Abstract:
In accordance with, certain embodiments, a phosphor element at least partially surrounding a light-emitting die is shaped to influence color-temperature divergence.
Abstract:
In accordance with certain embodiments, electronic devices feature a polymeric binder, a frame defining an aperture therethrough, and a semiconductor die (e.g., a light-emitting or a light-detecting element) suspended in the binder and within the aperture of the frame.
Abstract:
Testing systems and methods for testing a light-emitting device comprising a plurality of discrete light-emitting elements disposed over a substrate, the testing system comprising: a power source for energizing at least some the plurality of discrete light-emitting elements; an imaging system for acquiring an image of at least a some of the energized light- emitting elements during energization thereof; and an analyzer for determining, from the image, an optical characteristic of each of the imaged light-emitting elements.
Abstract:
In accordance with certain embodiments, regions of spatially varying wavelength- conversion particle concentration are formed over light-emitting dies.