摘要:
Heat is applied to a conductive structure that includes one or more vias, and the temperature at or near the point of heat application is measured. The measured temperature indicates the integrity or the defectiveness of various features (e.g. vias and/or traces) in the conductive structure, near the point of heat application. Specifically, a higher temperature measurement (as compared to a measurement in a reference structure) indicates a reduced heat transfer from the point of heat application, and therefore indicates a defect. The reference structure can be in the same die as the conductive structure (e.g. to provide a baseline) or outside the die but in the same wafer (e.g. in a test structure) or outside the wafer (e.g. in a reference wafer), depending on the embodiment.
摘要:
A method and apparatus are provided for automated non-destructive evaluation (NDE) thermal imaging tests of combustor liners and other products. The apparatus for automated NDE thermal imaging testing of a sample includes a flash lamp positioned at a first side of the sample. An infrared camera is positioned near a second side of the sample. A linear positioning system supports the sample. A data acquisition and processing computer is coupled to the flash lamp for triggering the flash lamp. The data acquisition and processing computer is coupled to the infrared camera for acquiring and processing image data. The data acquisition and processing computer is coupled to the linear positioning system for positioning the sample for sequentially acquiring image data.
摘要:
Glide heads for the detection of asperities on a storage disc have a thermal transducer oriented along the air bearing surface. The thermal transducer generally is in electrical contact with a circuit to measure the electrical resistance of the thermal transducer. Preferred methods of depositing the thermal transducer involve the deposition of the thermal transducer on the smooth surface of a wafer prior to the slicing of individual sliders.
摘要:
There are provided an inline inspection system and inspection method for inspecting the substrate surface on which semiconductors and circuit patterns are formed by radiating thereto white beam, laser beam or electron beam, and reviewing, inspecting and discriminating the detected roughness and figure defect, particle and moreover electrical defect on the surface with higher accuracy within a short period of time with the same instrument. Thereby, automatic movement to the position to be reviewed, acquisition of image and classification can be realized. On the occasion of identifying the position to be reviewed on a sample and forming an image through irradiation of electron beam on the basis of the positional information of defect detected with the other inspection instrument, an electrical defect can be reviewed with the voltage contrast mode by designating the electron beam irradiation condition, detectors and detecting condition depending on a kind of defect to be reviewed. The image obtained is automatically classified in the image processing unit and the result is then additionally output to the defect file.
摘要:
Apparatus for non-destructively testing material to enable detection of any damage sites, comprising means for generating localised heating at any damage site in the material, and means for imaging the material to enable detection of any localised heating at the damage site.
摘要:
A system employing thermographic techniques is provided for inspecting materials and detecting defects therein such as void, inclusions, interlaminar disbonds, or porosity. The system utilizes a composite material and a source of pulsed current which is delivered to conductive elements within the composite material which, in turn, heats the material being inspected allowing thermographic techniques to be employed to measure the temperature distributions related to the application of the heat source and indicative of the defects of the material being measured.
摘要:
A system and method for determining lateral thermal diffusivity of a material sample using a heat pulse; a sample oriented within an orthogonal coordinate system; an infrared camera; and a computer that has a digital frame grabber, and data acquisition and processing software. The mathematical model used within the data processing software is capable of determining the lateral thermal diffusivity of a sample of finite boundaries. The system and method may also be used as a nondestructive method for detecting and locating cracks within the material sample.
摘要:
A method of determining contact wear in a trip unit of a circuit breaker and a circuit breaker employing such a method are presented. The trip unit includes a microcontroller and associated memories. An algorithm (program) stored in a memory of the trip unit calculates cumulative energy dissipated in the breaker contacts using the current signal detected at the time of separation. Measurement of cumulative energy dissipated in the breaker contacts is proportional to contact wear. Maintenance setpoints are determined based on industry standard endurance tests and alarm threshold and trip thresholds further based on industry standards are provided within the algorithm for notifying local or remote personnel of a necessary maintenance procedure.
摘要:
A non-destructive plastic butt weld inspection method in which the weld bead 42 is removed from an exterior surface of a weld zone region 44 of a butt weld and the weld zone region 44 is heated to a temperature sufficient to visualize the weld zone 44. After heating, defective joints are readily identified by the appearance of a bond line 40 in the weld zone 44 while satisfactory joints merely show the weld zone 44 with no evidence of a bond line 40. Surface irregularities such as ridges 46 and indentations 48 may also form in the weld zone during the heating step.
摘要:
This invention provides an apparatus for nondestructive residential inspection and various methods for using a thermal imaging apparatus coupled to inspect exterior residential components, interior residential components, a pitched roof and basement of a residential building and the electrical system of a residential building.