Resonant test probe for integrated circuits
    1.
    发明申请
    Resonant test probe for integrated circuits 审中-公开
    用于集成电路的谐振测试探头

    公开(公告)号:US20130021050A1

    公开(公告)日:2013-01-24

    申请号:US13137084

    申请日:2011-07-20

    申请人: Ka Ng Chui Wang Zhili

    发明人: Ka Ng Chui Wang Zhili

    IPC分类号: G01R31/20

    CPC分类号: G01R1/06772

    摘要: A resonant test probe for testing high-speed integrated circuit devices. The test probe includes a probe tip that makes electrical contact with a device under test to receive a test signal from the device, and an output circuit transmits the received test signal to a testing apparatus. The test probe also includes tuning circuitry coupled between the probe tip and the output circuit. The tuning circuitry is configured to tune a resonance frequency of the test probe to be substantially equal to an operating frequency of the device under test to enable the test probe to transmit the test signal to the device under test.

    摘要翻译: 用于测试高速集成电路器件的谐振测试探头。 测试探针包括探针尖端,其与被测器件电接触以接收来自器件的测试信号,并且输出电路将接收的测试信号传输到测试设备。 测试探头还包括耦合在探针尖端和输出电路之间的调谐电路。 调谐电路被配置为将测试探针的谐振频率调谐到基本上等于被测器件的工作频率,以使测试探针能够将测试信号传送到被测器件。

    Probe card having cantilever probes
    2.
    发明申请
    Probe card having cantilever probes 审中-公开
    探头卡有悬臂探头

    公开(公告)号:US20080106292A1

    公开(公告)日:2008-05-08

    申请号:US11592565

    申请日:2006-11-02

    IPC分类号: G01R31/02

    CPC分类号: G01R1/07342 G01R1/06772

    摘要: A probe card includes a printed circuit board (PCB) and a probe ring coupled to the PCB. The probe card further includes a plurality of probes coupled to the PCB and to the probe card, and includes a plurality of tubes respectively associated with the plurality of probes. Each tube is configured to surround at least a portion of the probe that the tube is associated with. Each tube includes an inner dielectric portion and an outer conductive portion. The conductive portion of each tube is electrically coupled to the PCB.

    摘要翻译: 探针卡包括印刷电路板(PCB)和耦合到PCB的探针环。 探针卡还包括耦合到PCB和探针卡的多个探针,并且包括分别与多个探针相关联的多个管。 每个管被配置为围绕管相关联的探针的至少一部分。 每个管包括内部电介质部分和外部导电部分。 每个管的导电部分电耦合到PCB。

    Compressible pin assembly having frictionlessly connected contact elements
    3.
    发明授权
    Compressible pin assembly having frictionlessly connected contact elements 有权
    具有无摩擦连接的接触元件的可压缩销组件

    公开(公告)号:US09570828B2

    公开(公告)日:2017-02-14

    申请号:US14216103

    申请日:2014-03-17

    发明人: Ka Ng Chui

    摘要: A compressible contact pin. The contact pin includes a first contact element and a second contact element. A compressible member is coupled between the first contact element and the second contact element to compress when one or more external forces are applied between the first contact element and the second contact element. In addition, the compressible member maintains a separation distance between the first and second contact elements when no external forces are applied. An elastomeric connector is coupled between the first contact element and the second contact element. The elastomeric connector electrically couples the first contact element to the second contact element by deforming when the one or more external forces are applied between the first contact element and the second contact element.

    摘要翻译: 可压接触针。 接触销包括第一接触元件和第二接触元件。 当在第一接触元件和第二接触元件之间施加一个或多个外力时,可压缩构件联接在第一接触元件和第二接触元件之间以进行压缩。 此外,当不施加外力时,可压缩构件保持第一和第二接触元件之间的间隔距离。 弹性体连接器联接在第一接触元件和第二接触元件之间。 当所述一个或多个外力施加在所述第一接触元件和所述第二接触元件之间时,所述弹性连接器通过变形将所述第一接触元件电耦合到所述第二接触元件。

    Compressible pin assembly having frictionlessly connected contact elements

    公开(公告)号:US09831589B2

    公开(公告)日:2017-11-28

    申请号:US15391672

    申请日:2016-12-27

    发明人: Ka Ng Chui

    IPC分类号: H01R12/00 H01R13/24

    摘要: A compressible contact pin. The contact pin includes a first contact element and a second contact element. A compressible member is coupled between the first contact element and the second contact element to compress when one or more external forces are applied between the first contact element and the second contact element. In addition, the compressible member maintains a separation distance between the first and second contact elements when no external forces are applied. A plurality of conductive particles is bounded by the compressible member to form an electrical connection between the first contact element and the second contact element. The conductive particles are configured to compress with one another when the compressible member is compressed.

