PATTERNING PROCESS AND RESIST COMPOSITION
    1.
    发明申请
    PATTERNING PROCESS AND RESIST COMPOSITION 审中-公开
    绘图工艺和耐腐蚀组合物

    公开(公告)号:US20130065183A1

    公开(公告)日:2013-03-14

    申请号:US13606297

    申请日:2012-09-07

    IPC分类号: G03F7/004 G03F7/20

    摘要: A resist composition is provided comprising a polymer comprising recurring units having a protected hydroxyl group, a photoacid generator, an organic solvent, and a hydroxyl-free polymeric additive comprising fluorinated recurring units. A negative pattern is formed by coating the resist composition, prebaking to form a resist film, exposing, baking, and developing the exposed film in an organic solvent-based developer to selectively dissolve the unexposed region of resist film.

    摘要翻译: 提供了抗蚀剂组合物,其包含聚合物,其包含具有被保护的羟基的重复单元,光致酸产生剂,有机溶剂和包含氟化重复单元的无羟基聚合物添加剂。 通过涂覆抗蚀剂组合物,预烘烤以形成抗蚀剂膜,在有机溶剂基显影剂中曝光,烘烤和显影曝光的膜以选择性地溶解抗蚀剂膜的未曝光区域,形成负图案。

    RESIST COMPOSITION AND PATTERNING PROCESS
    3.
    发明申请
    RESIST COMPOSITION AND PATTERNING PROCESS 有权
    耐腐蚀组合物和方法

    公开(公告)号:US20100136482A1

    公开(公告)日:2010-06-03

    申请号:US12628794

    申请日:2009-12-01

    IPC分类号: G03F7/20 G03F7/004

    摘要: A resist composition is provided comprising (A) an additive polymer of acyl-protected hexafluoroalcohol structure, (B) a base polymer having a structure derived from lactone ring, hydroxyl group and/or maleic anhydride, the base polymer becoming soluble in alkaline developer under the action of acid, (C) a photoacid generator, and (D) an organic solvent. The additive polymer is transparent to radiation of wavelength up to 200 nm, and its properties can be tailored by a choice of the polymer structure.

    摘要翻译: 提供了抗蚀剂组合物,其包含(A)酰基保护的六氟醇结构的添加剂聚合物,(B)具有衍生自内酯环,羟基和/或马来酸酐的结构的基础聚合物,所述基础聚合物在碱性显影剂中变得可溶 酸的作用,(C)光致酸发生剂,和(D)有机溶剂。 添加剂聚合物对波长高达200nm的辐射是透明的,并且其性质可以通过选择聚合物结构来定制。

    RESIST COMPOSITION AND PATTERNING PROCESS
    6.
    发明申请
    RESIST COMPOSITION AND PATTERNING PROCESS 有权
    耐腐蚀组合物和方法

    公开(公告)号:US20100266957A1

    公开(公告)日:2010-10-21

    申请号:US12761202

    申请日:2010-04-15

    IPC分类号: G03F7/004 G03F7/20

    摘要: An additive polymer comprising recurring units of formula (1) is added to a resist composition comprising a base resin, a photoacid generator, and an organic solvent. R1 is hydrogen or methyl, R2 is alkylene or fluoroalkylene, and R3 is fluoroalkyl. The additive polymer is highly transparent to radiation with wavelength of up to 200 nm. Water repellency, water slip, acid lability, hydrolysis and other properties of the polymer may be adjusted by a choice of polymer structure.

    摘要翻译: 将包含式(1)的重复单元的添加剂聚合物加入到包含基础树脂,光致酸发生剂和有机溶剂的抗蚀剂组合物中。 R1是氢或甲基,R2是亚烷基或氟代亚烷基,R3是氟烷基。 添加剂聚合物对波长高达200nm的辐射是高度透明的。 通过选择聚合物结构可以调节聚合物的拒水性,水滑动性,酸性,水解性和其它性能。