中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

156 records (took 0.027 seconds)

    ELECTROCHEMILUMINESCENT ENZYME BIOSENSORS
    81.
    发明申请
    ELECTROCHEMILUMINESCENT ENZYME BIOSENSORS 审中-公开
    电致发光生物传感器

    公开(公告)号：WO1996039534A1

    公开(公告)日：1996-12-12

    申请号：PCT/US1996009869

    申请日：1996-06-06

    Applicant: IGEN, INC.

    Inventor： IGEN, INC. ,  MARTIN, Mark, T.

    IPC: C12Q01/32

    CPC classification number: G01N33/535 ,  C12Q1/005 ,  G01N21/66 ,  G01N21/76

    Abstract: Electrochemiluminescent enzymes, their preparation and use as biosensors are disclosed. Specifically, two appendages are covalently attached to a desired dehydrogenase enzyme; (1) a nicotinamide adenine cofactor or analog thereof, and (2) a luminescent ruthenium complex. For example, glucose concentration is the following way. A doubly-modified glucose dehydrogenase could oxidize glucose with concomitant reduction of the attached NAD to NADH. Because NADH, but not NAD , is able to interact with surface ruthenium to promote ECL, only enzyme molecules that have reacted with glucose will emit light from their ruthenium label in an ECL instrument. The relative close proximity of NADH and ruthenium on the enzyme surface enhances light emission as compared to the same concentrations in free solution. When NADH reduces ruthenium, it returns to become NAD , permitting multiple cycles of ECL light emission from a single enzyme molecule. Such biosensors can be used in solution or bound to a solid surface. Assays employing the biosensor molecules can be performed on an IGEN Origen3 Analyzer.

    Abstract translation: 公开了电化学发光酶，其制备和用作生物传感器。 具体地，两个附属物共价连接到所需的脱氢酶; （1）烟酰胺腺嘌呤辅因子或其类似物，和（2）发光钌络合物。 例如，葡萄糖浓度如下。 双重修饰的葡萄糖脱氢酶可以使附着的NAD +还原成NADH而氧化葡萄糖。 因为NADH而不是NAD +能够与表面钌相互作用以促进ECL，所以只有与葡萄糖反应的酶分子才会在ECL仪器中从钌标记物中发出光。 与游离溶液中相同的浓度相比，NADH和钌在酶表面上的相对接近增强了光发射。 当NADH还原钌时，它返回成为NAD +，允许来自单个酶分子的ECL发光的多个循环。 这种生物传感器可以在溶液中使用或与固体表面结合。 使用生物传感器分子的测定可以在IGEN Origen3分析仪上进行。

    APPARATUS AND METHOD FOR CONDUCTING MEASUREMENTS OF ELECTROLUMINESCENT PHENOMENA
    82.
    发明申请
    APPARATUS AND METHOD FOR CONDUCTING MEASUREMENTS OF ELECTROLUMINESCENT PHENOMENA 审中-公开
    用于导电电极测量的装置和方法

    公开(公告)号：WO1990005411A1

    公开(公告)日：1990-05-17

    申请号：PCT/US1989004854

    申请日：1989-10-31

    Applicant: IGEN, INC.

    Inventor： IGEN, INC. ,  ZOSKI, Glenn ,  WOODWARD, Steve

    IPC: H03K04/02

    CPC classification number: G01N21/66 ,  H03K4/026

    Abstract: An apparatus and method for conducting measurements of electrochemiluminescent (ECL) phenomena includes a cell unit (14) having an electrode configuration for inducing the emission of ECL light by the application of a selected voltage waveform to a sample fluid including an ECL moiety. The sample fluid is transported to and from the cell unit (14) by a flow-through pump/tubing system. A photomultiplier tube (20) detects the intensity of light emitted by the sample fluid during the ECL measurement process. A computer control unit (12) both analyzes the detected data and provides digital control signals to the cell unit to generate effective voltage waveforms. The digital control signals are supplied to a novel pulse width modulated digital to analog converter which outputs a ramp voltage waveform having the desired slope.

