

发明人： Shunichi Iida

IPC分类号： G01R31/26 ,  G01R1/06 ,  G01R1/073 ,  G01R31/28 ,  H01L21/66 ,  G01R31/02

CPC分类号： G01R31/2887 ,  G01R1/07342 ,  G01R31/2886

摘要： A semiconductor integrated circuit is tested such that probe styli are brought into contact with electrodes on integrated circuit chips formed in a semiconductor wafer to test circuit characteristics of the integrated circuit chips. A test is conducted over a given number of integrated circuit chips. A fraction defective over the given number of integrated circuit chips is calculated as a result of the test conducted. Probe pressure with which the probe styli contact the electrodes on the integrated circuit chips is controlled on the basis of the calculated fraction defective.

摘要翻译： 测试半导体集成电路，使得探针测针与形成在半导体晶片中的集成电路芯片上的电极接触，以测试集成电路芯片的电路特性。 在给定数量的集成电路芯片上进行测试。 作为进行测试的结果，计算出给定数量的集成电路芯片的部分缺陷。 探针测针与集成电路芯片上的电极接触的探头压力是根据计算出的部分有缺陷来控制的。