    COMPRESSIBLE PIN ASSEMBLY HAVING FRICTIONLESSLY CONNECTED CONTACT ELEMENTS
    5.
    发明申请
    COMPRESSIBLE PIN ASSEMBLY HAVING FRICTIONLESSLY CONNECTED CONTACT ELEMENTS 有权
    具有无连接接触元件的可压缩引脚组件

    公开(公告)号:US20140199895A1

    公开(公告)日:2014-07-17

    申请号:US14216103

    申请日:2014-03-17

    发明人: Ka Ng Chui

    IPC分类号: H01R13/17

    摘要: A compressible contact pin. The contact pin includes a first contact element and a second contact element. A compressible member is coupled between the first contact element and the second contact element to compress when one or more external forces are applied between the first contact element and the second contact element. In addition, the compressible member maintains a separation distance between the first and second contact elements when no external forces are applied. An elastomeric connector is coupled between the first contact element and the second contact element. The elastomeric connector electrically couples the first contact element to the second contact element by deforming when the one or more external forces are applied between the first contact element and the second contact element.

    摘要翻译: 可压接触针。 接触销包括第一接触元件和第二接触元件。 当在第一接触元件和第二接触元件之间施加一个或多个外力时,可压缩构件联接在第一接触元件和第二接触元件之间以进行压缩。 此外,当不施加外力时,可压缩构件保持第一和第二接触元件之间的间隔距离。 弹性体连接器联接在第一接触元件和第二接触元件之间。 当所述一个或多个外力施加在所述第一接触元件和所述第二接触元件之间时,所述弹性连接器通过变形将所述第一接触元件电耦合到所述第二接触元件。

    COMPRESSIBLE PIN ASSEMBLY HAVING FRICTIONLESSLY CONNECTED CONTACT ELEMENTS
    6.
    发明申请
    COMPRESSIBLE PIN ASSEMBLY HAVING FRICTIONLESSLY CONNECTED CONTACT ELEMENTS 审中-公开
    具有无连接接触元件的可压缩引脚组件

    公开(公告)号:US20140094071A1

    公开(公告)日:2014-04-03

    申请号:US13644125

    申请日:2012-10-03

    发明人: Ka Ng Chui

    IPC分类号: H01R13/17

    摘要: A compressible contact pin. The contact pin includes a first contact element and a second contact element. A compressible member is coupled between the first contact element and the second contact element to compress when one or more external forces are applied between the first contact element and the second contact element. In addition, the compressible member maintains a separation distance between the first and second contact elements when no external forces are applied. A deformable conductor is electrically coupled between the first contact element and the second contact element. The deformable conductor maintains the electrical coupling between the first contact element and the second contact element by deforming when the one or more external forces are applied between the first contact element and the second contact element.

    摘要翻译: 可压接触针。 接触销包括第一接触元件和第二接触元件。 当在第一接触元件和第二接触元件之间施加一个或多个外力时,可压缩构件联接在第一接触元件和第二接触元件之间以进行压缩。 此外,当不施加外力时,可压缩构件保持第一和第二接触元件之间的间隔距离。 可变形导体电耦合在第一接触元件和第二接触元件之间。 当在第一接触元件和第二接触元件之间施加一个或多个外力时,可变形导体通过变形来保持第一接触元件和第二接触元件之间的电耦合。

    FINE PITCH INTERFACE FOR PROBE CARD
    7.
    发明申请
    FINE PITCH INTERFACE FOR PROBE CARD 审中-公开
    精细的PITCH接口用于探针卡

    公开(公告)号:US20140091818A1

    公开(公告)日:2014-04-03

    申请号:US13644162

    申请日:2012-10-03

    发明人: Ka Ng Chui

    IPC分类号: G01R1/04 G01R31/00

    CPC分类号: G01R31/2889

    摘要: A probe card for testing integrated circuit devices. The probe card includes a first circuit having a plurality of traces disposed thereon. The probe card also includes a plurality of pins to couple to a device under test. An interface element interfaces a first set of pins of the plurality of pins with the plurality of traces on the first circuit. The interface element includes a conductive plane coupled to a second set of pins of the plurality of pins to provide power and ground to the device under test.