    MEASUREMENT PARAMETERS FOR QC METROLOGY OF SYNTHETICALLY GENERATED DIAMOND WITH NV CENTERS
    83.
    发明申请
    MEASUREMENT PARAMETERS FOR QC METROLOGY OF SYNTHETICALLY GENERATED DIAMOND WITH NV CENTERS 审中-公开
    NV中心合成钻石QC测量参数

    公开(公告)号：WO2017127080A1

    公开(公告)日：2017-07-27

    申请号：PCT/US2016/014290

    申请日：2016-01-21

    Applicant: LOCKHEED MARTIN CORPORATION

    Inventor： CAMMERATA, Jeff D.

    IPC: C30B29/04 ,  G01N21/64

    CPC classification number: G01N21/63 ,  G01N21/6489 ,  G01N21/66 ,  G01N2021/646

    Abstract: A system measures the quantum energy levels of a diamond nitrogen vacancy (DNV) material to provide information regarding the quality of the material. The measurements may provide information regarding the degree of strain in the crystal lattice of the material, the concentration of crystal defect in the material, the concentration of nitrogen vacancy (NV) centers in the material, or the concentration of impurities in the material. The system may be employed to perform quality control checks on the properties of the DNV material quickly and non-destructively.

    Abstract translation: 系统测量金刚石氮空位（DNV）材料的量子能级以提供关于材料质量的信息。 测量可以提供关于材料晶格中的应变程度，材料中晶体缺陷的浓度，材料中氮空位（NV）中心的浓度或材料中杂质浓度的信息。 该系统可以用于快速和非破坏性地对DNV材料的性质进行质量控制检查。

    蛍光体層付光半導体素子の検査方法
    84.
    发明申请
    蛍光体層付光半導体素子の検査方法 审中-公开
    用荧光粉层检查光学半导体元件的方法

    公开(公告)号：WO2017110409A1

    公开(公告)日：2017-06-29

    申请号：PCT/JP2016/085779

    申请日：2016-12-01

    Applicant: 日東電工株式会社

    Inventor： 近藤　隆 ,  吉田　直子

    IPC: G01N21/66 ,  G01N21/00 ,  G01R31/26 ,  H01L33/50

    CPC classification number: G01N21/00 ,  G01N21/66 ,  G01R31/26 ,  H01L33/50

    Abstract: 蛍光体層付光半導体素子の検査方法は、光半導体素子および蛍光体層を備える蛍光体層付光半導体素子を検査する方法である。蛍光体層付光半導体素子が面方向において互いに間隔を隔てて複数配置されている素子集合体において、一の蛍光体層付光半導体素子に検査プローブを接触させて、一の蛍光体層付光半導体素子を発光させる発光工程、および、一の蛍光体層付光半導体素子からの光を検知する検知工程を備える。発光工程において、一の蛍光体層付光半導体素子と、一の蛍光体層付光半導体素子と面方向に隣接配置される他の蛍光体層付光半導体素子との間に、隔壁が配置され、隔壁の光透過率が２０％以下であり、隔壁の面方向と直交する直交方向長さが、一の蛍光体層付光半導体素子の直交方向長さよりも長い。

    Abstract translation: 用于具有荧光体层的光学半导体元件的检查方法是用于检查具有设置有光学半导体元件和荧光体层的荧光体层的光学半导体元件的方法。 在具有荧光体层的多个光半导体元件在面方向上隔开间隔地排列的元件集合体中，使检查用探头与具有荧光体层的一个光半导体元件接触，并且使荧光体层 发光步骤，使半导体元件发光;以及检测步骤，检测来自具有荧光体层的一个发光半导体元件的光。 在发光步骤中，在具有荧光体层的一个发光半导体元件与具有荧光体层的另一个发光半导体元件之间设置隔壁，其中荧光体层在面向上与具有荧光体层的一个发光半导体元件相邻地布置 ，隔壁的透光率为20％以下，与隔壁的平面方向正交的正交方向长度比一个带有荧光体层的光半导体元件的正交方向长度长。

    THIN-LAYER SPECTROELECTROCHEMISTRY CELL AND METHODS FOR USE IN SUBTERRANEAN FORMATION OPERATIONS
    85.
    发明申请
    THIN-LAYER SPECTROELECTROCHEMISTRY CELL AND METHODS FOR USE IN SUBTERRANEAN FORMATION OPERATIONS 审中-公开
    薄层光谱电化学细胞及其在下层形成作用中的应用

    公开(公告)号：WO2016133526A1

    公开(公告)日：2016-08-25

    申请号：PCT/US2015/016750

    申请日：2015-02-20

    Applicant: HALLIBURTON ENERGY SERVICES, INC.

