公开(公告)号：US08330961B1

公开(公告)日：2012-12-11

申请号：US12837173

申请日：2010-07-15

Applicant: Kurt A. Polzin ,  Valentin Korman

Inventor： Kurt A. Polzin ,  Valentin Korman

IPC: G01B9/02

CPC classification number: G01J1/12 ,  G01J3/45 ,  G01J5/0014 ,  G01N21/31 ,  G01N21/45 ,  G01N2021/3185 ,  G01N2021/451

Abstract: The system includes at least one light source generating light energy having a corresponding wavelength. The system's sensor is based on an optical interferometer that receives light energy from each light source. The interferometer includes a free-space optical path disposed in an environment of interest. The system's sensor includes an optical device disposed in the optical path that causes light energy of a first selected wavelength to continue traversing the optical path whereas light energy of at least one second selected wavelength is directed away from the optical path. The interferometer generates an interference between the light energy of the first selected wavelength so-traversing the optical path with the light energy at the corresponding wavelength incident on the optical interferometer. A first optical detector detects the interference. At least one second detector detects the light energy at the at least one second selected wavelength directed away from the optical path.

Abstract translation: 该系统包括产生具有相应波长的光能的至少一个光源。 该系统的传感器基于从每个光源接收光能的光学干涉仪。 干涉仪包括设置在感兴趣的环境中的自由空间光路。 系统的传感器包括设置在光路中的光学装置，其使得第一选定波长的光能继续穿过光路，而至少一个第二选定波长的光能被指向远离光路。 所述干涉仪在所述第一选定波长的光能之间产生干涉，所述光能穿过所述光路，并且在入射到所述光学干涉仪上的相应波长处的光能量产生干涉。 第一光检测器检测干扰。 至少一个第二检测器检测到远离光路的至少一个第二选定波长的光能。

公开(公告)号：US07301545B2

公开(公告)日：2007-11-27

申请号：US10879164

申请日：2004-06-30

Applicant: Du-sik Park ,  Heui-keun Choh ,  Hyun-Jeong Koo ,  Chang-yeong Kim ,  Jin-ho Yim ,  Dong-sik Park ,  Hwan-young Kim

Inventor： Du-sik Park ,  Heui-keun Choh ,  Hyun-Jeong Koo ,  Chang-yeong Kim ,  Jin-ho Yim ,  Dong-sik Park ,  Hwan-young Kim

IPC: G09G5/02 ,  G09G5/00 ,  G09G3/30

CPC classification number: G09G5/10 ,  G01J1/12 ,  G09G2320/0606 ,  G09G2320/0626 ,  G09G2320/0693 ,  H04N5/58 ,  H04N21/4318 ,  H04N21/4854

Abstract: A method of visually measuring the brightness of ambient lighting around a display device is disclosed. In this method, first, a reference brightness of the display device is determined according to a type of display device. Thereafter, information about locations where the display device is used is received from the user, and illuminance values of the display device corresponding to brightness stages are set based on the reference brightness and the location information. Then, a reference brightness is converted into each of the illuminance values corresponding to each of the brightness stages. The converted images with the illumination values corresponding to the brightness stages are displayed to the user, and an image that has a brightness value nearest to the brightness of ambient lighting is selected, and the brightness value of the selected image is determined as the brightness of ambient lighting.

Abstract translation: 公开了一种在视觉上测量显示装置周围的环境光的亮度的方法。 在该方法中，首先，根据显示装置的种类来确定显示装置的基准亮度。 此后，从用户接收关于使用显示装置的位置的信息，并且基于参考亮度和位置信息来设置与亮度级对应的显示装置的照度值。 然后，将参考亮度转换成对应于每个亮度级的每个照度值。 将具有与亮度级对应的照度值的转换图像显示给用户，并且选择具有最接近于环境亮度的亮度的亮度值的图像，并且将所选择的图像的亮度值确定为 环境照明。

公开(公告)号：US4909626A

公开(公告)日：1990-03-20

申请号：US344059

申请日：1989-04-27

Applicant: Alan Purvis ,  Michael G. Clark

Inventor： Alan Purvis ,  Michael G. Clark

IPC: G01J1/12 ,  G02B3/08 ,  G02B5/18 ,  G02F1/1343 ,  G02F1/29

CPC classification number: G02F1/29 ,  G01J1/12 ,  G02B3/08 ,  G02B5/1876 ,  G02B5/1885 ,  G02F1/134309 ,  G02F2001/294

Abstract: An optical component comprises a thin film of an electrically controllable birefringent material confined between substantially planar surfaces. A respective electrode structure is provided on each of the surfaces, each electrode structure being patterned such that an electric field applied across the film by means of electrode structures, when a voltage is applied therebetween, causes modulation of the refractive index of the material such that the wavefront of electromagnetic radiation incident of the component and transmitted through the thin film is divided into Fresnel zones.

