摘要:
An improved cross-coupled CMOS high-voltage latch (100) that is used for storing data bits to be written to memory cells of a non-volatile memory is provided with a switching circuit (116) that, during writing of data bits into the memory cells of the latch, provides a high series impedance between one leg of the latch and ground to limit leakage current. A large number of latches are connected in parallel and their accumulated leakage currents are limited by the switching circuit (116) to prevent overload of a high-voltage generator, such as a charge pump circuit, for the high- voltage latch (100), so that data can be properly written in the memory cells of the non-volatile memory.
摘要:
Fuse data used to configure ancillary circuits (81) used with a non-volatile serial memory core (51) are stored in locations (54) within the memory core. As a first opcode or word is sent on a serial bus (61) to the memory, a logic circuit (67, 75, 77) intercepts the word and generates read fuse enable pulses that fetch the fuse data and configure the ancillary circuits before the last bit of the first command byte arrives. If a read operation is designated, the memory circuits are configured to read. If a write operation is designated, further fuse data is fetched from the memory core to configure ancillary circuits for writing. The fuse data is written to the memory core at the time of circuit manufacture thereby obviating the need for separate storage locations.
摘要:
A dual -wire communications bus circuit (300), compatible with existing two-wire bus protocols, includes a first and second part of the communications bus circuit (300) to couple to a communications bus (317). The bus (317) has a first line for carrying data signals from a master device (201) to one or more slave devices (315A- 315H) and a second line to carry a clock signal between the devices (315A-315H). A pullup resistor (305, 311) is located in each part of the communications bus circuit (300); the pullup resistor (305) in the first part couples to the first line of the communications bus (317) and the pullup resistor (311) in the second part couples to the second line of the communications bus (317). To improve data throughput and reduce noise, an active pullup device (301A2-301H2), working in conjunction with the pullup resistor (311), is located in each part of the communications bus circuit (300), providing a high logic level on at least one of the communications bus lines.
摘要:
A dual-wire communications bus circuit, compatible with existing two-wire protocols, includes a first and second part of the communications bus circuit to couple to a communications bus. The bus has a first line (DATA) for carrying data signals from a master device (301) to a slave device (303) and a second line to carry a clock signal (CLK) between the devices (301, 303). To improve data throughput and reduce noise, an active pullup device is located in at least one part of the communications bus circuit, the active pullup device (305B) in the first part of the communications bus circuit couples to the first line and an optional active pullup device (309A) in the second part couples to the second line of the communications bus. Each active pullup device (305B, 305A) may provide a high logic level on one of the communications bus lines.
摘要:
A high-voltage charge pump circuit includes a charge pump circuit. A first high-voltage output circuit is configured to set an output voltage of the charge pump at a first voltage level selected for regular programming and erasing memory cells. A second high- voltage output circuit is configured to set the output voltage of the charge pump at a second voltage level selected for walkout of device junctions, the second voltage level being higher than the first voltage level. A third high-voltage output circuit is configured to set the output voltage of the charge pump at a third voltage level selected for guardband programming and erasing, the third voltage level being lower than the second voltage level and higher than the first voltage level. Selection circuitry selectively couples one of the first, second, and third high- voltage output circuits to the output of the high-voltage charge pump circuit.
摘要:
A bitline selection network (300; 500) is composed of a plurality of bitlines (BLn7, ..., BLOO) and one or more global bitlines (GBL7, ..., GBLO; GBL) . The bitlines are grouped into bytes (BYTEn, ..., BYTEO) with eight bitlines per byte. The bitlines provide access to memory cells for read and write operations. A bitline is connected to a global bitline through a bitline select transistor (BLSTn7, ..., BLSTOO) . Each of the bitline select transistors is activated (BLSn7, ..., BLSOO) one at a time by a bitline select controller (350) . Global bitlines may be connected through bit select transistors (BST7, ..., BSTO) and activated one at a time by a bit select controller (385) to a source line (388; 588) , which in turn connects to a sense amplifier (395) and a write data loading logic block (390) . The sense amplifier and the write data loading logic block are used in read and write operations respectively.
摘要:
Circuitry for testing a power-on-reset circuit in an integrated circuit includes a high-voltage detector coupled to a first I/O pad of the integrated circuit. A power-on-reset circuit in the integrated circuit has an output coupled to a driver circuit that is powered by the high-voltage. A second I/O pad of the integrated circuit is coupled to the output of the driver circuit. The driver circuit may be enabled by a signal provided on a third I/O pad of the integrated circuit.
摘要:
An array (200; 202) of memory cells having a predetermined group (301) of storage cells (203; 205; 306) , arranged in a row, also have an arrangement of one or more reference cells (201; 207; 304, 307) fabricated to be adjacent to or proximate to the row of storage cells. The reference cells are written to, erased, or programmed when the storage cells are written to, erased, or programmed. The same number of write, erase, or program cycles and the proximity of the reference cells to the storage cells maintain an operational matching of the storage cells and reference cells.
摘要:
A multiplexer circuit in a memory organized into page-portions (210, 250) has a plurality of bit- select multiplexers (216, 256) configured to couple a plurality of page-portion global bitlines (214, 254) to a sense amplifier (201) input. A plurality of column address lines organized into data bytes comprises each page-portion. A plurality of column multiplexers (212, 252) couple the data bytes to the page-portion global bitlines (214, 254) such that each of the address lines comprising the data byte is coupled to one of the page-portion global bitlines (214, 254).
摘要:
A switch controlling circuit for the testing and fine-tuning of integrated circuits comprising of a series of flip-flops (30, 32, ..., 34) chained together in a serial manner. The contents of the flip-flop are shifted in from an input (38) leading to the first flipflop (30) in the chain. The output of each flip-flop connects to individual transistor switch (F 1 , F 2 , ..., F n ) whereby the states of the flip-flops control the state of the switches. Circuitry (50, 52, ..., 54) for establishing a default state of the switches may be provided.