X-ray detection system for wavelength dispersive and energy dispersive spectroscopy and electron beam applications
    1.
    发明授权
    X-ray detection system for wavelength dispersive and energy dispersive spectroscopy and electron beam applications 有权
    用于波长色散和能量色散光谱和电子束应用的X射线检测系统

    公开(公告)号:US07928400B1

    公开(公告)日:2011-04-19

    申请号:US12185565

    申请日:2008-08-04

    Abstract: A detection system for wavelength-dispersive and energy-dispersive spectrometry comprises an X-ray detector formed from a solid-state avalanche photodiode with a thin entrance window electrode that permits the efficient detection of X-rays scattered from “light” elements. The detector can be tilted relative to the incident X-rays in order to increase the detection efficiency for X-rays scattered from “heavy” elements. The entrance window may be continuous conductive layer with a thickness in the range of 5 to 10 nanometers or may be a pattern of conductive lines with “windowless” areas between the lines. A signal processing circuit for the avalanche photodiode detector includes an ultra-low noise amplifier, a dual channel discriminator, a scaler and a digital counter. A linear array of avalanche photodiode detectors is used to increase the count rate of the detection system.

    Abstract translation: 用于波长色散和能量色散光谱的检测系统包括由具有薄入口窗电极的固态雪崩光电二极管形成的X射线检测器,其允许有效检测从“轻”元件散射的X射线。 检测器可以相对于入射的X射线倾斜,以增加从“重”元件散射的X射线的检测效率。 入口窗口可以是厚度在5至10纳米范围内的连续导电层,或者可以是线之间具有“无窗”区域的导电线图案。 用于雪崩光电二极管检测器的信号处理电路包括超低噪声放大器,双通道鉴频器,定标器和数字计数器。 雪崩光电二极管检测器的线性阵列用于增加检测系统的计数率。

    HANDHELD TWO-DIMENSIONAL X-RAY DIFFRACTOMETER
    2.
    发明申请
    HANDHELD TWO-DIMENSIONAL X-RAY DIFFRACTOMETER 有权
    手持式二维X射线衍射仪

    公开(公告)号:US20090274274A1

    公开(公告)日:2009-11-05

    申请号:US12113505

    申请日:2008-05-01

    CPC classification number: G01N23/207

    Abstract: A handheld X-ray diffractometer comprises a miniaturized X-ray source and multiple area detectors to allow the diffractometer to obtain two-dimensional X-ray diffraction images in a large diffraction space without rotating the sample. The source and detectors are located inside of a radio opaque enclosure that protects the operator during use. The handheld diffractometer also comprises a sample monitoring and alignment system that allows an operator to observe the measuring area and to align the diffractometer to the sample from outside of the housing. A specially designed mouthpiece, which mates the diffractometer to the sample area, prevents x-ray leakage and triggers off the data collection. The detectors can be positioned to perform measurements necessary to calculate a mechanical stress in the sample. Linear detectors may also be used in place of the area detectors.

    Abstract translation: 手持X射线衍射仪包括小型化X射线源和多个区域检测器,以允许衍射仪在大的衍射空间中获得二维X射线衍射图像,而不旋转样品。 源和检测器位于无线电不透明外壳内部,可在使用过程中保护操作者。 手持式衍射仪还包括样品监测和校准系统,其允许操作者观察测量区域并将衍射仪与壳体外部对准样品。 将衍射仪与样品区域配合的专门设计的接口管可防止X射线泄漏并触发数据采集。 可以将检测器定位成执行用于计算样品中的机械应力所需的测量。 也可以使用线性检测器来代替区域检测器。

    X-ray detector with photodetector embedded in scintillator
    3.
    发明申请
    X-ray detector with photodetector embedded in scintillator 审中-公开
    具有光电探测器的X射线探测器嵌入闪烁体

    公开(公告)号:US20070272872A1

    公开(公告)日:2007-11-29

    申请号:US11439657

    申请日:2006-05-24

    CPC classification number: G01T1/2018

    Abstract: An X-ray detector includes one or more photodetectors embedded in scintillating material. The photodetectors may have a needle-like, a column-like, or a ridge-like structure. The scintillating material is applied over the photodetector which can either be a p−i−n type diode, an n−i−p type diode, a Schottky diode, or an avalanche diode.