Abstract translation: 光学部件包括被限制在基本上平坦的表面之间的电可控双折射材料的薄膜。 在每个表面上设置相应的电极结构，每个电极结构被图案化，使得当施加电压时通过电极结构施加在膜上的电场导致材料的折射率的调制，使得 组件的电磁辐射波前穿过薄膜被分成菲涅尔区。

公开(公告)号：US1419385A

公开(公告)日：1922-06-13

申请号：US30271119

申请日：1919-06-09

Applicant: LEROY KELLOGG

Inventor： LEROY KELLOGG

IPC: G01J1/12

CPC classification number: G01J1/12

公开(公告)号：US20110128540A1

公开(公告)日：2011-06-02

申请号：US12953056

申请日：2010-11-23

Applicant: Shinichi IIDA ,  Wataru Yamaguchi

Inventor： Shinichi IIDA ,  Wataru Yamaguchi

IPC: G01J1/10 ,  G01J3/42

CPC classification number: G01J1/12 ,  G01J1/04 ,  G01J3/02 ,  G01J3/0254 ,  G01J3/0272

Abstract: A calibration device 21 according to the present invention is a member used for white calibration of an optical characteristic measuring apparatus 1 for measuring an optical characteristic of a specimen arranged to close a measuring opening and is used together with a spacer 24. Accordingly, such a calibration device 21 can perform more accurate white calibration by preventing formation of an interference pattern by the spacer 24.

Abstract translation: 根据本发明的校准装置21是用于测量布置成关闭测量开口的试样的光学特性的光学特性测量装置1的白色校准的部件，并与间隔件24一起使用。因此， 校准装置21可以通过防止间隔物24形成干涉图案来执行更准确的白色校准。

公开(公告)号：US3413066A

公开(公告)日：1968-11-26

申请号：US41097764

申请日：1964-11-13

Applicant: POLAROID CORP

Inventor： BIBER CONRAD H ,  TOPAZ JEREMY M

IPC: G01J1/12 ,  G01J1/42

CPC classification number: G01J1/4214 ,  G01J1/12 ,  G01J1/124

公开(公告)号：US1498214A

公开(公告)日：1924-06-17

申请号：US33568419

申请日：1919-11-04

Applicant: HOLOPHANE GLASS COMPANY INC

Inventor： TUCK DAVIS H

IPC: G01J1/12

CPC classification number: G01J1/12

公开(公告)号：US1437399A

公开(公告)日：1922-12-05

申请号：US11237916

申请日：1916-07-31

Applicant: KALMUS COMSTOCK & WESCOTT INC

Inventor： COMSTOCK DANIEL F

IPC: G01J1/12

CPC classification number: G01J1/12

公开(公告)号：US08390803B2

公开(公告)日：2013-03-05

申请号：US12953056

申请日：2010-11-23

Applicant: Shinichi Iida ,  Wataru Yamaguchi

Inventor： Shinichi Iida ,  Wataru Yamaguchi

IPC: G01J1/10 ,  G01J3/42

CPC classification number: G01J1/12 ,  G01J1/04 ,  G01J3/02 ,  G01J3/0254 ,  G01J3/0272

Abstract: A calibration device 21 according to the present invention is a member used for white calibration of an optical characteristic measuring apparatus 1 for measuring an optical characteristic of a specimen arranged to close a measuring opening and is used together with a spacer 24. Accordingly, such a calibration device 21 can perform more accurate white calibration by preventing formation of an interference pattern by the spacer 24.

Abstract translation: 根据本发明的校准装置21是用于测量布置成关闭测量开口的试样的光学特性的光学特性测量装置1的白色校准的部件，并与间隔件24一起使用。因此， 校准装置21可以通过防止间隔物24形成干涉图案来执行更准确的白色校准。

公开(公告)号：US3203310A

公开(公告)日：1965-08-31

申请号：US19583662

申请日：1962-05-18

Applicant: WILLIAM SMITH ,  CEDERBAUM ALVIN D

Inventor： WILLIAM SMITH ,  CEDERBAUM ALVIN D

IPC: G01J1/12

CPC classification number: G01J1/12