Abstract:
A technique for detecting tampering attempts directed at a memory device includes setting each of a plurality of detection memory cells to an initial predetermined state, where corresponding portions of the plurality of detection memory cells are included in each of the arrays of data storage memory cells on the memory device. A plurality of corresponding reference bits on the memory device permanently store information representative of the initial predetermined state of each of the detection memory elements.
Abstract:
In some examples, a memory device is configured to receive a precharge command and an activate command. The memory device performs a first series of events related to the precharge command in response to receiving the precharge command and a second series of events related to the activate command in response to receiving the activate command. The memory device delays the start of the second series of events until the first series of events completes.
Abstract:
Circuitry and a method provide self-referenced sensing of a resistive memory cell by using its characteristic of resistance variation with applied voltage in one state versus a relatively constant resistance regardless of the applied voltage in its opposite state. Based on an initial bias state with equalized resistances, a current comparison at a second bias state between a mock bit line and a bit line is used to determine the state of the memory cell, since a significant difference in current implies that the memory cell state has a significant voltage coefficient of resistance. An offset current applied to the mock bit line optionally may be used to provide symmetry and greater sensing margin.
Abstract:
A dual tunnel barrier magnetic element has a free magnetic layer positioned between first and second tunnel barriers and an electrode over the second tunnel barrier. A two step etch process allows for forming an encapsulation material on a side wall of the electrode and the second tunnel barrier subsequent to the first etch for preventing damage to the first tunnel barrier when performing the second etch to remove a portion of the free layer.
Abstract:
A probe card and method are provided for testing magnetic sensors at the wafer level. The probe card has one or more probe tips having a first pair of solenoid coils in parallel configuration on first opposed sides of each probe tip to supply a magnetic field in a first (X) direction, a second pair of solenoid coils in parallel configuration on second opposed sides of each probe tip to supply a magnetic field in a second (Y) direction orthogonal to the first direction, and an optional third solenoid coil enclosing or inscribing the first and second pair to supply a magnetic field in a third direction (Z) orthogonal to both the first and second directions. The first pair, second pair, and third coil are each symmetrical with a point on the probe tip array, the point being aligned with and positioned close to a magnetic sensor during test.
Abstract:
A magnetic field sensing device for determining the strength of a magnetic field, includes four magnetic tunnel junction elements or element arrays (100) configured as a bridge (200). A current source is coupled to a current line (116) disposed near each of the four magnetic tunnel junction elements (100) for selectively supplying temporally spaced first and second currents. Sampling circuitry (412, 414) coupled to the current source samples the bridge output during the first and second currents and determines the value of the magnetic field from the difference of the first and second values.
Abstract:
A nearly balanced synthetic antiferromagnetic (SAF) structure that can be advantageously used in magnetoelectronic devices (5) such as a magnetoresistive memory cell includes two ferromagnetic layers (45,55) and an antiferromagnetic coupling layer (65) separating the two ferromagnetic layers. The SAF free layer (15) has weakly coupled regions formed in the antiferromagnetic coupling layer by a treatment such as annealing, layering of the antiferromagnetic coupling layer, or forming the antiferromagnetic coupling layer over a roughened surface of a ferromagnetic layer. The weakly coupled regions lower the flop field of the SAF free layer in comparison to untreated SAF free layers. The SAF flop is used during the write operation of such a structure and its reduction results in lower power consumption during write operations and correspondingly increased device performance.
Abstract:
According to the most preferred embodiments of the present invention, at least one of the two plates (710, 720) of a capacitor (700) is formed in at least two different layers of an integrated circuit. The methods of the present invention uses air bridges (715) or some other dielectric medium to isolate certain portions of the two capacitive plates of a capacitor where at least a portion of one of the capacitive plates passes over at least a portion of the other capacitive plate. The line widths, line separation and number of levels used in the topology of the capacitor will determine the overall capacitance value of a given structure.
Abstract:
An exemplary method for substantially non-chemically-reactive separation of nanomorphic carbon species (140) comprises inter alia the steps of suspending a nanomorphic carbon sample (100) in an aqueous surfactant suspension (110), adding nanoparticles to the sample suspension (115), sonicating the sample (120), centrifugating the sample suspension (125) and decanting off the resulting supernatant (130). Disclosed features and specifications may be variously controlled, adapted or otherwise optionally modified to improve carbon nanospecies purification. An exemplary embodiment of the present invention representatively provides for non-oxidative cleaning of carbon nanotubes via at least partial removal of amorphous carbon contaminants.
Abstract:
An exemplary device and method for microfluidic transport is disclosed as providing inter alia a passive check valve (100), a fluid inlet channel (210), a fluid outlet channel (220) and a pumping cavity (240). The fluid inlet channel (210) is generally configured to flow a fluid through the check valve (100). The check valve (100) generally provides substantially passive means for preventing or otherwise decreasing the incidence of purged outlet fluid re-entering either the pumping cavity (240) or the fluid inlet channel (210). Accordingly, the reduction of backflow generally tends to enhance overall pumping performance and efficiency. Disclosed features and specifications may be variously controlled, adapted or otherwise optionally modified to improve micropump operation in any microfluidic application. Exemplary embodiments of the present invention representatively provide for substantially self-priming micropumps that may be readily integrated with, for example, existing portable ceramic technologies for the improvement of device package form factors, weights and other manufacturing and/or device performance metrics.