摘要:
Fuse data used to configure ancillary circuits (81) used with a non-volatile serial memory core (51) are stored in locations (54) within the memory core. As a first opcode or word is sent on a serial bus (61) to the memory, a logic circuit (67, 75, 77) intercepts the word and generates read fuse enable pulses that fetch the fuse data and configure the ancillary circuits before the last bit of the first command byte arrives. If a read operation is designated, the memory circuits are configured to read. If a write operation is designated, further fuse data is fetched from the memory core to configure ancillary circuits for writing. The fuse data is written to the memory core at the time of circuit manufacture thereby obviating the need for separate storage locations.
摘要:
A dual -wire communications bus circuit (300), compatible with existing two-wire bus protocols, includes a first and second part of the communications bus circuit (300) to couple to a communications bus (317). The bus (317) has a first line for carrying data signals from a master device (201) to one or more slave devices (315A- 315H) and a second line to carry a clock signal between the devices (315A-315H). A pullup resistor (305, 311) is located in each part of the communications bus circuit (300); the pullup resistor (305) in the first part couples to the first line of the communications bus (317) and the pullup resistor (311) in the second part couples to the second line of the communications bus (317). To improve data throughput and reduce noise, an active pullup device (301A2-301H2), working in conjunction with the pullup resistor (311), is located in each part of the communications bus circuit (300), providing a high logic level on at least one of the communications bus lines.
摘要:
An integrated circuit device (10) includes a plurality of non-volatile memory cells (V1 and V2) associated with a plurality of flag cells (F1 and F2) storing managing data. The managing data of the flag cells (F1 and F2) forms a data set. The data set is utilized to determine to which memory cell of the plurality of memory cells (V1 and V2) to write new data and from which of the memory cells (V1 and V2) to read currently stored data. The data set is changed to a different data set whenever a new value is written to a designated memory cell to indicate an alternate memory cell to be written to next and an alternate memory cell to be read from next. The data set may be changed by alternately writing a new value to a different flag cell in each successive change of the data set.
摘要:
Embodiments disclosed are apparatus comprising a processing circuit having signal and power input ports to couple to a single-wire interface providing electncal communication of both signals and power at a power supply voltage level Also provided Is a charging transistor coupled at a first source/dram terminal to the single-wire interface Further provided is a charge storage device coupled to the second source/drain terminal of the transistor at a connection point and to the power input port of the processing circuit at said connection point There is also a control device having an input coupled to the single-wire interface, a control output coupled to the gate of the transistor, and powered by the charge storage device at the connection point, such that the transistor charges the storage device when the single-wire interface voltage is at a power supply voltage level.
摘要:
An auto-grounding circuit responsive to a reset signal (PORL) discharges an input terminal (11) of an integrated circuit and its associated input line (13) to ground, using a pull-down transistor (17) coupled to the input line, with a gate of the pull-down transistor coupled to receive the reset signal. An exemplary circuit also includes a NAND gate (25) and a second pull-down transistor (27) to maintain an established voltage level of the input line after the reset signal is no longer asserted until the input terminal is driven by an applied input signal. The voltage maintaining circuitry is weaker than the main pull-down transistor to avoid interfering with normal operation of the input terminal.
摘要:
A fault tolerant data storage circuit for an integrated circuit produces a specified initial output state (D out ) with high probability even in the presence of abnormal start-up conditions affecting one or more signal inputs to the storage circuit. The storage circuit includes a plurality of storage elements (10 1 , 10 2 ,...), such as flip-flops, latches, or static RAM cells, each acting as a redundant element for the others. The storage elements are constructed to normally assume a preferred initial state. All storage elements are clocked by a common clock line (12) and loaded at their data inputs (D) from a common data input line (14) of the storage circuit. A logic gate (16), such as an AND gate combines the storage element outputs (Q) and outputs (20) the correct initial state, unless all storage elements happen to be in the wrong state, which is an extremely low probability event.
摘要:
A dual-wire communications bus circuit, compatible with existing two-wire protocols, includes a first and second part of the communications bus circuit to couple to a communications bus. The bus has a first line (DATA) for carrying data signals from a master device (301) to a slave device (303) and a second line to carry a clock signal (CLK) between the devices (301, 303). To improve data throughput and reduce noise, an active pullup device is located in at least one part of the communications bus circuit, the active pullup device (305B) in the first part of the communications bus circuit couples to the first line and an optional active pullup device (309A) in the second part couples to the second line of the communications bus. Each active pullup device (305B, 305A) may provide a high logic level on one of the communications bus lines.
摘要:
A high-voltage charge pump circuit includes a charge pump circuit. A first high-voltage output circuit is configured to set an output voltage of the charge pump at a first voltage level selected for regular programming and erasing memory cells. A second high- voltage output circuit is configured to set the output voltage of the charge pump at a second voltage level selected for walkout of device junctions, the second voltage level being higher than the first voltage level. A third high-voltage output circuit is configured to set the output voltage of the charge pump at a third voltage level selected for guardband programming and erasing, the third voltage level being lower than the second voltage level and higher than the first voltage level. Selection circuitry selectively couples one of the first, second, and third high- voltage output circuits to the output of the high-voltage charge pump circuit.
摘要:
A bitline selection network (300; 500) is composed of a plurality of bitlines (BLn7, ..., BLOO) and one or more global bitlines (GBL7, ..., GBLO; GBL) . The bitlines are grouped into bytes (BYTEn, ..., BYTEO) with eight bitlines per byte. The bitlines provide access to memory cells for read and write operations. A bitline is connected to a global bitline through a bitline select transistor (BLSTn7, ..., BLSTOO) . Each of the bitline select transistors is activated (BLSn7, ..., BLSOO) one at a time by a bitline select controller (350) . Global bitlines may be connected through bit select transistors (BST7, ..., BSTO) and activated one at a time by a bit select controller (385) to a source line (388; 588) , which in turn connects to a sense amplifier (395) and a write data loading logic block (390) . The sense amplifier and the write data loading logic block are used in read and write operations respectively.
摘要:
An array (200; 202) of memory cells having a predetermined group (301) of storage cells (203; 205; 306) , arranged in a row, also have an arrangement of one or more reference cells (201; 207; 304, 307) fabricated to be adjacent to or proximate to the row of storage cells. The reference cells are written to, erased, or programmed when the storage cells are written to, erased, or programmed. The same number of write, erase, or program cycles and the proximity of the reference cells to the storage cells maintain an operational matching of the storage cells and reference cells.