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26 条记录 (耗时 0.023 秒)

    Computing apparatus
    5.
    发明授权
    Computing apparatus 有权

    公开(公告)号：US11416617B2

    公开(公告)日：2022-08-16

    申请号：US16485287

    申请日：2018-02-08

    申请人： Université du Luxembourg

    发明人： Marcus Völp ,  Paulo Esteves-Veríssimo ,  Jérémie Decouchant ,  Vincent Rahli ,  Francisco Rocha

    IPC分类号： G06F21/57 ,  G06F21/76

    摘要： There is disclosed a computing/data processing device comprising: a plurality of computing units, each computing unit comprising a computing resource; the computing device comprising at least three computing units, each computing unit comprising a/the same computing resource; each computing unit further comprising a computing unit access manager, each unit access manager being adapted to control access to the computing resource of the respective computing unit in response to at least one request; wherein, the computing unit access manager only allows a response to the at least one request if a majority of the computing units provide a same response to the at least one request; and wherein, the computing device comprising a network-on-a-chip, is provided on a chip and/or comprises an integrated chip (IC) or microprocessor. The IC beneficially comprises a Field-Programmable Gate Array (FPGA) device. In a preferred embodiment, the unit access manager controls access to the computing resource based on a token; the token comprising: a pointer to the respective computing resource, a set of rights relating to that computing resource, and a numerical representation of that computing resource.

    ABRASIVE WATERJET CUTTING SYSTEM, NOZZLE FOR SUCH A SYSTEM AND MONITORING PROCESS FOR SUCH AN ABRASIVE WATERJET CUTTING SYSTEM
    6.
    发明申请
    ABRASIVE WATERJET CUTTING SYSTEM, NOZZLE FOR SUCH A SYSTEM AND MONITORING PROCESS FOR SUCH AN ABRASIVE WATERJET CUTTING SYSTEM 有权

    公开(公告)号：US20220009055A1

    公开(公告)日：2022-01-13

    申请号：US17279424

    申请日：2019-09-26

    申请人： UNIVERSITÉ DU LUXEMBOURG

    发明人： Edoardo COPERTARO

    IPC分类号： B24C1/04 ,  B24C5/04

    摘要： The invention relates to an abrasive wateget cutting system (2) including: an abrasive watcrjct cutting head (14) comprising: a nozzle (16) adapted for guiding an abrasive wateget (6) intended to cut a metallic workpiece (4); an abrasive wateget flow direction (12); a monitoring device (28) including at least an upstream sensor and a downstream sensor which are distributed along the abrasive wateget flow direction (12) downstream the inlet end of the nozzle (16), and which are adapted for measuring at least one wear characteristic of the nozzle (16) or a characteristic of the abrasive wateget (6), or an alignment characteristic of the nozzle (16) with an orifice (18). The sensors comprise a set of accelerometers (40; 42) and a set of microphones (44; 46). The wear monitoring device (28) being configured to monitor at least one characteristic of the abrasive wateget cutting system (2) through at least the upstream sensor and the downstream sensor.

    METHOD FOR PREVENTING RANSOMWARE ATTACKS ON COMPUTING SYSTEMS
    8.
    发明申请
    METHOD FOR PREVENTING RANSOMWARE ATTACKS ON COMPUTING SYSTEMS 有权

    公开(公告)号：US20210264028A1

    公开(公告)日：2021-08-26

    申请号：US17255067

    申请日：2019-06-24

    申请人： UNIVERSITÉ DU LUXEMBOURG

    发明人： Ziya Alper Genc ,  Gabriele Lenzini ,  Peter Yvain Anthony Ryan

    IPC分类号： G06F21/55 ,  G06F21/56

    摘要： A method for preventing ransomware attacks on a computing system. By controlling the access to a calling interface through which cryptographic functions, such as the random number generator, can be accessed to generate strong encryption keys the method allows to efficiently terminate cryptographic ransomware attacks on the system before they can start doing any damage. If the access to the cryptographic functions, such as the random number generator, is not granted, the ransomware is unable to build a strong encryption key, and it is unable to deploy its intended effect.

    Electrical and opto-electrical characterization of large-area semiconductor devices
    10.
    发明申请
    Electrical and opto-electrical characterization of large-area semiconductor devices 有权
    大面积半导体器件的电气和光电特性

    公开(公告)号：US20120139551A1

    公开(公告)日：2012-06-07

    申请号：US13266948

    申请日：2010-04-27

    申请人： Phillip Dale ,  Susanne Siebentritt

    发明人： Phillip Dale ,  Susanne Siebentritt

    IPC分类号： G01R31/26

    CPC分类号： H01L22/14

    摘要： The present invention relates to an electrical and/or opto-electrical characterisation method for testing large-area semiconductor devices in production, the method comprising the steps of providing a first electrode and placing it into electrical contact with a contact area of a conducting layer of a semiconductor device; providing a movable electrode assembly, comprising a container holding an electrolyte solution and at least a second electrode; immersing the second electrode into the electrolyte solution; positioning the electrode assembly such that the electrolyte solution places the second electrode into electrical contact with a top surface of the semiconductor device; and scanning the movable electrode assembly relative to the top surface of the semiconductor device while performing electrical measurements. It also relates to a corresponding electrical and/or opto-electrical characterisation device comprising a first electrode, a movable electrode assembly with a container holding an electrolyte solution and a second electrode immersed into it and scanning means.

    摘要翻译： 本发明涉及一种用于在生产中测试大面积半导体器件的电和/或光电表征方法，该方法包括以下步骤：提供第一电极并将其放置成与导电层的导电层的接触区域 半导体器件; 提供可移动电极组件，包括容纳电解质溶液的容器和至少第二电极; 将第二电极浸入电解液中; 定位电极组件使得电解质溶液使第二电极与半导体器件的顶表面电接触; 以及在执行电测量时相对于半导体器件的顶表面扫描可动电极组件。 它还涉及相应的电和/或光电表征装置，其包括第一电极，具有容纳电解质溶液的容器的可动电极组件和浸入其中的第二电极和扫描装置。