摘要:
A maintenance information management server stores: apparatus information related to apparatus name and apparatus model of semiconductor manufacturing apparatuses for each apparatus code; facility information about semiconductor manufacturing apparatuses installed in each factory/manufacturing line associated with the apparatus code; defect countermeasure information showing a content of a defect associated with the apparatus code; and defect countermeasure information. When defect information related to a semiconductor manufacturing apparatus installed in a factory/manufacturing line and countermeasure information to cope with the defect, as defect countermeasure information, are given, the maintenance information management server registers the defect countermeasure information based on the apparatus code and distributes the defect countermeasure information as maintenance information to all other factories/manufacturing lines having installed therein semiconductor manufacturing apparatuses with an apparatus code identical with that of the semiconductor manufacturing apparatus having the defect.
摘要:
Expert knowledge regarding investigation of the causes of various failures, and knowledge for extracting DI/DO information (IOD), which is exchanged by an NC unit (11) and a machine tool (13), as well as information (ITD) internally of the NC unit, is stored in a knowledge base (IB). When the contents of a failure are entered from an alarm detector (11g) upon occurrence of the failure, a reasoning mechanism (ADPR) uses the expert knowledge conforming to the failure to automatically extract the DI/DO information and information internally of the NC unit (IOD, ITB), ascertains actually occurring phenomena based on this information, recognizes the cause of the failure from these pheonomena, and displays the cause of the failure and a method of dealing with it.
摘要:
Factories (102-104) have host computers (107) for monitoring industrial equipment (106). Each host computer (107) is connected to a management host computer (108) on a vendor (101) side through the internet (105). The host computer (107) on the factory side detects occurrence of a trouble of the industrial equipment (106) and notifies the vendor side of status information representing a trouble state. In response to this, the host computer (108) on the vendor side notifies the factory side of response information representing a countermeasure against the trouble state.
摘要:
Factories (102–104) have host computers (107) for monitoring industrial equipment (106). Each host computer (107) is connected to a management host computer (108) on a vendor (101) side through the internet (105). The host computer (107) on the factory side detects occurrence of a trouble of the industrial equipment (106) and notifies the vendor side of status information representing a trouble state. In response to this, the host computer (108) on the vendor side notifies the factory side of response information representing a countermeasure against the trouble state.
摘要:
Factories (102-104) have host computers (107) for monitoring industrial equipments (106). Each host computer (107) is connected to a management host computer (108) on a vendor (101) side through the internet (105). The host computer (107) on the factory side detects occurrence of a trouble of the industrial equipment (106) and notifies the vendor side of status information representing a trouble state. In response to this, the host computer (108) on the vendor side notifies the factory side of response information representing a countermeasure against the trouble state.
摘要:
Factories (102-104) have host computers (107) for monitoring industrial equipment (106). Each host computer (107) is connected to a management host computer (108) on a vendor (101) side through the internet (105). The host computer (107) on the factory side detects occurrence of a trouble of the industrial equipment (106) and notifies the vendor side of status information representing a trouble state. In response to this, the host computer (108) on the vendor side notifies the factory side of response information representing a countermeasure against the trouble state.
摘要:
Factories (102-104) have host computers (107) for monitoring industrial equipments (106). Each host computer (107) is connected to a management host computer (108) on a vendor (101) side through the internet (105). The host computer (107) on the factory side detects occurrence of a trouble of the industrial equipment (106) and notifies the vendor side of status information representing a trouble state. In response to this, the host computer (108) on the vendor side notifies the factory side of response information representing a countermeasure against the trouble state.
摘要:
Factories (102-104) have host computers (107) for monitoring industrial equipments (106). Each host computer (107) is connected to a management host computer (108) on a vendor (101) side through the internet (105). The host computer (107) on the factory side detects occurrence of a trouble of the industrial equipment (106) and notifies the vendor side of status information representing a trouble state. In response to this, the host computer (108) on the vendor side notifies the factory side of response information representing a countermeasure against the trouble state.
摘要:
Factories (102-104) have host computers (107) for monitoring industrial equipments (106). Each host computer (107) is connected to a management host computer (108) on a vendor (101) side through the internet (105). The host computer (107) on the factory side detects occurrence of a trouble of the industrial equipment (106) and notifies the vendor side of status information representing a trouble state. In response to this, the host computer (108) on the vendor side notifies the factory side of response information representing a countermeasure against the trouble state.
摘要:
A manufacturing environment having a machine tool, a measuring device, a storage medium, and having a computer programmed to control: a) chip producing machining of a first workpiece in a machine tool, b) acquiring at least two machine parameters of the machine tool during the chip producing machining of the first workpiece, c) storing the machine parameters in the storage medium, wherein the storing is performed with assignment to the first workpiece, and d) repeating steps a) to c) for a number of n workpieces; and, after one of steps a) to d), or later, triggering a testing method including: (i) selecting at least one of the workpieces, (ii) performing an automated test of the at least one selected workpiece using the measuring device, or (iii) performing a processor-controlled evaluation of the automated test to classify the at least one selected workpiece as a good part, or a reject part.