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公开(公告)号：US06226349B1
公开(公告)日：2001-05-01
申请号：US09356346
申请日：1999-07-19
IPC分类号： G01N23207
CPC分类号： G01N23/201 , G01N23/20 , G21K1/062
摘要： An X-ray analysis apparatus having a curved paraboloid-shaped curved graded multilayer Bragg reflector (5) is characterized in that the layers of the reflector (5) are directly introduced onto a concave curved surface of a paraboloid-shaped hollow substrate and a maximum allowable shape deviation for the concave substrate surface facing the reflector is &Dgr;p={square root over (2px)} &Dgr;&thgr;R, and having a maximum allowable waviness Δ y Δ x = 1 2 Δθ R and a maximum allowable roughness &Dgr;y=d/2&pgr;, preferentially &Dgr;y≦0.3 nm, wherein the X radiation (7) impinges on the curved surface of the reflector (5) at an angle of incidence 0°
摘要翻译： 具有弯曲抛物面形弯曲多层布拉格反射体（5）的X射线分析装置的特征在于，将反射器（5）的各层直接导入抛物面形中空基板的凹曲面上， 面向反射器的凹面基板表面的允许形状偏差为DELTAp = {平方根超过（2px）} DELTAthetaR，并且具有最大允许波纹度和最大允许粗糙度DELTAy = d / 2pi，优选为DELTAy <= 0.3nm，其中X 辐射（7）以入射角0°<= 5°撞击反射器（5）的弯曲表面，随着反射器层朝向抛物面开口的周期厚度d在x方向上增加， 偏差DELTAd / DELTAx小于d /（2x）。 以这种方式，在可靠性和寿命方面，分析装置的传输被显着地提高，同时降低了制造难度和费用。
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公开(公告)号：US06836532B2
公开(公告)日：2004-12-28
申请号：US10118981
申请日：2002-04-09
申请人： Roger D. Durst , Bob Baoping He
发明人： Roger D. Durst , Bob Baoping He
IPC分类号： G01N23207
CPC分类号： G01N23/207 , C30B7/00 , Y10T117/1004 , Y10T117/1024
摘要： A biological crystal formation screening apparatus uses an x-ray diffraction technique to analyze the sample containers of a sample tray for the presence of crystal formation. An x-ray source is directed toward a sample under investigation, and a two-dimensional x-ray detector is located to receive any diffracted x-ray energy. A positioning apparatus allows the different sample containers of a tray to be sequentially aligned with the source and detector, allowing each to be examined. The sample container is arranged such that a sample is located relative to the well solution so that the x-ray beam is directed to the sample without being incident on the well solution.
摘要翻译： 生物晶体形成筛选装置使用x射线衍射技术来分析样品盘的样品容器以存在晶体形成。 X射线源指向被研究的样本，并且二维X射线检测器被定位成接收任何衍射的X射线能量。 定位装置允许托盘的不同样本容器顺序地与源和检测器对准，从而允许每个样本容器被检查。 样品容器被布置成使得样品相对于孔溶液定位，使得x射线束被引导到样品而不会入射到井溶液中。
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3.发明授权Method for determining parameters of a unit cell of a crystal structure using diffraction 有权使用衍射确定晶体结构的晶胞的参数的方法公开(公告)号：US06411676B1
公开(公告)日：2002-06-25
申请号：US09674461
申请日：2000-12-22
IPC分类号： G01N23207
CPC分类号： G01N23/207 , G01N23/20
摘要： A method for determining the parameters of a unit cell of a crystal structure using diffraction is presented. The method includes the steps of repeatedly rotating the crystal at a predetermined angle, while the crystal moves in relation to a detection surface and measuring the position of radiation reflected from the crystal. The resulting combined measurements are utilized to accurately determine the unit cell dimension and orientation of the crystal.
摘要翻译： 提出了一种使用衍射确定晶体结构单元的参数的方法。 该方法包括以下步骤：当晶体相对于检测表面移动并测量从晶体反射的辐射的位置时以预定的角度反复旋转晶体。 所得到的组合测量用于精确地确定晶体的晶胞尺寸和取向。
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4.发明授权公开(公告)号：US06678347B1
公开(公告)日：2004-01-13
申请号：US10205717
申请日：2002-07-26
IPC分类号： G01N23207
CPC分类号： G01N23/207
摘要： A method for quantitatively determining the phase composition of a sample mixture that comprises two or more textured polycrystalline materials, based on corrected and integrated x-ray diffraction intensities. The effect of texture has been analytically eliminated from such corrected and integrated x-ray diffraction intensities, based on the texture information obtained from the sample mixture.
