Abstract:
A method for manufacturing a semiconductor device according to an embodiment includes making intermediate structural bodies. The shape of an upper and a lower portion of the body are different from each other. The rotational symmetry of the electrode corresponds to that of the semiconductor body. The method includes arranging the intermediate structural bodies to be separated from each other on a tray and vibrating the tray. By causing one of these portions to engage with a recess in an upper surface of a tray the bodies are self-assembled on the tray. The one portion is specially shaped to engage with the recess, while the opposite side does not to engage with the recess. The method includes forming an external electrode connected to an electrode of the intermediate structural body with extends laterally from the body.
Abstract:
A method for manufacturing a semiconductor device according to an embodiment includes making intermediate structural bodies. A configuration of an upper portion of the intermediate structural body and a configuration of a lower portion of it are different from each other. The method includes arranging the intermediate structural bodies to be separated from each other by causing one portion selected from the upper portion and the lower portion to engage with a recess multiply made in an upper surface of a tray by causing the intermediate structural bodies to tumble on the tray. The one portion is configured to engage with the recess. The other portion selected from the upper portion and the lower portion is configured not to engage with the recess. The method includes forming an external electrode connected to an electrode of the intermediate structural body.
Abstract:
In accordance with certain embodiments, regions of spatially varying wavelength- conversion particle concentration are formed over light-emitting dies.
Abstract:
According to the present invention, a diode package comprises an upper lead wire (130) and a lower lead wire (140), each of which has the shape of a long flat plate and has first and second ends opposite to each other, wherein: the lower surface of the first end of the upper lead wire (130) is attached to the upper surface of a diode chip (110); the upper surface of the first end of the lower lead wire (140) is attached to the lower surface of the diode chip (110); and the second end of the upper lead wire (130) and the second end of the lower lead wire (140) are withdrawn to the outside in the lateral direction of a molding compound (120). Preferably, the upper lead wire (130) is provided at the first end thereof with a hemisphere-shaped connector (132) which is concaved from the top to form a hemispherical shape and protruded from the bottom in a hemispherical shape. In this case, a through hole (133) is formed at the center of the hemisphere-shaped connector (132).
Abstract:
본 발명에 따른 다이오드 패키지는 상부 리드선(130)과 하부 리드선(140)은 길이가 긴 납작한 판 형태를 하여 서로 대향하는 제1단과 제2단을 각각 가지며, 다이오드 칩(110)의 윗면에는 상부 리드선(130)의 제1단의 아랫면이 부착되고, 다이오드 칩(110)의 아랫면에는 하부 리드선(140)의 제1단의 윗면이 부착되며, 상부 리드선(130)의 제2단과 하부 리드선(140)의 제2단이 몰딩 컴파운드(120)의 측방향으로 외부 인출되는 것을 특징으로 한다. 상부 리드선(130)의 제1단에는 위에서 밑으로 반구형으로 오목하게 함몰되어 밑으로 반구형으로 돌출되는 반구형 접촉구(132)가 형성되는 것이 바람직하며, 이 경우 반구형 접촉구(132)의 중앙에는 관통공(133)이 형성된다.
Abstract:
The present invention relates to a bonding structure (20, 20', 20") for a chip, the bonding structure (20, 20', 20") comprising a solder bump (32), an underbump metal (30) under the solder bump (32), and a metal pad (24, 40) under the underbump metal (30) and to be connected to a substrate (22) of the chip, wherein the metal pad (24, 40) comprises a ring-like structure (24) underlying the under bump metal (30) at least partially which metal pad (24, 40) shows a reduced area when projected on the substrate (22) and therefore a reduced parasitic capacitance. The present invention further relates to method for connecting an underbump metal (30) with a metal pad layer (24) of a bonding structure (20, 20', 20") for a chip, comprising the step of defining a ring-like structure (24) in a passivation layer (26) between the metal pad (24) and the underbump metal (39).
Abstract:
An electrical circuit protection device has an overcurrent protection portion and an overvoltage protection portion. The overcurrent protection portion has a surface. The overvoltage protection portion is disposed on the surface and thermally coupled to the overcurrent protection portion. A number of terminations connect the overcurrent protection portion and the overvoltage protection portion to a printed circuit board.
Abstract:
An RF power device comprising a power transistor fabricated in a first semiconductor chip and a MOSCAP type structure fabricated in a second semiconductor chip. A voltage limiting device is provided for protecting the power transistor from input voltage spikes and is preferably fabricated in the semiconductor chip along with the MOSCAP. Alternatively, the voltage limiting device can be a discrete element fabricated on or adjacent to the capacitor semiconductor chip. By removing the voltage limiting device from the power transistor chip, fabrication and testing of the voltage limiting device is enhanced, and semiconductor area for the power device is increased and aids in flexibility of device fabrication.
Abstract:
The invention relates to a semiconductor component comprising a first main terminal (40); a second main terminal (80); a gate terminal (70) for controlling the current between the main terminals (40, 80), a first diode device (100) which can be switched between the first gate (40) and the gate terminal (70) and whose first breakdown voltage is such that the first diode device short-circuits the first main terminal (40) with the gate terminal (70), hereby switching on the semiconductor component, when the voltage that drops off over the first diode device (100) exceeds a certain predetermined value. The first diode device (100) is connected to the control gate (70) in an integrated manner and has an external contacting area (120) for connecting to the first main terminal (40).