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    SAMPLE HANDLING DEVICE FOR AND METHODS OF HANDLING A SAMPLE
    3.
    发明申请
    SAMPLE HANDLING DEVICE FOR AND METHODS OF HANDLING A SAMPLE 审中-公开
    样品处理装置和处理样品的方法

    公开(公告)号：WO2008135565A2

    公开(公告)日：2008-11-13

    申请号：PCT/EP2008/055510

    申请日：2008-05-05

    Applicant: QUANTIFOIL Instruments GmbH ,  HOYER, Olaf ,  DITTMANN, Leander ,  GESSNER, Giso ,  VESTER, Andreas

    Inventor： HOYER, Olaf ,  DITTMANN, Leander ,  GESSNER, Giso ,  VESTER, Andreas

    IPC: B06B1/16 ,  B01F11/00

    CPC classification number: B06B1/16 ,  B01F11/0014

    Abstract: A sample handling device (100) for handling a sample, the sample handling device (100) comprising a drive shaft (101) being drivable by a drive unit (102), a base plate (103) mounted to follow a motion of the drive shaft (101) when being driven by the drive unit (102), wherein the base plate (103) is configured to receive a sample carrier block (104) mountable to follow a motion of the base plate (103), and a compensation weight (105, 106) mounted asymmetrically on the drive shaft (101) in a manner to at least partially compensate an unbalanced mass of the sample handling device (100) during the motion.

    Abstract translation: 一种用于处理样品的样品处理装置（100），所述样品处理装置（100）包括可由驱动单元（102）驱动的驱动轴（101），安装成跟随驱动器的运动的基板（103） 轴（101）由驱动单元（102）驱动时，其中基板（103）构造成接收可安装成跟随基板（103）的运动的样品载体块（104），以及补偿重量 （105,106），其以在运动期间至少部分地补偿样品处理装置（100）的不平衡质量的方式不对称地安装在驱动轴（101）上。

    A METHOD OF PRODUCING AN ELECTRICALLY CONDUCTING VIA IN A SUBSTRATE
    4.
    发明申请
    A METHOD OF PRODUCING AN ELECTRICALLY CONDUCTING VIA IN A SUBSTRATE 审中-公开
    通过基板生产电导体的方法

    公开(公告)号：WO2011020563A1

    公开(公告)日：2011-02-24

    申请号：PCT/EP2010/004786

    申请日：2010-08-04

    Applicant: PICODRILL SA ,  DITTMANN, Leander

    Inventor： DITTMANN, Leander

    IPC: H05K3/10 ,  H05K3/40 ,  H05K3/00

    CPC classification number: B26F1/28 ,  H05K3/0017 ,  H05K3/0032 ,  H05K3/0035 ,  H05K3/105 ,  H05K3/4038 ,  H05K2201/0323 ,  H05K2203/105 ,  H05K2203/1115 ,  H05K2203/1136 ,  Y10T29/49165

    Abstract: The present invention relates to a method of producing an electrically- conducting via in a substrate and to a substrate produced thereby. The method comprises the steps : a) providing a substrate made of at least one electrically insulating material (1), b) placing said substrate between two electrodes (3, 3' ), said two electrodes being connected to a user-controlled voltage source (4), c) appling a voltage to said substrate, d) causing a dielectric breakdown and energy dissipation between said two electrodes through said substrate by locally or globally increasing the electrical conductivity of said substrate, wherein, in step d), a modification of said at least one electrically insulating material into an electrically conducting material occurs, thereby generating an electrically conducting via (6). In particular, in one embodiment, the present invention relates to a substrate, such as a printed circuit board having one or several metal-free electrically conducting vias.

    Abstract translation: 本发明涉及一种在衬底中制造导电通孔的方法及其制造方法。 该方法包括以下步骤：a）提供由至少一个电绝缘材料（1）制成的衬底，b）将所述衬底放置在两个电极（3,3'）之间，所述两个电极连接到用户控制的电压源 （4），c）向所述衬底施加电压，d）通过局部地或全面地增加所述衬底的电导率，在所述两个电极之间通过所述衬底造成电介质击穿和能量耗散，其中在步骤d）中， 所述至少一个电绝缘材料变成导电材料，从而产生导电通孔（6）。 特别地，在一个实施例中，本发明涉及一种基板，例如具有一个或多个无金属导电通孔的印刷电路板。

    METHODS AND DEVICES FOR SURFACE MODIFICATION OF MICRO-STRUCTURED SUBSTRATES
    5.
    发明申请
    METHODS AND DEVICES FOR SURFACE MODIFICATION OF MICRO-STRUCTURED SUBSTRATES 审中-公开
    微结构基材表面改性的方法和装置