    Abstract translation: X射线检测器包括嵌入闪烁材料中的一个或多个光电检测器。 光电检测器可以具有针状,柱状或脊状结构。 闪烁材料被施加在可以是p-i-n型二极管,n-i-p型二极管,肖特基二极管或雪崩二极管的光电检测器上。

    Non-spilling cryogenic transfer vial for crystal sample mounting
    4.
    发明授权
    Non-spilling cryogenic transfer vial for crystal sample mounting 有权
    不溢出的低温转移瓶用于晶体样品安装

    公开(公告)号:US06701743B1

    公开(公告)日:2004-03-09

    申请号:US10005504

    申请日:2001-12-03

    CPC classification number: F25D3/107

    Abstract: A cryogenic transfer vial for storing and loading a crystal sample on a goniometer includes a cryogen retainer that inhibits spillage of the cryogen when the vial is inverted during sample loading and retrieval. The retainer may be an adsorptive material located in a region of the vial near a sample location, or may be a baffle arrangement within the vial for containing the cryogen.

    Abstract translation: 用于在测角器上存储和加载晶体样品的低温转移小瓶包括冷冻剂保持器,当样品装载和取样期间小瓶被倒置时,可以防止冷冻剂溢出。 保持器可以是位于样品瓶附近的小瓶的区域中的吸附材料,或者可以是用于容纳冷冻剂的小瓶内的挡板装置。

    Readout structure and technique for electron cloud avalanche detectors
    5.
    发明授权
    Readout structure and technique for electron cloud avalanche detectors 有权
    电子云雪崩探测器的读出结构和技术

    公开(公告)号:US06340819B1

    公开(公告)日:2002-01-22

    申请号:US09370769

    申请日:1999-08-09

    CPC classification number: H01J47/02 H01J47/008

    Abstract: A detection apparatus for detecting an electron cloud includes a resistive anode layer with a detection plane upon which the electron cloud is incident. The resistive layer is capacitively coupled to a readout structure having a conductive grid parallel to the detection plane. Charge on the resistive layer induces a charge on the readout structure, and currents in the grid. The location of the induced charge on the readout structure corresponds to the location on the detection plane at which the electron cloud is incident. Typically, the detection apparatus is part of a detector, such as a gas avalanche detector, in which the electron cloud is formed by conversion of a high-energy photon or particle to electrons that undergo avalanche multiplication. The spacing between the anode layer and the readout structure is selected so that the width of the charge distribution matches the pitch between conductive segments of the grid. The resistivity of the anode layer is selected to be low enough to support the highest bandwidth of the readout electronics, but high enough to allow penetration of the charge through the anode layer to the readout structure.

    Abstract translation: 用于检测电子云的检测装置包括具有电子云入射的检测面的电阻性阳极层。 电阻层电容耦合到具有平行于检测平面的导电栅格的读出结构。 电阻层上的电荷在读出结构上引起电荷,并在电网中产生电流。 读出结构上感应电荷的位置对应于电子云入射的检测平面上的位置。 通常,检测装置是诸如气体雪崩检测器的检测器的一部分,其中通过将高能光子或粒子转换成经历雪崩倍增的电子而形成电子云。 选择阳极层和读出结构之间的间隔,使得电荷分布的宽度与栅格的导电段之间的间距相匹配。 选择阳极层的电阻率足够低以支持读出电子器件的最高带宽,但足够高以允许电荷穿过阳极层到达读出结构。

    High efficiency polycrystalline phosphors and method of making same
    6.
    发明授权
    High efficiency polycrystalline phosphors and method of making same 有权
    高效多晶磷光体及其制造方法

