摘要:
A third data circuit which is controlled by clock signals and works to accelerate the changes of signals on long-distance wiring after detecting the changes is provided near a second gate circuit, which receives the signal of a first gate circuit for driving the long-distance wiring, and between the first and second gate circuits. Therefore, the proportion of delay time, caused by the wiring resistance, in the critical path in a semiconductor integrated circuit is reduced and the speed of the critical path is increased. In addition, the operating frequency of the semiconductor integrated circuit can be improved.
摘要:
A dual-wire communications bus circuit (300), compatible with existing two-wire bus protocols, includes a first and second part of the communications bus circuit to couple to a communications bus (317) The bus has a first line for carrying data signals from a master device (201 ) to one or more slave devices (315A-315H) and a second line to carry a clock signal between the devices A pullup resistor (305, 311 ) is located in each part of the communications bus circuit, the pullup resistor (305) in the first part couples to the first line of the communications bus (317) and the pullup resistor (311) in the second part couples to the second line of the communications bus (317) To improve data throughput and reduce noise, an active pullup device (301A2-301 H2), working in conjunction with the pullup resistor (311 ), is located in each part of the communications bus circuit
摘要:
A dual -wire communications bus circuit (300), compatible with existing two-wire bus protocols, includes a first and second part of the communications bus circuit (300) to couple to a communications bus (317). The bus (317) has a first line for carrying data signals from a master device (201) to one or more slave devices (315A- 315H) and a second line to carry a clock signal between the devices (315A-315H). A pullup resistor (305, 311) is located in each part of the communications bus circuit (300); the pullup resistor (305) in the first part couples to the first line of the communications bus (317) and the pullup resistor (311) in the second part couples to the second line of the communications bus (317). To improve data throughput and reduce noise, an active pullup device (301A2-301H2), working in conjunction with the pullup resistor (311), is located in each part of the communications bus circuit (300), providing a high logic level on at least one of the communications bus lines.
摘要:
A circuit for assisting transitions of a signal on a bus conductor (28) having a sensing means (44) connected to the bus conductor for determining if the bus conductor is in a first state or a second state, an assist element (30) for assisting transitions of a signal on the bus conductor between its first state and its second state responsive to clock pulses (61), and a logic circuit (32) connected to the sensing means (44) and the assist element (30) for enabling said assist element (30) when the transition of the said signal is from its first state to its second state during said clock pulses (61), and for disabling the assist element (30) when the signal transition is from its second state to its first state during said clock pulses (61).
摘要:
Provided is a level shift circuit. The level shift circuit includes an inverter including a first transistor having a first polarity to which an input signal from an input port is applied through a gate and a second transistor having a second polarity which is an opposite polarity to the first polarity, the second transistor being connected in series to the first transistor between a positive source voltage and a negative source voltage and a connection node between the first and second transistors being an output port, a capacitor connected between a gate of the first transistor and a gate of the second transistor, and a voltage adjusting means for accurately adjusting a voltage applied to the gate of the second transistor according to an exact switching operation time of the second transistor, using a clock signal and an output port signal of the inverter. A stable and high-speed operation can be performed with a comparatively small size and low power consumption can be achieved.
摘要:
To compensate for leakage current resulting from parasitic resistance, an integrated circuit device includes a boosting current pump (30) to continuously boost the input of an NMOS output circuit (24) so long as the output circuit is providing a logic high output signal. The NMOS output circuit (24) has an input for receiving an input signal and an output for driving at least one output signal line. An oscillation circuit (22) provides an oscillating digital signal to the boosting current pump (30). The pump (30) responds to the oscillating digital signal and to the input signal being in one of two predetermined states to provide additional current at the input of the NMOS output circuit (24) to compensate for the leakage current.
摘要:
An improvement in the basic domino circuit to reduce sensivity to leakage and noise. It basically involves addition of an unclocked small beta p-type pull-up transistor (17) in shunt with the clocked large beta p-type pull-up transistor (13) between the high power terminal and the output node (14) of each stage. This added transistor is operated with its gate so connected that it provides pull-up current to the output node during the evaluation phase when the large beta transistor is turned off.
摘要:
Circuitry for automatically and selectively refreshing a dynamic node to a desired logic level. Nodes at ground potential are left at ground while nodes at an intermediate level are brought up to a supply voltage level. In a preferred use the dynamic node is a digit line in a random access memory. The circuitry includes a first transistor (26) connected between the drain supply and a digit line (12) having a gate (28) connected to the source of a second transistor (30). The drain of the second transistor (30) is connected to a clocked source of potential at least one threshold above the drain supply. The gate (32) of the second transistor (30) is precharged to a potential near the drain supply voltage preferably concurrent with precharging of digit lines in the memory proper. A third transistor (34) is connected between the gate (32) of the second transistor (30) and the digit line (12) and has a gate (36) connected to a clocked source of a reference potential between a digit line precharge level and the level of one threshold above ground. After the state of a memory cell (16) is read out by a sense amplifier (20), the reference potential is applied to the gate (36) of the third transistor (34) to discharge the gate of the second transistor (30) in the event that the digit line (12) is at a low voltage. If the cell read out on the digit line (12) was at a high potential the gate (32) of the second transistor (30) remains charged so that when a potential exceeding the drain voltage by at least one threshold is applied to the drain of the second transistor (30) it is coupled through to the gate (28) of the first transistor (26) which in turn pulls the digit line potential to the drain supply voltage.