摘要翻译： 基于校正和积分的x射线衍射强度，定量测定包含两种或多种纹理多晶材料的样品混合物的相组成的方法。 基于从样品混合物获得的纹理信息，已经从这种校正和积分的x射线衍射强度中分析地消除了纹理的影响。
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公开(公告)号：US06438204B1
公开(公告)日：2002-08-20
申请号：US09851358
申请日：2001-05-08
IPC分类号： G01N23207
CPC分类号： G01N23/20
摘要： A method uses linear prediction analysis to define a first structure factor component for a first reflection from x-ray crystallography data. The x-ray crystallography data includes a set of cognizable reflections. The method includes expressing the first structure factor component as a first linear equation in which the first structure factor component is equal to a sum of a first plurality of terms. Each term includes a product of (1) a structure factor component for a cognizable reflection from the x-ray crystallography data, wherein the cognizable reflection has a separation in reciprocal space from the first reflection, and (2) a linear prediction coefficient corresponding to the separation between the cognizable reflection and the first reflection. The method further includes calculating values for the linear prediction coefficients. The method further includes substituting the values for the linear prediction coefficients into the first linear equation, thereby defining the first structure factor component for the first reflection.
摘要翻译： 一种方法使用线性预测分析来定义来自X射线晶体学数据的第一反射的第一结构因子分量。 x射线晶体学数据包括一组可认知的反射。 该方法包括将第一结构因子分量表示为第一线性方程，其中第一结构因子分量等于第一多个项的和。 每个术语包括（1）用于来自x射线晶体学数据的可认知反射的结构因子分量的乘积，其中可认知反射在第一反射中具有在相互间隔中的分离，以及（2）对应于 可认知反射与第一次反射之间的分离。 该方法还包括计算线性预测系数的值。 该方法还包括将线性预测系数的值代入第一线性方程，从而定义第一反射的第一结构因子分量。
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公开(公告)号：US06782076B2
公开(公告)日：2004-08-24
申请号：US10004785
申请日：2001-12-07
IPC分类号： G01N23207
CPC分类号： G01N23/207
摘要： An X-ray topographic system comprises an X-ray generator producing a beam of X-rays impinging on a limited area of a sample such as a silicon wafer. A solid state detector is positioned to intercept the beam after transmission through or reflection from the sample. The detector has an array of pixels matching the beam area to produce a digital image of said limited area. Relative stepping motion between the X-ray generator and the sample produces a series of digital images which are combined together. In optional embodiments, an X-ray optic is interposed to produce a parallel beam to avoid image doubling, or the effect of image doubling is removed by software.
摘要翻译： X射线地形系统包括产生一个X射线束的X射线发生器，该X射线发射器照射在例如硅晶片的样品的有限区域上。 固态检测器被定位成在通过样品或从样品反射之后拦截光束。 检测器具有与波束区域匹配的像素阵列，以产生所述有限区域的数字图像。 X射线发生器和样品之间的相对步进运动产生一系列数字图像，它们组合在一起。 在可选实施例中，插入X射线光学器件以产生平行光束以避免图像加倍，或者通过软件去除图像倍增的影响。
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公开(公告)号：US06731719B2
公开(公告)日：2004-05-04
申请号：US10022150
申请日：2001-12-13
申请人： Paul F. Fewster , Norman L. Andrew
发明人： Paul F. Fewster , Norman L. Andrew
IPC分类号： G01N23207
CPC分类号： G01N23/20
摘要： An X-ray diffractometer has an X-ray source (10), a double pinhole collimator (14), a sample (22) mounted on a rotatable sample stage (20), an analyser crystal (30) and a detector (34). The analyser crystal and detector are arranged to rotate together about an axis (21) that is coaxial with the axis of rotation of the sample stage. Very few scattered X-rays (26) reach the detector (34). The diffractometer has particular use for routine quality control measurements.
