POLISHING PAD WITH SECONDARY WINDOW SEAL
    14.
    发明申请
    POLISHING PAD WITH SECONDARY WINDOW SEAL 审中-公开
    抛光垫与二次窗口密封

    公开(公告)号:WO2014151791A1

    公开(公告)日:2014-09-25

    申请号:PCT/US2014/026455

    申请日:2014-03-13

    CPC classification number: B24B37/205 B24B37/22

    Abstract: A polishing article has a polishing surface and an aperture, the aperture including a first section and a second section. The polishing article includes a projection extending inwardly into the aperture. The polishing article includes a lower portion on a side of the first surface farther from the polishing surface. A window has a first portion positioned in the first section of the aperture and a second portion extending into the second section of the aperture. The window has a second surface substantially parallel to the polishing surface. A first adhesive adheres the first surface of the projection to the second surface of the window to secure the window to the projection and a second adhesive of different material composition than the first adhesive. The second adhesive is positioned laterally between the second portion of the window and the lower portion of the polishing article.

    Abstract translation: 抛光制品具有抛光表面和孔,该孔包括第一部分和第二部分。 抛光制品包括向内延伸到孔中的突起。 抛光制品包括在离研磨表面更远的第一表面的一侧的下部。 窗口具有位于孔的第一部分中的第一部分和延伸到孔的第二部分中的第二部分。 窗口具有基本上平行于抛光表面的第二表面。 第一粘合剂将突起的第一表面粘附到窗口的第二表面以将窗口固定到突起,并且将第二粘合剂与不同于第一粘合剂的材料组合物粘合。 第二粘合剂横向定位在窗的第二部分和抛光制品的下部之间。

    HIGH SAMPLING RATE SENSOR BUFFERING IN SEMICONDUCTOR PROCESSING SYSTEMS
    15.
    发明申请
    HIGH SAMPLING RATE SENSOR BUFFERING IN SEMICONDUCTOR PROCESSING SYSTEMS 审中-公开
    高速采样速率传感器在半导体处理系统中的缓冲

    公开(公告)号:WO2013188213A1

    公开(公告)日:2013-12-19

    申请号:PCT/US2013/044538

    申请日:2013-06-06

    Inventor: YAVELBERG, Simon

    CPC classification number: G06F12/00 G01D9/005 H01L21/67253

    Abstract: Embodiments of the invention are directed toward systems and/or methods that buffer data from various sensors with a high sampling rate in a semiconductor processing system. Such sampling can provide better data about the processing for diagnosing the conditions leading up to a processing fault in the system.

    Abstract translation: 本发明的实施例涉及在半导体处理系统中缓冲具有高采样率的各种传感器的数据的系统和/或方法。 这种采样可以提供关于用于诊断导致系统中的处理故障的条件的处理的更好的数据。

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