摘要:
Methods and systems for evaluating checker quality of a verification environment are provided. In some embodiments, an overall sensitivity for the verification environment and an individual sensitivity for a respective checker are calculated. The overall sensitivity is a probability that a plurality of problematic design behaviors, which are propagated to a checker system including at least one checker, can be detected by the verification environment. The individual sensitivity is a probability that a plurality of problematic design behaviors, which are propagated to at least one specific probe among a plurality of probes of a design, can be detected by the checker corresponding to the specific probe. The overall checker sensitivity numbers can show the robustness of the check system. The individual checker sensitivity can guide the user which individual checker or checkers to improve.
摘要:
A circuit emulator includes emulation resources programmed to emulate a circuit, a clocking system for clocking logic implemented by the emulation resources, a resource interface circuit, a logic analyzer, and a debugger. The resource interface circuit supplies input signals to the emulation resources, stores data representing behavior of signals generated by the emulation resources produces in response to the input signals and configures operating characteristics of the clocking system. Upon detecting a specified event in the selected signals of the emulation resources, the logic analyzer asserts a trigger signal telling the clocking system to stop clocking the emulation resources. Communicating with the resource interface circuit and the logic analyzer via a packet routing network, the debugger acquires and processes the data stored by the resource interface circuit and transmits commands to the resource interface circuit and the logic analyzer specifying clocking system operating characteristics, controlling signal data transfer to the debugger, and defining the signal events the logic analyzer is to detect.
摘要:
A computer-based placement and routing (P&R) tool stores a set of circuit patterns, each describing a separate device group by referencing each device of the device group and by indicating which device elements forming the referenced devices are interconnected by nets, a set of placement patterns, each providing a guide for placing IC device elements forming a device group described by a corresponding one of the circuit patterns and a set of routing styles to act as guides for routing nets between device elements placed in particular patterns. To produce a layout for an analog IC described by a netlist, the P&R tool identifies each set of devices in the IC forming a device group described by any of the circuit patterns. The P&R tool then generates a separate device group layout for each identified device group using the placement patterns as guides for placing device elements within the device group layout and using the routing styles as guides for routing nets interconnecting device elements within the device group layout. The P&R tool also generates a layout for each device not included in any identified device group. The tool then generates a layout for the IC incorporating each generated device and device group layout.
摘要:
A system for processing a netlist description of a circuit to generate a display of a schematic diagram including representations of cells and nets first determines positions of the cell instance representations within the schematic diagram and then displays the schematic diagram, including the cell instance representations but no representations of the nets. When a user requests a zoom in operation to display a smaller portion of the schematic diagram at a scale at which net representations can be viewed, the system determines routes for representations of nets that are to reside in that portion of the schematic diagram and then displays those net representations upon zooming in to that portion of the schematic diagram. When the user requests a pan operation to shift the display to another portion of the schematic diagram, the system determines routes for representations of nets that are to reside in that other portion of the schematic diagram and then displays those net representations upon panning to that other portion of the schematic diagram.
摘要:
A computer-aided design tool for automatically generating a layout for an electronic device to be formed by a set of objects implemented within an integrated circuit, receives input from a user defining a device template specifying shapes, dimensions and relative positions within the layout of the objects forming the device. Some of the object dimensions and/or relative positions are specified as functions of values of input parameters to be supplied by the user. When the user supplies the input parameters, the CAD tool evaluates the functions to determine the object dimensions and/or positions that are functions of the input parameters and then generates a layout for the electronic device wherein object shapes, dimensions and relative positions are as specified in the device template and consistent with the function evaluations. The device template may also include instructions for modifying the layout, for example, indicating that copies of an object are to form an array in the layout, that copies of one object are to fill another object, that an object is to be added to the layout having a shape that is a Boolean function of other objects, and that objects are to be added to or removed from the layout.
摘要:
A computer system has an input system and an output system. Program code to be debugged has a plurality of program code statements. The input system is utilized to indicate an error variable in the program code. The error variable has an error value that differs from a desired value. An error set of the error variable is obtained, which is a subset of the statements in the computer readable code. Each statement in the error set is relationally connected to the error variable. A priority value is given to each statement in the error set. The priority values indicate a computed probability that the associated statement is an error source of the error variable. Finally, the output system is used to present each statement in the error set in an ordered manner according to the priority values.
摘要:
In a computer-implemented method and system for creating a test component layout, after creating a reference component layout that is composed of a set of polygonal working shapes, a plurality of shape parameters are defined for the working shapes of the reference component layout, and a parameter template is formed based on the shape parameters of the reference component layout. Thereafter, user-defined distance values corresponding to the shape parameters may be inputted into the parameter template, and the test component layout is automatically created by adjusting geometry of the working shapes of the reference component layout with reference to the user-defined distance values inputted into the parameter template.
摘要:
User's RTL design is analyzed and instrumented so that signals of interest are preserved and can be located in the net list after synthesis. Then, the user's original flow of RTL synthesis and design partition is performed. The output is analyzed to locate the signals of interest. Latches are selectively inserted to the net list to ensure that signal values can be accessed at runtime. After that, a P&R process is performed, and the outputs are analyzed to correlate signal names to registers (flip-flops and latches) or memory blocks locations in FPGAs. A correlation database is built and kept for runtime use. During runtime, a software component may be provided on a workstation for the user to query signal values corresponding to RTL hierarchical signal names.
摘要:
Methods and systems for viewing and debugging HDL designs having SystemVerilog interface constructs are provided. An HDL design code is received, wherein the design code comprises a first module, a second module and a SystemVerilog interface construct. A first object corresponding to the first module, a second object corresponding to the second module and an interface object corresponding to the interface construct are displayed in a schematic view. The interface object is disposed between the first and second objects, and a shape of the interface object is different from that of the first and second objects. The interface signals from the first object to the second object and the interface signals from the second object to the first object pass through the interface object.
摘要:
A method and apparatus for manufacturing an integrated circuit (IC), the method including, generating, by a graphical construction unit, a first graph corresponding to a first net of the IC, the first graph representing a pin of the first net as a vertex, and a connection between two pins of the first net as an edge, the first graph further corresponding to a first IC layout; identifying a first and a second pair of unconnected vertices in the first graph for inserting a first and a second redundant edge, respectively, the first redundant edge and the second redundant edge forming a first connected loop and a second connected loop, respectively, each loop further including at least two edges of the first graph; calculating a tolerance ratio for the first redundant edge and the second redundant edge; sorting the first and second redundant edge based on their tolerance ratio; calculating a yield rate change of the first IC layout associated with inserting one of the first or second redundant edge with a highest tolerance ratio, and updating the first IC layout to include the redundant edge with the highest tolerance ratio if the yield rate change is greater than zero; and calculating the yield rate change of the first IC layout associated with inserting the first or second redundant edge having a second highest tolerance ratio, and updating the first IC layout to include the redundant edge with the second highest tolerance ratio if the yield rate change is greater than zero.