    公开(公告)号:US06254806B1

    公开(公告)日:2001-07-03

    申请号:US09313565

    申请日:1999-05-14

    CPC classification number: C09K11/886 C09K11/7701 C09K11/7704

    Abstract: A phosphor is provided that has a host material that is doped with a dopant having the chemical structure XCl3, where X is a rare earth element or combination of elements. A free oxygen contributor is also added to provide the free oxygen necessary to activate the rare earth dopant. The processing of the phosphor includes the heating of the phosphor in an over pressure environment of zinc, cadmium or tellurium. The heating is done in a two-temperature zone enclosed environment, so that impurities in the phosphor powder are condensed out on the cooler surface. Altematively, the dopant may be a material that does not include a rare earth element, such as copper, tellurium, cadmium, silver, potassium, manganese, magnesium, calcium, strontium, and barium.

    Abstract translation: 提供了具有掺杂有具有化学结构XCl 3的掺杂剂的主体材料的荧光体,其中X是稀土元素或元素组合。 还添加了一种自由的氧气供给器以提供激活稀土掺杂剂所需的游离氧。 荧光体的处理包括在锌,镉或碲的过压环境中加热荧光体。 加热在双温区封闭的环境中完成,使得荧光体粉末中的杂质在冷却器表面冷凝。 或者,掺杂剂可以是不包括稀土元素如铜,碲,镉,银,钾,锰,镁,钙,锶和钡的材料。

    Multiply-sampled CMOS sensor for X-ray diffraction measurements with corrections for non-ideal sensor behavior
    7.
    发明授权
    Multiply-sampled CMOS sensor for X-ray diffraction measurements with corrections for non-ideal sensor behavior 有权
    用于X射线衍射测量的乘法采样CMOS传感器,用于非理想传感器行为的校正

    公开(公告)号:US08680473B2

    公开(公告)日:2014-03-25

    申请号:US13285089

    申请日:2011-10-31

    CPC classification number: G01N23/207

    Abstract: Readout noise for each pixel in a CMOS Active Pixel Sensor is reduced by a five step process in which the pixel charge data from the sensor is non-destructively sampled at a plurality of times during a sensor frame time period and corrected for gain variation and nonlinearity. Then fixed pattern and dark current noise is estimated and subtracted from the corrected pixel charge data. Next, reset noise is estimated and subtracted from the pixel charge data. In step four, a model function of charge versus time is fit to the corrected pixel charge data samples. Finally, the fitted model function is evaluated at frame boundary times.

    Abstract translation: 在CMOS有源像素传感器中的每个像素的读出噪声通过五步骤处理来减少,其中来自传感器的像素电荷数据在传感器帧时间周期内被多次采样,并且被校正为增益变化和非线性 。 然后估计固定图案和暗电流噪声,并从校正的像素电荷数据中减去。 接下来,估计复位噪声并从像素电荷数据中减去复位噪声。 在步骤四中,电荷对时间的模型函数适合于校正的像素电荷数据样本。 最后,在帧边界时间评估拟合模型函数。

    Handheld two-dimensional X-ray diffractometer
    8.
    发明授权
    Handheld two-dimensional X-ray diffractometer 有权
    手持二维X射线衍射仪

    公开(公告)号:US07646847B2

    公开(公告)日:2010-01-12

    申请号:US12113505

    申请日:2008-05-01

    CPC classification number: G01N23/207

    Abstract: A handheld X-ray diffractometer comprises a miniaturized X-ray source and multiple area detectors to allow the diffractometer to obtain two-dimensional X-ray diffraction images in a large diffraction space without rotating the sample. The source and detectors are located inside of a radio opaque enclosure that protects the operator during use. The handheld diffractometer also comprises a sample monitoring and alignment system that allows an operator to observe the measuring area and to align the diffractometer to the sample from outside of the housing. A specially designed mouthpiece, which mates the diffractometer to the sample area, prevents x-ray leakage and triggers off the data collection. The detectors can be positioned to perform measurements necessary to calculate a mechanical stress in the sample. Linear detectors may also be used in place of the area detectors.

