DIODE PACKAGE HAVING IMPROVED LEAD WIRE AND MANUFACTURING METHOD THEREFOR
    4.
    发明申请
    DIODE PACKAGE HAVING IMPROVED LEAD WIRE AND MANUFACTURING METHOD THEREFOR 审中-公开
    具有改进的引线的二极管封装及其制造方法

    公开(公告)号:WO2011162470A3

    公开(公告)日:2012-02-16

    申请号:PCT/KR2011001978

    申请日:2011-03-23

    Applicant: KIM JAE KU

    Inventor: KIM JAE KU

    Abstract: According to the present invention, a diode package comprises an upper lead wire (130) and a lower lead wire (140), each of which has the shape of a long flat plate and has first and second ends opposite to each other, wherein: the lower surface of the first end of the upper lead wire (130) is attached to the upper surface of a diode chip (110); the upper surface of the first end of the lower lead wire (140) is attached to the lower surface of the diode chip (110); and the second end of the upper lead wire (130) and the second end of the lower lead wire (140) are withdrawn to the outside in the lateral direction of a molding compound (120). Preferably, the upper lead wire (130) is provided at the first end thereof with a hemisphere-shaped connector (132) which is concaved from the top to form a hemispherical shape and protruded from the bottom in a hemispherical shape. In this case, a through hole (133) is formed at the center of the hemisphere-shaped connector (132).

    Abstract translation: 根据本发明,二极管封装包括上引线(130)和下引线(140),每个引线具有长平板的形状,并具有彼此相对的第一和第二端,其中: 上引线(130)的第一端的下表面附接到二极管芯片(110)的上表面; 下引线(140)的第一端的上表面附接到二极管芯片(110)的下表面; 并且上引线(130)的第二端和下导线(140)的第二端沿模塑料(120)的横向方向被抽出到外侧。 优选地,上引线(130)在其第一端处设置有半球形连接器(132),该半球形连接器从顶部凹入以形成半球形并且从底部以半球形形式突出。 在这种情况下,在半球形连接器(132)的中心形成通孔(133)。

    発光素子及びそれを用いた発光装置
    6.
    发明申请
    発光素子及びそれを用いた発光装置 审中-公开
    发光元件和使用该发光元件的发光元件

    公开(公告)号:WO2009041318A1

    公开(公告)日:2009-04-02

    申请号:PCT/JP2008/066710

    申请日:2008-09-17

    Inventor: 松村 拓明

    Abstract: 【課題】局所電流密度を均一にし、放熱性に優れた構造であり、ひいては大電流域にあっても高効率の発光でありながら長寿命・高信頼性の発光素子及びそれを用いた発光装置を提供する。 【解決手段】半導体構造10を構成する第1導電型層11及び第2導電型層12にそれぞれ電気的に接続され、互いに対向する第1電極21及び第2電極21と、を有する発光素子であって、第1電極21は、光取り出し側に位置する第1導電型層11上の電極形成面15に形成された、互いに対向する一対の電極延伸部30を備えており、一対の電極延伸部30の対向方向において、該電極延伸部30間の1/2の距離l1が、電極延伸部30から電極形成面15の端縁までの距離L2よりも小さい。

    Abstract translation: 本发明提供一种发光元件,其具有局部电流密度均匀的结构,并且获得了优异的散热特性,并且具有长的使用寿命和高的可靠性,同时即使在 大电流区域,并且提供使用该发光元件的发光器件。 解决问题的手段发光元件具有彼此相对并与各自的第一导电类型层(11)和第二导电类型层(12)电连接的第一电极(21)和第二电极(21) 构成半导体结构(10)。 第一电极(21)具有彼此相对的一对电极延伸部分(30),并形成在位于光输出侧的第一导电类型层(11)的电极形成表面(15)上。 在一对电极延伸部分(30)的相反方向上,电极延伸部分(30)之间距离的一半的距离(l1)小于距电极延伸部分(30)的距离(L2) )到电极形成表面(15)的边缘。

    METAL PADS WITH REDUCED PARASITIC CAPACITANCE
    7.
    发明申请
    METAL PADS WITH REDUCED PARASITIC CAPACITANCE 审中-公开
    减少寄生电容的金属垫片

    公开(公告)号:WO2008114208A3

    公开(公告)日:2008-11-13

    申请号:PCT/IB2008051004

    申请日:2008-03-17

    Abstract: The present invention relates to a bonding structure (20, 20', 20") for a chip, the bonding structure (20, 20', 20") comprising a solder bump (32), an underbump metal (30) under the solder bump (32), and a metal pad (24, 40) under the underbump metal (30) and to be connected to a substrate (22) of the chip, wherein the metal pad (24, 40) comprises a ring-like structure (24) underlying the under bump metal (30) at least partially which metal pad (24, 40) shows a reduced area when projected on the substrate (22) and therefore a reduced parasitic capacitance. The present invention further relates to method for connecting an underbump metal (30) with a metal pad layer (24) of a bonding structure (20, 20', 20") for a chip, comprising the step of defining a ring-like structure (24) in a passivation layer (26) between the metal pad (24) and the underbump metal (39).

    Abstract translation: 本发明涉及用于芯片的接合结构(20,20',20“),接合结构(20,20',20”)包括焊料凸块(32),焊料下方的凸块下金属(30) (32)和金属垫(24,40),所述金属垫(24,40)位于所述下凸块金属(30)下方并且与所述芯片的衬底(22)连接,其中所述金属垫(24,40)包括环状结构 (24)位于所述凸块下金属(30)下方,至少部分地将所述金属垫(24,40)投影到所述衬底(22)上时表现出减小的面积并因此降低了寄生电容。 本发明进一步涉及用于将凸块下金属(30)与用于芯片的接合结构(20,20',20“)的金属焊盘层(24)连接的方法,该方法包括以下步骤:将环状结构 (24)沉积在所述金属垫(24)和所述下凸块金属(39)之间的钝化层(26)中。

    SEMICONDUCTOR COMPONENT AND CORRESPONDING TESTING METHOD
    10.
    发明申请
    SEMICONDUCTOR COMPONENT AND CORRESPONDING TESTING METHOD 审中-公开
    半导体部件和相应的程序

    公开(公告)号:WO01054168A2

    公开(公告)日:2001-07-26

    申请号:PCT/EP2000/013024

    申请日:2000-12-20

    Abstract: The invention relates to a semiconductor component comprising a first main terminal (40); a second main terminal (80); a gate terminal (70) for controlling the current between the main terminals (40, 80), a first diode device (100) which can be switched between the first gate (40) and the gate terminal (70) and whose first breakdown voltage is such that the first diode device short-circuits the first main terminal (40) with the gate terminal (70), hereby switching on the semiconductor component, when the voltage that drops off over the first diode device (100) exceeds a certain predetermined value. The first diode device (100) is connected to the control gate (70) in an integrated manner and has an external contacting area (120) for connecting to the first main terminal (40).

    Abstract translation: 本发明提供了具有第一主端子(40)的半导体器件; 第二主端子(80); 用于控制主端子(40,80)中流动流之间的控制端子(70); 第一主端子(40)和控制端子之间的(70)可切换的第一二极管装置具有这样的第一击穿电压,短路的第一主端子(40)的控制端子(70)(100),因此转弯时在半导体装置上 是在所述第一二极管的装置(100)下降的电压超过预定值,集成所述第一二极管装置(100)的控制端子(70)。 第一二极管装置(100)具有被连接到所述第一主端子(40)包括:第一外部接触区域(120)。

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