Abstract:
A method, apparatus and algorithms are disclosed for operating an open electrostatic trap (E-trap) or a multi-pass TOF mass spectrometer with an extended flight path. A string of start pulses with non equal time intervals is employed for triggering ion packet injection into the analyzer, a long spectrum is acquired to accept ions from the entire string and a true spectrum is reconstructed by eliminating or accounting overlapping signals at the data analysis stage while using logical analysis of peak groups. The method is particularly useful for tandem mass spectrometry wherein spectra are sparse. The method improves the duty cycle, the dynamic range and the space charge throughput of the analyzer and of the detector, so as the response time of the E-trap analyzer. It allows flight extension without degrading E- trap sensitivity.
Abstract:
This invention relates generally to multi-reflection electrostatic systems, and more particularly to improvements in and relating to the Orbitrap electrostatic ion trap. A method of operating an electrostatic ion trapping device having an array of electrodes operable to mimic a single electrode is proposed, the method comprising determining three or more different voltages that, when applied to respective electrodes of the plurality of electrodes, generate an electrostatic trapping field that approximates the field that would be generated by applying a voltage to the single electrode, and applying the three or more so determined voltages to the respective electrodes. Further improvements lie in measuring a plurality of features from peaks with different intensities from one or more collected mass spectra to derive characteristics, and using the measured characteristics to improve the voltages to be applied to the plurality of electrodes.
Abstract:
The invention relates to an apparatus (1) and a method for determining a mass spectrum from a continuous ion beam (50). The method comprises a deflection phase of deflecting the ion beam (50) away from an initial direction to a deflected ion beam (51) by applying a timely changing deflecting force with a deflection unit (3) to ions in the ion beam passing a deflection zone (52), whereby a direction of the deflected ion beam (51) is changed in time according to a deflection modulation function. The method further comprises a pass phase of passing the deflected ion beam (51) to a position sensitive detector (4), a detection phase of detecting with the position sensitive detector (4) the ions of the deflected ion beam (51), whereby ion arrival information is obtained for each detected ion, and a mass spectrum determination phase of determining the mass spectrum from the ion arrival information of the detected ions and the deflection modulation function by a calculation unit (5). Thereby, at a first point in time, the deflected ion beam (51) has a first direction, and later, at a second point in time, the deflected ion beam (51) has for a first time since the first point in time again the first direction, while between the first point in time and the second point in time, the direction of the deflected ion beam (51) differs from the first direction and is changed in time away from directions taken up since the first point in time, wherein at least at a third point in time which is either before the first point in time or after the second point in time, the deflected ion beam (51) has a same direction as at a fourth point in time between the first point in time and the second point in time. Additionally, the method comprises a base change rate estimation step of estimating a base change rate for running the deflection modulation function at, wherein if the deflection modulation function is run at the base change rate, a time interval between the first point in time and the second point in time is longer than a difference between times slowest and fastest ions expected in the ion beam (50) require to pass from a centre of the deflection zone (52) to the position sensitive detector (4), wherein the mass spectrum is determined from the ion beam (50) with the deflection phase, the pass phase, the detection phase and the mass spectrum determination phase by running the deflection modulation function at an effective change rate which is larger than the base change rate.
Abstract:
An ion guide is provided having an enclosure extending longitudinally around a central axis from a proximal inlet end to a distal outlet end. The proximal inlet end receives a plurality of ions entrained in a gas flow through an inlet orifice. A deflection plate is disposed within the enclosure between the proximal and distal ends and deflects at least a portion of the gas flow away from a central direction of the gas flow. A plurality of electrically conductive, elongate elements extend from the proximal end to the distal end within the enclosure and generate an electric field via a combination of RF and DC electric potentials. The electric field deflects the entrained ions away from the central direction of the gas flow proximal to the deflection plate and confines the deflected ions in proximity of the elongated elements as the ions travel downstream.
Abstract:
An apparatus which has the capability of filtering unwanted species from an extracted ion beam without the use of a mass analyzer magnet is disclosed. The apparatus includes an ion source having chamber walls that are biased by an RF voltage. The use of RF extraction causes ions to exit the ion source at different energies, where the energy of each ion species is related to its mass. The extracted ion beam can then be filtered using only electrostatic energy filters to eliminate the unwanted species. The electrostatic energy filter may act as a high pass filter, allowing ions having an energy above a certain threshold to reach the workpiece. Alternatively, the electrostatic energy filter may act as a low pass filter, allowing ions having an energy below a certain threshold to reach the workpiece. In another embodiment, the electrostatic energy filter operates as a bandpass filter.
Abstract:
A drift tube ion mobility spectrometry sample introduction scheme allows introduction of a sample packet at ground voltages. The sample packet of ionized particles is captured by subjecting particles within a defined region to an electric field at an elevated voltage. The ionized particles in the captured packet then migrate through the drift tube down the voltage gradient according to their electrical mobility. The particles are directed to a high sensitivity detector, such as a condensation particle counter (CPC), for detection.
Abstract:
There is provided an ion reflector for use with a mass spectrometer for directing a flow of ions between two distinct axes of travel. The reflector includes an electric field capable of causing a flow of ions focused through a first spatial region to be focused toward a second spatial region, whereby the first and second spatial regions are aligned with respective axes of travel.