摘要:
Power line surge protection device comprising AC power line overvoltage protection, telephone voice line overvoltage and overcurrent protection, high speed data line overvoltage and overcurrent protection, coaxial transmission line overvoltage protection, and a ground-sensing indicator, all tied to a common ground.
摘要:
An input gate protection circuit has a pass transistor having a source coupled to an input signal. A first voltage range control circuit is coupled to a gate of the pass transistor. A second voltage range is control circuit coupled to the gate of the pass transistor.
摘要:
An integrated overvoltage and overcurrent circuit protection device for use in telecommunication circuits. The integrated circuit protection device combines a overcurrent device such as a fuse and a overvoltage protection device such as a thyristor to respectively protect against overcurrent conditions and transient overvoltages. Integration of multiple devices in a common package ensures proper coordination and matching of the components, reduces the final product cost and reduces the physical space required on a telecommunications circuit for overvoltage and overcurrent circuit protection.
摘要:
A protection system that protects a booster circuit used to boost operating signals in a memory device. The system includes a protection circuit for protecting an output transistor of the booster circuit. The protection circuit includes a transfer gate coupled to the output transistor and coupled to receive a first boost signal and a second boost signal. The transfer gate opens and closes in response to the second boost signal. When the transfer gate is closed, the first boost signal is uncoupled from the output transistor, and when the transfer gate is opened, the first boost signal is coupled to the output transistor. The circuit also includes a protection transistor coupled to the second boost signal, a supply voltage and the output transistor, where the protection transistor couples the supply voltage to the output transistor when the transfer gate is closed.
摘要:
An integrated circuit (10) having at least one programmable fuse (F1) and ESD circuitry (MN3, MN1) preventing the fuse (F1) from being unintentionally blown when a voltage transient exists on a main voltage potential (Vmain). The ESD circuitry preferably comprises of MOSFET switches which are coupled to turn on quicker than a main fuse programming switch (MNmain) due to the voltage transient, thereby insuring that the main switch remains off during the voltage transient to prevent the unintentional blowing of the fuse F1. The circuit is well suited for programmable logic device (PLDs), allowing for read voltages as low as 6 volts, and allowing for programming voltages as high as 40 volts.
摘要:
An ESD protection circuit (39) coupled to each of a plurality of I/O circuits (30, 32, 36) of an integrated circuit (31) is disclosed. The ESD protection circuit includes a MOSFET transistor (40) to provide primary ESD protection on occurrence of an ESD event. In one embodiment, the control electrode of the MOSFET transistor is coupled to a first buffer circuit (42). Integrated circuit (31) includes a remote trigger circuit (37) coupled to the ESD protection circuits via a trigger bus (47). The individual ESD protection circuits operate in parallel to provide ESD protection to the I/O circuits (30, 32, and 36) upon occurrence of an ESD event.
摘要:
A multi-stage polydiode-based electrostatic discharge (ESD) protection circuit is provided for use in an IC device to protect the internal circuit of the IC device against ESD. In use, the multi-stage polydiode-based ESD protection circuit of the invention is provided between a bonding pad and the internal circuit of the IC device for the purpose of protecting the internal circuit of the IC device against any ESD voltage applied to the bonding pad. The multi-stage polydiode-based ESD protection circuit of the invention comprises: a plurality of stages of polydiode circuits; a plurality of resistors, each being connected between two neighboring stages of the polydiode circuits; and a power protection circuit connected between a high system voltage line and a low system voltage line. When ESD occurs, the resulted ESD current will be diverted by the polydiode circuits to the high system voltage line, and subsequently diverted by the power protection circuit to the low system voltage line, thus preventing the ESD current from entering into the internal circuit of the IC device. Moreover, with silicon dioxide layer serving as isolation between the polydiode structure and the underlying substrate, the ESD current is also presented from flowing to the substrate. The multi-stage polydiode-based ESD protection circuit thus can help provide adequate ESD protection against various types of ESD, including HBM (Human-Body Model), MM (Machine Model), and CDM (Charge-Device Model).
摘要:
An in its various embodiments is a method and apparatus for electrostatic discharge protection. In one aspect of the present invention, an integrated circuit device capable of providing electrostatic discharge protection for use on a printed circuit board containing a possible source of electrostatic discharge and operational circuitry is provided. The integrated circuit device includes an input coupled to the possible source of electrostatic discharge, an output coupled to the operational circuitry on the printed circuit board, a capacitance structure between the input and the output, and a switch in series with the capacitance structure. The integrated circuit also provides, a method for protecting a printed circuit board from electrostatic discharge by switching the discharge to a capacitance structure for subsequent dissipation into the printed circuit board.
摘要:
An electrostatic discharge (ESD) protection technique protects a semiconductor device against electrostatic discharge events. The technique uses an ESD protection circuit that includes a two cascode-connected clamps between the protected pad and a reference voltage conductor and an level-shifting inverter amplifier for driving the clamps. A control signal used to control the amplifiers is derived from a nominal-voltage pad, but the voltage used to activate the transistor clamps is derived from the protected pad to achieve the greatest voltage drive on the cascoded clamps during ESD.
摘要:
Protection circuitry (10) for protecting an integrated circuit from an ESD pulse is provided. The protection circuitry (10) includes discharge circuitry (14) on a substrate (11) that discharges an ESD pulse to the integrated circuit to ground (18). The protection circuitry (10) also includes a substrate bias generator (25) that uses a portion of the ESD pulse's energy to bias the substrate (11) of the discharge circuitry (14).