    Abstract translation: 手持X射线衍射仪包括小型化X射线源和多个区域检测器,以允许衍射仪在大的衍射空间中获得二维X射线衍射图像,而不旋转样品。 源和检测器位于无线电不透明外壳内部,可在使用过程中保护操作者。 手持式衍射仪还包括样品监测和校准系统,其允许操作者观察测量区域并将衍射仪与壳体外部对准样品。 将衍射仪与样品区域配合的专门设计的接口管可防止X射线泄漏并触发数据采集。 可以将检测器定位成执行用于计算样品中的机械应力所需的测量。 也可以使用线性检测器来代替区域检测器。

    Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode
    9.
    发明授权
    Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode 有权
    用于校正在卷帘快门模式下从X射线检测器读出的X射线数据中的定时偏移的方法

    公开(公告)号:US08903043B2

    公开(公告)日:2014-12-02

    申请号:US13279393

    申请日:2011-10-24

    CPC classification number: G01N23/207 G01N23/20016 G01T1/247 G06F17/17

    Abstract: In an X-ray detector operating in a rolling shutter read out mode, by precisely synchronizing sample rotation with the detector readout, the effects of timing skew on the image intensities and angular positions caused by the rolling shutter read out can be compensated by interpolation or calculation, thus allowing the data to be accurately integrated with conventional software. In one embodiment, the reflection intensities are interpolated with respect to time to recreate data that is synchronized to a predetermined time. This interpolated data can then be processed by any conventional integration routine to generate a 3D model of the sample. In another embodiment a 3D integration routine is specially adapted to allow the time-skewed data to be processed directly and generate a 3D model of the sample.

    Abstract translation: 在通过滚动快门读出模式操作的X射线检测器中,通过将检测器读数精确地同步样本旋转,可以通过插值或补偿来补偿由滚动快门读出导致的图像强度和角度位置的定时偏移的影响 计算,从而允许数据与传统软件精确集成。 在一个实施例中,反射强度相对于时间被内插以重新创建与预定时间同步的数据。 然后可以通过任何常规的积分程序来处理该内插数据,以生成样本的3D模型。 在另一个实施例中,3D集成程序被特别地适于允许直接处理时变数据并且生成样本的3D模型。

    MULTIPLY-SAMPLED CMOS SENSOR FOR X-RAY DIFFRACTION MEASUREMENTS WITH CORRECTIONS FOR NON-IDEAL SENSOR BEHAVIOR
    10.
    发明申请
    MULTIPLY-SAMPLED CMOS SENSOR FOR X-RAY DIFFRACTION MEASUREMENTS WITH CORRECTIONS FOR NON-IDEAL SENSOR BEHAVIOR 有权
    用于非理想传感器行为的X射线衍射测量的多重采样CMOS传感器

    公开(公告)号:US20130108021A1

    公开(公告)日:2013-05-02

    申请号:US13285089

    申请日:2011-10-31

    CPC classification number: G01N23/207

    Abstract: Readout noise for each pixel in a CMOS Active Pixel Sensor is reduced by a five step process in which the pixel charge data from the sensor is non-destructively sampled at a plurality of times during a sensor frame time period and corrected for gain variation and nonlinearity. Then fixed pattern and dark current noise is estimated and subtracted from the corrected pixel charge data. Next, reset noise is estimated and subtracted from the pixel charge data. In step four, a model function of charge versus time is fit to the corrected pixel charge data samples. Finally, the fitted model function is evaluated at frame boundary times.

    Abstract translation: 在CMOS有源像素传感器中的每个像素的读出噪声通过五步骤处理来减少,其中来自传感器的像素电荷数据在传感器帧时间周期内被多次采样,并且被校正为增益变化和非线性 。 然后估计固定图案和暗电流噪声,并从校正的像素电荷数据中减去。 接下来,估计复位噪声并从像素电荷数据中减去复位噪声。 在步骤四中,电荷对时间的模型函数适合于校正的像素电荷数据样本。 最后,在帧边界时间评估拟合模型函数。

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