    公开(公告)号：WO2007054220A1

    公开(公告)日：2007-05-18

    申请号：PCT/EP2006/010425

    申请日：2006-10-30

    Applicant: SCHMIDT, Christian ,  DITTMANN, Leander

    Inventor： SCHMIDT, Christian ,  DITTMANN, Leander

    IPC: B01J19/00 ,  B01L3/00

    CPC classification number: B01J19/0093 ,  B01J2219/00826 ,  B01J2219/00828 ,  B01J2219/00833 ,  B01J2219/00837 ,  B01L3/502707 ,  B01L3/5088 ,  B01L2200/12 ,  B01L2300/0822 ,  B01L2300/089 ,  B01L2300/165 ,  B81C1/00119

    Abstract: This invention relates to methods and devices for the production of surface modified micro-structured substrates and their application in natural sciences and technology, in particular in analysis and detection systems. The method of manufacturing a substrate (1) having a stucture (3), preferably a hole or cavity or channel, in said substrate (1) comprises the steps: modifying said surface of said substrate so as to alter the surface properties (2) of said substrate; introducing a structure (3) in a region of said substrate (1) by a method which alters the surface properties of said substrate within said region (4) but not outside of said region.

    Abstract translation: 本发明涉及用于生产表面改性微结构基材的方法和装置及其在自然科学和技术中的应用，特别是在分析和检测系统中。 在所述基板（1）中制造具有结构（3），优选孔或空腔或通道的基板（1）的方法包括以下步骤：修改所述基板的所述表面以改变表面性质（2） 的所述衬底; 在所述衬底（1）的区域中通过改变所述衬底在所述区域（4）内的表面性质而不在所述区域外部的方法引入结构（3）。

    MANUFACTURING OF OPTICAL STRUCTURES BY ELECTROTHERMAL FOCUSSING
    6.
    发明申请
    MANUFACTURING OF OPTICAL STRUCTURES BY ELECTROTHERMAL FOCUSSING 审中-公开
    通过电热聚焦制造光学结构

    公开(公告)号：WO2009074338A1

    公开(公告)日：2009-06-18

    申请号：PCT/EP2008/010595

    申请日：2008-12-12

    Applicant: PICODRILL SA ,  SCHMIDT, Christian ,  DITTMANN, Leander

    Inventor： SCHMIDT, Christian ,  DITTMANN, Leander

    IPC: B26F1/28

    CPC classification number: B26F1/28

    Abstract: This invention relates to methods and devices for the production of optical microstructures or domains in dielectric substrates based on electrothermal focussing. More specifically, the invention relates to a method of introducing a change of dielectric and/or optical properties in a region of an electrically insulating or electrically semiconducting substrate, and to substrates produced by such method.

    Abstract translation: 本发明涉及用于在基于电热聚焦的电介质基底中制造光学微结构或结构域的方法和装置。 更具体地，本发明涉及一种在电绝缘或电半导体衬底的区域中引入电介质和/或光学特性的变化的方法以及通过这种方法产生的衬底。

    SAMPLE HANDLING DEVICES AND METHODS OF HANDLING A SAMPLE
    7.
    发明申请
    SAMPLE HANDLING DEVICES AND METHODS OF HANDLING A SAMPLE 审中-公开
    样品处理装置和处理样品的方法

    公开(公告)号：WO2008135565A3

    公开(公告)日：2008-12-31

    申请号：PCT/EP2008055510

    申请日：2008-05-05

    Applicant: QUANTIFOIL INSTR GMBH ,  HOYER OLAF ,  DITTMANN LEANDER ,  GESSNER GISO ,  VESTER ANDREAS

    Inventor： HOYER OLAF ,  DITTMANN LEANDER ,  GESSNER GISO ,  VESTER ANDREAS

    IPC: B06B1/16 ,  B01F11/00

    CPC classification number: B06B1/16 ,  B01F11/0014

    Abstract: A sample handling device (100) for handling a sample, the sample handling device (100) comprising a drive shaft (101) being drivable by a drive unit (102), a base plate (103) mounted to follow a motion of the drive shaft (101) when being driven by the drive unit (102), wherein the base plate (103) is configured to receive a sample carrier block (104) mountable to follow a motion of the base plate (103), and a compensation weight (105, 106) mounted asymmetrically on the drive shaft (101) in a manner to at least partially compensate an unbalanced mass of the sample handling device (100) during the motion.

    Abstract translation: 一种用于处理样品的样品处理装置（100），所述样品处理装置（100）包括可由驱动单元（102）驱动的驱动轴（101），安装成跟随驱动器的运动的基板（103） 轴（101）由驱动单元（102）驱动时，其中基板（103）构造成接收可安装成跟随基板（103）的运动的样品载体块（104），以及补偿重量 （105,106），其以在运动期间至少部分地补偿样品处理装置（100）的不平衡质量的方式不对称地安装在驱动轴（101）上。

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