SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FROM SCAN DATA

    公开(公告)号:US20250116617A1

    公开(公告)日:2025-04-10

    申请号:US18730876

    申请日:2022-02-09

    Abstract: Some embodiments relate to a computer system for determining a structural image of a sample. The computer system is configured to receive and process raw measured data produced by a scanning microscope and being indicative of at least one scan dataset (IM)N acquired in a scan session and corresponding to a sequence of N measurements on a sample located in proximity to a focal plane of the scanning microscope. Each measurement includes data provided by M detection channels associated with M-segment detector (M≥3). The computer system includes a data analyzer capable of processing at least one scan dataset to compensate image shifts induced by off-axis detection channels for sample features at defocus plane to thereby obtain data indicative of parallax corrected scan image of the sample which enables separation between phase and depth information and extraction of a depth contrast image of the sample from the single scan dataset.

    Resource for quantum computing
    9.
    发明授权

    公开(公告)号:US12141659B2

    公开(公告)日:2024-11-12

    申请号:US18300658

    申请日:2023-04-14

    Abstract: A quantum computing system, method and computer readable medium involve a vacuum chamber, an atom source input associated with the vacuum chamber, a Photonic Integrated Circuit (PIC) having an interaction region configured to interact with an atom from the atom source, a coupling location for atom positioning, a trapping laser for trapping the atom in the coupling location, an excitation laser for manipulating an electronic state or a nuclear state of the atom, a waveguide for guiding input light to the coupling location, and an output channel for directing quantum light generated at the coupling location, out of the vacuum chamber as a resource for quantum computing. The coupling location is associated with the PIC, and the interaction region of the PIC is arranged for at least partial exposure to the vacuum.

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