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8.发明授权公开(公告)号：US06546074B1
公开(公告)日：2003-04-08
申请号：US09812957
申请日：2001-03-27
申请人： Tom L. Blundell , Chris Abell , Frank Von Delft
发明人： Tom L. Blundell , Chris Abell , Frank Von Delft
IPC分类号： G01N23207
CPC分类号： C12N9/88 , C07K2299/00 , C07K2319/00
摘要： A method of identifying an agent compound (such as an inhibitor) which modulates asparate decarboxylase (ADC) activity. The method comprises the steps of: a) providing a model of a binding cavity of ADC, said model including at least one of binding site nos. 1 and 9 defined by Table 2; b) providing the structure of said agent compound; c) fitting the candidate agent compound to said binding cavity, including determining the interactions between the candidate agent compound and at least one of binding site nos. 1 and 9; and d) selecting the candidate agent compound.
摘要翻译： 鉴定调节天冬氨酸脱羧酶（ADC）活性的试剂化合物（如抑制剂）的方法。 该方法包括以下步骤：a）提供ADC的结合腔的模型，所述模型包括结合位点nos中的至少一个。 1和9定义为表2; b）提供所述试剂化合物的结构; c）将候选试剂化合物装配到所述结合腔，包括测定候选试剂化合物与结合位点之间的至少一个之间的相互作用。 1和9; andd）选择候选药剂化合物。
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公开(公告)号：US06498829B1
公开(公告)日：2002-12-24
申请号：US09894511
申请日：2001-06-28
IPC分类号： G01N23207
CPC分类号： G01N23/20
摘要： A method and apparatus to simultaneously measure the diffraction resolution and mosaic spread of macromolecular crystals, are described. The method includes minimizing contributions of an x-ray beam to any reflection angular widths in the crystal, rapidly measuring multi reflection profiles in the crystal over a wide resolution range, evaluating and deconvoluting the Lorentz effect and beam contributions, and determining the direction in which the crystal is most perfect.
摘要翻译： 描述了同时测量大分子晶体的衍射分辨率和镶嵌传播的方法和装置。 该方法包括使X射线束对晶体中的任何反射角宽度的贡献最小化，在宽分辨率范围内快速测量晶体中的多反射分布，评估和解卷积洛伦兹效应和波束贡献，以及确定 水晶最完美。
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10.发明授权Method for X-ray micro-diffraction measurement and X-ray micro-diffraction apparatus 有权X射线微观衍射测定方法及X射线衍射仪公开(公告)号：US06285736B1
公开(公告)日：2001-09-04
申请号：US09427618
申请日：1999-10-27
申请人： Akihide Dosho
发明人： Akihide Dosho
IPC分类号： G01N23207
CPC分类号： G01N23/20025
摘要： An X-ray micro-diffraction measuring method for detecting X-rays diffracted at a minute portion of a specimen upon irradiating the minute portion with X-rays is disclosed. A cylindrical stimulation type fluorescent member is arranged around the specimen. A sample facet of the specimen is tilted by, for example, 45° with respect to the stimulation type fluorescent member such that the stimulation type fluorescent member can receive both diffracted X-rays passing along a direction tangential to the sample facet and diffracted X-rays passing along a direction perpendicular to the sample facet. Diffracted X-ray images can be obtained on the stimulation type fluorescent by merely rotating the specimen about only the &phgr; axis thereof so as to perform the in-plane rotation without a rotation about the &khgr; axis. By eliminating a rotation about one axis from rotations about two axes for the specimen, it may be possible to avoid a degradation of measurement preciseness due to a crossing error of the two axes. Also, the elimination of the axis mentioned above may cause the structure of the apparatus to be simplified and the time required for the measurement to be shortened.
摘要翻译： 公开了一种用于在用X射线照射微小部分时检测在样本的微小部分衍射的X射线的X射线微观衍射测量方法。 圆柱形刺激型荧光部件设置在试样周围。 试样的样品面相对于刺激型荧光部件倾斜例如45°，使得刺激型荧光部件能够接收沿着与样品面切线的方向通过的衍射X射线， 沿着垂直于样品刻面的方向通过的光线。 通过仅使样本仅旋转其phi轴，可以在刺激型荧光体上获得衍射的X射线图像，以便进行平面内旋转而不围绕着旋转的旋转; 轴。 通过消除围绕试样的围绕两个轴的旋转的围绕一个轴的旋转，可以避免由于两个轴的交叉误差而引起的测量精度的劣化。 此外，消除上述轴可能会使装置的结构简化，并缩短测量所需的时间。
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