Resist composition, method of forming resist pattern, polymeric compound and compound
    1.
    发明授权
    Resist composition, method of forming resist pattern, polymeric compound and compound 有权
    抗蚀剂组合物,形成抗蚀剂图案的方法,聚合物和化合物

    公开(公告)号:US08609320B2

    公开(公告)日:2013-12-17

    申请号:US13305545

    申请日:2011-11-28

    摘要: A resist composition, a method of forming a resist pattern using the resist composition, a novel polymeric compound and a compound useful as a monomer for the polymeric compound, the resist composition including a base component (A) that exhibits changed solubility in a developing solution under action of acid and an acid generator component (B) that generates acid upon exposure, the base component (A) containing a resin component (A0) including a structural unit (a0) represented by general formula (a0) shown below in which A represents a divalent linking group; and R1 represents a hydrogen atom or a hydrocarbon group of 1 to 6 carbon atoms which may have a substituent.

    摘要翻译: 抗蚀剂组合物,使用抗蚀剂组合物形成抗蚀剂图案的方法,新颖的聚合化合物和可用作高分子化合物的单体的化合物,抗蚀剂组合物包含在显影液中显示出改变的溶解度的基础组分(A) 在酸和产生酸的酸产生剂组分(B)的作用下,包含含有下述通式(a0)表示的结构单元(a0)的树脂组分(A0)的基础组分(A),其中A 表示二价连接基团; 并且R 1表示氢原子或可以具有取代基的1至6个碳原子的烃基。

    Positive resist composition and method of forming resist pattern
    2.
    发明授权
    Positive resist composition and method of forming resist pattern 有权
    正型抗蚀剂组合物和形成抗蚀剂图案的方法

    公开(公告)号:US08206891B2

    公开(公告)日:2012-06-26

    申请号:US12573686

    申请日:2009-10-05

    IPC分类号: G03F7/004 G03F7/30

    摘要: A positive resist composition including: a base component (A) which includes a polymeric compound (A1) containing a structural unit (a0) represented by the general formula (a0-1) and a structural unit (a1) derived from an acrylate ester having an acid dissociable, dissolution inhibiting group; and an acid generator component (B) which includes an acid generator (B1) containing an anion moiety represented by the general formula (I): (in the formula (a0-1), R1 represents a hydrogen atom, a lower alkyl group of 1 to 5 carbon atoms or a halogenated lower alkyl group of 1 to 5 carbon atoms; R2 represents a bivalent linking group; and R3 represents a cyclic group containing —SO2— within the ring skeleton. In the formula (I), X represents a cyclic group of 3 to 30 carbon atoms, Q1 represents a bivalent linking group containing an oxygen atom; Y1 represents an alkylene group of 1 to 4 carbon atoms or a fluorinated alkylene group of 1 to 4 carbon atoms).

    摘要翻译: 一种正型抗蚀剂组合物,其包含:包含含有由通式(a0-1)表示的结构单元(a0)的聚合化合物(A1)和由具有由通式(a0-1)表示的结构单元(a0))的结构单元(a1)的基础组分(A) 酸解离,溶解抑制组; 和含有由通式(I)表示的阴离子部分的酸发生剂(B1)的酸产生剂成分(B):(式(a0-1)中,R 1表示氢原子,低级烷基 1〜5个碳原子的卤代低级烷基或1〜5个碳原子的卤代低级烷基; R2表示二价连接基团; R3表示环状骨架中含有-SO2-的环状基团,式(I)中,X表示 3〜30个碳原子的环状基团,Q1表示含有氧原子的二价连接基团,Y1表示碳原子数1〜4的亚烷基或碳原子数1〜4的氟化亚烷基。

    POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
    3.
    发明申请
    POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN 有权
    正电阻组合物和形成电阻图案的方法

    公开(公告)号:US20100086873A1

    公开(公告)日:2010-04-08

    申请号:US12573686

    申请日:2009-10-05

    IPC分类号: G03F7/20 G03F7/004

    摘要: A positive resist composition including: a base component (A) which includes a polymeric compound (A1) containing a structural unit (a0) represented by the general formula (a0-1) and a structural unit (a1) derived from an acrylate ester having an acid dissociable, dissolution inhibiting group; and an acid generator component (B) which includes an acid generator (B1) containing an anion moiety represented by the general formula (I): (in the formula (a0-1), R1 represents a hydrogen atom, a lower alkyl group of 1 to 5 carbon atoms or a halogenated lower alkyl group of 1 to 5 carbon atoms; R2 represents a bivalent linking group; and R3 represents a cyclic group containing —SO2— within the ring skeleton. In the formula (I), X represents a cyclic group of 3 to 30 carbon atoms, Q1 represents a bivalent linking group containing an oxygen atom; Y1 represents an alkylene group of 1 to 4 carbon atoms or a fluorinated alkylene group of 1 to 4 carbon atoms).

    摘要翻译: 一种正型抗蚀剂组合物,其包含:包含含有由通式(a0-1)表示的结构单元(a0)的聚合化合物(A1)和由具有由通式(a0-1)表示的结构单元(a0))的结构单元(a1)的基础组分(A) 酸解离,溶解抑制组; 和含有由通式(I)表示的阴离子部分的酸发生剂(B1)的酸产生剂成分(B):(式(a0-1)中,R 1表示氢原子,低级烷基 1〜5个碳原子的卤代低级烷基或1〜5个碳原子的卤代低级烷基; R2表示二价连接基团; R3表示环状骨架中含有-SO2-的环状基团,式(I)中,X表示 3〜30个碳原子的环状基团,Q1表示含有氧原子的二价连接基团,Y1表示碳原子数1〜4的亚烷基或碳原子数1〜4的氟化亚烷基。

    RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMERIC COMPOUND AND METHOD OF PRODUCING THE SAME
    4.
    发明申请
    RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMERIC COMPOUND AND METHOD OF PRODUCING THE SAME 有权
    耐蚀组合物,耐热型图案的形成方法,聚合物及其制造方法

    公开(公告)号:US20120308928A1

    公开(公告)日:2012-12-06

    申请号:US13477516

    申请日:2012-05-22

    IPC分类号: C08F228/06 G03F7/20 G03F7/004

    摘要: A resist composition including a base component (A) that exhibits changed solubility in a developing solution under action of acid and an acid generator component (B) that generates acid upon exposure, wherein the base component (A) contains a resin component (A1) including a structural unit (a0) represented by general formula (a0-1) shown below and a structural unit (a1)) containing an acid decomposable group that exhibits increased polarity under action of acid, and the amount of the structural unit (a0) is less than 50 mol %, wherein R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms; R1 represents a divalent linking group; R2 represents a —SO2— containing cyclic group; and v represents 0 or 1.

    摘要翻译: 一种抗蚀剂组合物,其包含在酸作用下显影溶液中溶解度变差的碱成分(A)和曝光时产生酸的酸发生剂成分(B),其中,所述基材(A)含有树脂成分(A1) (a0)表示的结构单元(a0)和结构单元(a1)),其含有在酸作用下显示出极性增加的酸分解基团,结构单元(a0) 小于50摩尔%,其中R表示氢原子,1至5个碳原子的烷基或1至5个碳原子的卤代烷基; R1表示二价连接基团; R2表示含-SO2-的环状基团; v表示0或1。

    Resist composition, and method of forming resist pattern
    5.
    发明授权
    Resist composition, and method of forming resist pattern 有权
    抗蚀剂组合物和形成抗蚀剂图案的方法

    公开(公告)号:US08658343B2

    公开(公告)日:2014-02-25

    申请号:US13373965

    申请日:2011-12-05

    IPC分类号: G03F7/004 G03F7/039

    摘要: A resist composition including a base component (A) which exhibits changed solubility in a developing solution under the action of acid, and an acid generator component (B) which generates acid upon exposure, wherein the base component (A) contains a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-1). In formula (a5-1), R represents a hydrogen atom, an alkyl group or a halogenated alkyl group, X represents single bond or divalent linking group, W represents a cyclic alkylene group which may include an oxygen atom at arbitrary position, each of Ra and Rb independently represents a hydrogen atom or an alkyl group which may include an oxygen atom at arbitrary position, or alternatively, Ra and Rb may be bonded to each other to form a ring together with the nitrogen atom in the formula, and p represents integer of 1 to 3.

    摘要翻译: 一种抗蚀剂组合物,其包含在酸的作用下在显影溶液中显示出改变的溶解性的碱成分(A)和曝光时产生酸的酸产生剂成分(B),其中,所述碱成分(A)含有高分子化合物 A1)具有由通式(a5-1)表示的结构单元(a5)。 式(a5-1)中,R表示氢原子,烷基或卤代烷基,X表示单键或二价连接基,W表示可以在任意位置含有氧原子的环状亚烷基, Ra和Rb独立地表示氢原子或可以在任意位置包含氧原子的烷基,或者Ra和Rb可以与式中的氮原子一起形成环,p表示 1〜3的整数。

    Resist composition, method of forming resist pattern and polymeric compound
    8.
    发明授权
    Resist composition, method of forming resist pattern and polymeric compound 有权
    抗蚀剂组合物,抗蚀剂图案和高分子化合物的形成方法

    公开(公告)号:US08927191B2

    公开(公告)日:2015-01-06

    申请号:US13351716

    申请日:2012-01-17

    IPC分类号: G03F7/039 C08F226/06

    摘要: A resist composition including a base component (A) which exhibits changed solubility in a developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, wherein the base component (A) includes a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-1). In the formula (a5-1), R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms; each of Ra and Rb independently represents a hydrocarbon group which may have a substituent, and Ra and Rb may be mutually bonded to form a ring.

    摘要翻译: 一种抗蚀剂组合物,其包含在酸作用下在显影液中溶解性变差的碱成分(A)和曝光时产生酸的酸发生剂成分(B),其中,所述碱成分(A)含有高分子化合物 )具有由通式(a5-1)表示的结构单元(a5)。 在式(a5-1)中,R表示氢原子,1〜5个碳原子的烷基或1〜5个碳原子的卤代烷基; Ra和Rb各自独立地表示可以具有取代基的烃基,Ra和Rb可以相互键合形成环。

    RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND
    10.
    发明申请
    RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND 有权
    耐蚀组合物,形成耐蚀图案和聚合物的方法

    公开(公告)号:US20120183900A1

    公开(公告)日:2012-07-19

    申请号:US13351716

    申请日:2012-01-17

    IPC分类号: G03F7/20 C08F226/06 G03F7/004

    摘要: A resist composition including a base component (A) which exhibits changed solubility in a developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, wherein the base component (A) includes a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-1). In the formula (a5-1), R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms; each of Ra and Rb independently represents a hydrocarbon group which may have a substituent, and Ra and Rb may be mutually bonded to form a ring.

    摘要翻译: 一种抗蚀剂组合物,其包含在酸作用下在显影液中溶解性变差的碱成分(A)和曝光时产生酸的酸发生剂成分(B),其中,所述碱成分(A)含有高分子化合物 )具有由通式(a5-1)表示的结构单元(a5)。 在式(a5-1)中,R表示氢原子,1〜5个碳原子的烷基或1〜5个碳原子的卤代烷基; Ra和Rb各自独立地表示可以具有取代基的烃基,Ra和Rb可以相互键合形成环。