    摘要翻译: 用于测试集成电路器件的探针卡。 探针卡包括其上布置有多条迹线的第一电路。 探针卡还包括多个引脚以耦合到被测器件。 接口元件将多个引脚的第一组引脚与第一电路上的多个迹线相连接。 接口元件包括耦合到多个引脚的第二组引脚的导电平面,以向被测器件供电和接地。

    Detachable probe card interface
    8.
    发明授权

    公开(公告)号:US10209275B2

    公开(公告)日:2019-02-19

    申请号:US15633736

    申请日:2017-06-26

    IPC分类号: G01R31/00 G01R1/073 G01R31/28

    摘要: A detachable probe card interface comprises a space transformer, a deformable connector, and a carrier board. The space transformer includes first electrical contacts and second electrical contacts, wherein the first electrical contacts are coupled to the second electrical contacts through one or more layers of the space transformer. The deformable connector includes a plurality of conductive particles arranged in columns coinciding with the second electrical contacts, wherein the conductive particles compress with one another when one or more forces are exerted on the deformable connector. The carrier board includes a plurality of vias aligned with the plurality of second electrical contacts on the space transformer, and a plurality of conductors disposed within the vias. Each of the conductors is coupled to a respective one of the second electrical contacts and protrudes into the deformable connector to establish a transmission path between the second electrical contact and one or more columns of the conductive particles.

    Fine pitch interface for probe card
    9.
    发明授权
    Fine pitch interface for probe card 有权
    探针卡的细间距接口

    公开(公告)号:US09151799B2

    公开(公告)日:2015-10-06

    申请号:US13707966

    申请日:2012-12-07

    发明人: Ka Ng Chui

    IPC分类号: G01R31/00 G01R31/28 G01R1/073

    CPC分类号: G01R31/2889 G01R1/07364

    摘要: A probe card interface for interfacing a probe head with a first circuit. The probe card interface includes an impedance control element to interface a first set of pins of the probe head with the first circuit. The impedance control element is further configured to control the impedance of the first set of pins. The probe card interface includes a conductive plane to interface a second set of pins of the probe head with the first circuit. The conductive plane is further coupled to provide at least one of power or ground to the second set of pins.

    摘要翻译: 用于将探头与第一电路连接的探针卡接口。 探针卡接口包括阻抗控制元件,用于将探头的第一组引脚与第一电路接口。 阻抗控制元件还被配置为控制第一组引脚的阻抗。 探针卡接口包括导电平面,用于将探头的第二组引脚与第一电路接口。 导电平面进一步耦合以向第二组引脚提供功率或接地中的至少一个。

    SYSTEM AND METHOD FOR ASSEMBLING A PROBE HEAD
    10.
    发明申请
    SYSTEM AND METHOD FOR ASSEMBLING A PROBE HEAD 审中-公开
    用于组装探头的系统和方法

    公开(公告)号:US20150054537A1

    公开(公告)日:2015-02-26

    申请号:US13973748

    申请日:2013-08-22

    IPC分类号: G01R1/073

    摘要: A method of assembling a probe head for a probe card interface is disclosed. The probe head includes a plurality of alignment plates, wherein each of the alignment plates includes a set of holes. The plurality of alignment plates are stacked so that each of the alignment plates is adjacent to at least one other alignment plate and a set of holes in each of the alignment plates is aligned with a corresponding set of holes in each of the remaining alignment plates. A set of probe wires is then inserted through the set of holes, respectively, in each of the plurality of alignment plates. After the set of probe wires are inserted, the plurality of alignment plates are spaced so that none of the plurality of alignment plates is adjacent to another alignment plate. One or more multi-piece spacers may be used to space the alignment plates.

    摘要翻译: 公开了一种组装用于探针卡接口的探头的方法。 探头包括多个对准板,其中每个对准板包括一组孔。 多个对准板被堆叠,使得每个对准板与至少一个其它对准板相邻,并且每个对准板中的一组孔与每个剩余的对准板中的相应的一组孔对准。 然后,在多个对准板的每一个中分别将一组探针线插入穿过该组孔。 在插入一组探针线之后,多个对准板间隔开,使得多个对准板中没有一个与另一对准板相邻。 可以使用一个或多个多件式间隔件来空间对准板。