Abstract:
This invention relates to organometallic compounds having the formula (L 1 )M(L 2 ) Z wherein M is a metal or metalloid, L 1 is the same or different and is (i) a substituted or unsubstituted anionic 4 electron donor ligand or (ii) a substituted or unsubstituted anionic 4 electron donor ligand with a pendant neutral 2 electron donor moiety, L 2 is the same or different and is (i) a substituted or unsubstituted anionic 2 electron donor ligand or (ii) a substituted or unsubstituted neutral 2 electron donor ligand; y is an integer of 2; and z is an integer of from 0 to 2; and wherein the sum of the oxidation number of M and the electric charges of L 1 and L 2 is equal to 0; a process for producing the organometallic compounds, and a method for producing a film or coating from the organometallic compounds. The organometallic compounds are useful in semiconductor applications as chemical vapor or atomic layer deposition precursors for film depositions.
Abstract:
This invention relates to organometallic compounds having the formula (L 1 )M(L 2 )y wherein M is a metal or metalloid, L 1 is a substituted or unsubstituted anionic 6 electron donor ligand, L 2 is the same or different and is (i) a substituted or unsubstituted anionic 2 electron donor ligand, (ii) a substituted or unsubstituted anionic 4 electron donor ligand, (iii) a substituted or unsubstituted neutral 2 electron donor ligand, or (iv) a substituted or unsubstituted anionic 4 electron donor ligand with a pendant neutral 2 electron donor moiety; and y is an integer of from 1 to 3; and wherein the sum of the oxidation number of M and the electric charges of L 1 and L 2 is equal to 0; a process for producing the organometallic compounds, and a method for producing a film or coating from the organometallic compounds. The organometallic compounds are useful in semiconductor applications as chemical vapor or atomic layer deposition precursors for film depositions.
Abstract:
This invention relates to organometallic compounds having the formula L 1 ML 2 wherein M is a metal or metalloid, L 1 is a substituted or unsubstituted 6 electron donor anionic ligand, and L 2 is a substituted or unsubstituted 6 electron donor anionic ligand, wherein L 1 and L 2 are the same or different, a process for producing the organometallic compounds, and a method for producing a film or coating from the organometallic compounds. The organometallic compounds are useful in semiconductor applications as chemical vapor or atomic layer deposition precursors for film depositions.
Abstract:
A method for fabricating an amorphous metal-metalloid alloy layer for use in an IC device comprises providing a substrate in a reactor that includes a dielectric layer having a trench, pulsing a metal precursor into the reactor to deposit within the trench, wherein the metal precursor is selected from the group consisting of CpTa(CO) 4 , PDMAT, TBTDET, TaCl 5 , Cp 2 Co, Co-amidinates, Cp 2 Ru, Ru-diketonates, and Ru(CO) 4 , purging the reactor after the metal precursor pulse, pulsing a metalloid precursor into the reactor to react with the metal precursor and form an amorphous metal-metalloid alloy layer, wherein the metalloid precursor is selected from the group consisting of BH 3 , BCl 3 , catechol borane, AlMe 3 , methylpyrrolidinealane, AlCl 3 , SiH 4 , SiH 2 Cl 2 , SiCl 4 , tetraalkylsilanes, GeH 4 , GeH 2 Cl 2 , GeCl 4 , SnCl 4 , trialkylantimony, SbMe 3 , SbEt 3 , arsine, and trimethylarsine, purging the reactor after the metalloid precursor pulse, and annealing the amorphous metal-metalloid layer at a temperature between 50°C and 700°C for 5 to 1200 seconds.
Abstract:
Methods and associated structures of forming a microelectronic structure are described. Those methods may comprise dissolving a metal precursor in a non-aqueous solvent in a bath; placing a substrate comprising an interconnect opening in the bath, wherein the metal precursor forms a monolayer within the interconnect opening; and placing the substrate in a coreactant mixture, wherein the coreactant reacts with the metal precursor to form a thin barrier monolayer.
Abstract:
Methods and associated structures of forming a microelectronic structure are described. Those methods may comprise dissolving a metal precursor in a non-aqueous solvent in a bath; placing a substrate comprising an interconnect opening in the bath, wherein the metal precursor forms a monolayer within the interconnect opening; and placing the substrate in a coreactant mixture, wherein the coreactant reacts with the metal precursor to form a thin barrier monolayer.
Abstract:
An apparatus includes an interconnect in a recess. The interconnect includes a liner structure and the liner structure in the recess. The liner structure is breached at the recess bottom feature and a bottom interconnect makes a single-interface contact with a subsequent interconnect through the breach.
Abstract:
An apparatus includes an interconnect in a recess. The interconnect includes a liner structure and the liner structure in the recess. The liner structure is breached at the recess bottom feature and a bottom interconnect makes a single-interface contact with a subsequent interconnect through the breach.
Abstract:
The present Invention relates to solid delivery systems for storage, distribution, and delivery of carbon dioxide into beverages. More specifically, this Invention is directed to methods and preparations for providing a powdered beverage formulation capable of sustained carbonation in aqueous solution and to methods for carbonating a beverage that sustainably releases carbon dioxide into the beverage.