    Inventor： SHEN, Jing C. ,  CHEN, Dingding ,  PELLETIER, Michael T.

    IPC: G01N21/17 ,  G01N21/66 ,  G01N27/26 ,  G01N27/30

    CPC classification number: G01V11/002 ,  E21B49/08 ,  G01N21/66 ,  G01N21/78 ,  G01N2201/061

    Abstract: Apparatus, methods, and systems related to a thin-layer spectroelectrochemistry cell; electrically coupling a second end of a working electrical wire lead, a second end of a counter electrical wire lead, and a second end of a reference electrical wire lead to a potentiostat; introducing a conductive fluid into a cell body in the spectroelectrochemistry cell; introducing a detection species into the cell body; introducing a sample into the cell body; applying a voltage potential across the transparent sample window to drive an electrochemical reaction between the detection species and the sample in the transparent sample window fluid; transmitting electromagnetic radiation into an optical path through the transparent sample window, thereby optically interacting the electromagnetic radiation with the transparent sample window fluid to generate modified electromagnetic radiation; receiving the modified electromagnetic radiation with a detector; and generating an output signal corresponding to a characteristic of the sample.

    Abstract translation: 与薄层光电化学电池相关的装置，方法和系统; 电连接工作电线引线的第二端，反向电线引线的第二端和引导到恒电位仪的参考电线的第二端; 将导电流体引入分子电化学电池中的细胞体内; 将检测物质引入细胞体内; 将样品引入细胞体; 在透明样品窗口上施加电压电位以驱动检测物质和透明样品窗口液体中的样品之间的电化学反应; 将电磁辐射传输到通过透明样品窗的光路中，从而将电磁辐射与透明样品窗流体光学相互作用，以产生修改的电磁辐射; 用检测器接收修改的电磁辐射; 并产生对应于样本特性的输出信号。

    METHOD AND APPARATUS FOR NON-CONTACT MEASUREMENT OF INTERNAL QUANTUM EFFICIENCY IN LIGHT EMITTING DIODE STRUCTURES
    90.
    发明申请
    METHOD AND APPARATUS FOR NON-CONTACT MEASUREMENT OF INTERNAL QUANTUM EFFICIENCY IN LIGHT EMITTING DIODE STRUCTURES 审中-公开
    用于在发光二极管结构中内部量子效率的非接触测量的方法和装置

    公开(公告)号：WO2015038992A1

    公开(公告)日：2015-03-19

    申请号：PCT/US2014/055537

    申请日：2014-09-13

    Applicant: KLA-TENCOR CORPORATION

    Inventor： FAIFER, Vladimir N.

    IPC: G01R31/26

    CPC classification number: G01N21/66 ,  G01N33/00 ,  G01N2033/0095 ,  G01R31/2635

    Abstract: Non-contact measurement of one or more electrical response characteristics of a LED structure includes illuminating an illumination area of a surface of a light emitting diode structure with one or more light pulses, measuring a transient of a luminescence signal from a luminescence area within the illumination area of the light emitting diode structure with a luminescence sensor, determining a first luminescence intensity at a first time of the measured transient of the luminescence signal from the light emitting diode structure, determining a second luminescence intensity at a second time different from the first time of the measured transient of the luminescence signal from the light emitting diode structure and determining an intensity of the electroluminescence component of the luminescence signal from the light emitting diode structure based on the first luminescence signal and the second luminescence signal.

    Abstract translation: LED结构的一个或多个电响应特性的非接触测量包括用一个或多个光脉冲照射发光二极管结构的表面的照明区域，测量来自照明内的发光区域的发光信号的瞬变 具有发光传感器的发光二极管结构的面积，确定在来自发光二极管结构的发光信号的测量瞬态的第一时间的第一发光强度，在与第一次不同的第二时间确定第二发光强度 测量来自发光二极管结构的发光信号的瞬态，并且基于第一发光信号和第二发光信号确定来自发光二极管结构的发光信号的电致发光分量的强度。

Patent Agency Ranking