公开(公告)号：US20130083322A1

公开(公告)日：2013-04-04

申请号：US13610563

申请日：2012-09-11

申请人： Yoshinori IKETAKI ,  Hideaki Kano

发明人： Yoshinori IKETAKI ,  Hideaki Kano

IPC分类号： G01N21/65

CPC分类号： G01N21/65 ,  G01J3/10 ,  G01J3/44 ,  G01N2021/653 ,  G02B21/0004 ,  G02B21/082 ,  G02B21/14 ,  G02B27/425 ,  G02B27/44

摘要： Provided is a nonlinear optical microscope capable of improving the spatial resolution. The nonlinear optical microscope includes: an illuminating part for irradiating, through an objective lens, a sample with at least two colors of illumination light beams spatially and temporally overlapping each other; and a detecting part for detecting signal light generated from the sample due to nonlinear optical effect, the signal light resulting from the irradiation of the sample with the at least two colors of illumination light beams, in which the illuminating part irradiates the sample with the two colors of illumination light beams in which at least one of the illumination light beams has a wavefront distribution different from a wavefront distribution of the other one of the illumination light beams.

摘要翻译： 提供了能够提高空间分辨率的非线性光学显微镜。 非线性光学显微镜包括：照明部，其通过物镜照射具有空间和时间上彼此重叠的至少两种照明光束的样品; 以及检测部，其用于检测由于非线性光学效应而从样本产生的信号光，所述信号光由具有所述至少两种颜色的照明光束的所述样本的照射而产生，所述照明部分照射所述样本与所述两个 其中至少一个照明光束具有与另一个照明光束的波前分布不同的波前分布的照明光束的颜色。

公开(公告)号：US20110310475A1

公开(公告)日：2011-12-22

申请号：US13162993

申请日：2011-06-17

申请人： Yoshinori IKETAKI

发明人： Yoshinori IKETAKI

IPC分类号： G02B21/06

CPC分类号： G02B21/06 ,  G01N21/6458 ,  G01N2021/6419 ,  G02B21/0032 ,  G02B21/0068 ,  G02B21/0072 ,  G02B21/0076

摘要： A microscope capable of forming a beam spot in a desired shape on a focal plane is provided. The microscope is provided with a modulation optical element (38) having a plurality of regions for spatial modulation of illumination light and an adjustment element (37) for adjusting an optical property of the illumination light modulated by the modulation optical element.

摘要翻译： 提供能够在焦平面上形成期望形状的光斑的显微镜。 显微镜配备有具有用于照明光的空间调制的多个区域的调制光学元件（38）和用于调整由调制光学元件调制的照明光的光学特性的调整元件（37）。

公开(公告)号：US20110140000A1

公开(公告)日：2011-06-16

申请号：US12961917

申请日：2010-12-07

申请人： Yoshinori IKETAKI

发明人： Yoshinori IKETAKI

IPC分类号： G01J1/58

CPC分类号： G02B21/0076 ,  G02B21/0068 ,  G02B21/0072 ,  G02B27/58

摘要： Provided is a super-resolution microscope for observing a specimen containing a substance having two or more excited quantum state, which includes: a light source section that outputs a first illumination light for exciting the substance from a stable state to a first quantum state, and a second illumination light for further transitioning the substance to other quantum state; an optical system including a microscope objective lens and condensing the first illumination light and the second illumination light, each outputted from the light source section, onto the specimen in a manner that these lights are partially overlapped with each other; a detection section that detects an optical response signal emitted from the specimen in response to condensing of the first illumination light and the second illumination light; and, a polarization controlling element provided with a polarizing member that converts a polarization state of the first illumination light or the second illumination light, and a phase modulation section integrally formed with the polarizing member and spatially modulating a phase of the second illumination light.

摘要翻译： 本发明提供一种用于观察包含具有两个以上激发量子态的物质的检体的超分辨率显微镜，其特征在于，包括：将从所述稳定状态激发所述物质的第一照明光输出至第一量子状态的光源部，以及 用于将物质进一步转变为其他量子态的第二照明光; 包括显微镜物镜的光学系统，将从光源部输出的第一照明光和第二照明光以使得这些光部分重叠的方式聚集在样本上; 检测部，其响应于所述第一照明光和所述第二照明光的聚光而检测从所述样本发射的光响应信号; 以及偏振控制元件，其设置有转换第一照明光或第二照明光的偏振状态的偏振构件，以及与偏振构件一体形成的相位调制部，并对第二照明光的相位进行空间调制。

公开(公告)号：US20080151239A1

公开(公告)日：2008-06-26

申请号：US11847943

申请日：2007-08-30

申请人： Yoshinori IKETAKI

发明人： Yoshinori IKETAKI

IPC分类号： G01J3/30

CPC分类号： G01N21/636 ,  G01N21/41 ,  G02B21/16 ,  G02B2207/114

摘要： The present invention provides a microscopy method and a microscope, which enable microscopic observation of desired information of a specimen with an extremely high S/N ratio in a short period of time without increasing intensity of a light sources. The method of the invention is characterized in that it comprises: a simultaneous irradiation step of irradiating a specimen with first and second electromagnetic rays having different wave length with the rays overlapping at least partly each other; and a simultaneous irradiation visualization step of visualizing a spatial distribution of a refractive index variation caused by the irradiation of the first electromagnetic ray as a phase contrast image of the second electromagnetic ray having passed through the specimen in the region of the specimen to which the overlapped the first and the second electromagnetic rays are irradiated.

摘要翻译： 本发明提供一种显微镜方法和显微镜，其能够在不增加光源强度的情况下，在短时间内以极高的S / N比显微观察样品的期望信息。 本发明的方法的特征在于：其包括：同时照射步骤，用至少部分地彼此重叠的射线照射具有不同波长的第一和第二电磁射线的样本; 以及同时照射可视化步骤，将由第一电磁射线的照射引起的折射率变化的空间分布可视化为通过样本的第二电磁线的相对对比度图像 照射第一和第二电磁射线。