Abstract:
L'invention concerne un dispositif mémoire comprenant : - des circuits mémoire DRAM (100), dont la capacité totale est divisée en une première partie (102) et une deuxième partie (103) de taille supérieure à la première partie (102); - un circuit de contrôle configuré pour accéder aux circuits mémoire, le circuit de contrôle comprend: - un premier bloc (201) configuré pour exécuter un premier algorithme (201A) destiné à protéger la première partie (102) d'un effet de martelage de rang; - un deuxième bloc (202) configuré pour exécuter un deuxième algorithme (202A) destiné à protéger la deuxième partie (103) d'un effet de martelage de rang susceptible d'intervenir, le deuxième algorithme (202A) utilisant une table principale sauvegardée dans la première partie (102). 0
Abstract:
Apparatuses and methods for triggering row hammer address sampling are described. An example apparatus includes an oscillator circuit configured to provide a clock signal, and a filter circuit. The filter circuit includes a control circuit configured to receive pulses of the clock signal and provide an output signal that represents a count number by counting a number of pulses of the clock signal and control a probability of enabling the output signal based on the count number. The filter circuit further includes a logic gate configured to pass one of the pulses of the clock signal responsive to the output signal from the control circuit being enabled and filter another of the pulses responsive to the output signal from the control circuit being not enabled.
Abstract:
Embodiments of the disclosure are drawn to apparatuses and methods for generating multiple row hammer address refresh sequences. An example apparatus may include an address scrambler and a refresh control circuit. The address scrambler may receive a first address, output a second address in response to a first control signal, and output a third address in response to a second control signal. The second address may physically adjacent to the first address and the third address may physically adjacent to the second address. The refresh control circuit may perform a refresh operation on the second address when the first control signal is active and perform the refresh operation on the third address when the second control signal is active.
Abstract:
Apparatuses and methods for controlling word lines and sense amplifiers in a semiconductor device are described. An example apparatus includes: a sub word line selection signal decoder which activates at least one of a plurality of sub word selection signals responsive to row address signals; a column segment selection signal decoder which activates at least one of a plurality of column segment signals responsive to a portion of column address signals and a portion of the row address signals; a column segment selection circuit which activates at least one of a plurality of column-subword selection signals responsive to the activated column segment signal and the activated sub word selection signal; and a sub word line driver which activates at least one of a plurality of sub word lines responsive to an activated main word line and the activated sub word selection signal.
Abstract:
The embodiments described herein are used to execute staggered memory operations. The method includes, at each of a plurality of distinct memory portions of the storage device, establishing a non-zero command delay parameter distinct from a command delay parameter established for one or more of the other memory portions in the plurality of distinct memory portions. The method further includes, after establishing the non-zero command delay parameter in each of the plurality of distinct memory portions of the storage device, executing memory operations in two or more of the plurality of distinct memory portions of the storage device during overlapping time periods, the executing including, in each memory portion of the plurality of memory portions, delaying execution of a respective memory operation by an amount of time corresponding to the command delay parameter established for that memory portion.
Abstract:
Techniques for reducing impact of array disturbs in a semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a method for reducing impact of array disturbs in a semiconductor memory device by increasing the refresh rate to the semiconductor memory device based at least in part on a frequency of active operations. The method may comprise receiving a first refresh command including a first subarray address to perform a first refresh operation to a first logical subarray of memory cells associated with the first subarray address. The method may also comprise receiving a second refresh command including a second subarray address to perform a second refresh operation to a second logical subarray of memory cells associated with the second subarray address, wherein the second refresh command is received after a time period from the reception of the first refresh command. The method may further comprise performing a number of concurrent refresh operations during the time period.
Abstract:
An apparatus for synchronizing memory data signals is provided. The apparatus comprises a first interface circuit (110) that is configured to generate a differential clock signal in a strobe domain and to convey a data signal to a data bus (110), a second interface circuit (120) in a clock domain that is configured to receive the data signal (170) from the data bus and a synchronization circuit that is configured to adjust the data signal (170) between the strobe domain and the clock domain such that integrity of information encoded by the data signal is preserved. Methods of using the apparatus are also disclosed.
Abstract:
A technique of writing, programming, holding, maintaining, sampling, sensing, reading and/or determining the data state of a memory cell of a memory cell array (for example, a memory cell array having a plurality of memory cells which consist of an electrically floating body transistor). In one aspect, the present inventions are directed to techniques to control and/or operate a semiconductor memory cell (and memory cell array having a plurality of such memory cells as well as an integrated circuit device including a memory cell array) having one or more electrically floating body transistors in which an electrical charge is stored in the body region of the electrically floating body transistor. The techniques of the present inventions may employ bipolar transistor currents to control, write and/or read a data state in such a memory cell. In this regard, the present inventions may employ a bipolar transistor current to control, write and/or read a data state in/of the electrically floating body transistor of the memory cell.