Abstract:
Junction field effect transistors (JFETs) and related manufacturing methods are disclosed herein. A disclosed JFET includes a vertical channel region located in a mesa and a first channel control region located on a first side of the mesa. The first channel control region is at least one of a gate region and a first base region. The JEFT also includes a second base region located on a second side of the mesa and extending through the mesa to contact the vertical channel region. The vertical channel can be an implanted vertical channel. The vertical channel can be asymmetrically located in the mesa towards the first side of the mesa.
Abstract:
Methods, devices, and systems are provided for a select device that can include a semiconductive stack of at least one semiconductive material formed on a first electrode, where the semiconductive stack can have a thickness of about 700 angstroms () or less. Each of the at least one semiconductive material can have an associated band gap of about 4 electron volts (eV) or less and a second electrode can be formed on the semiconductive stack.
Abstract:
An insulated gate bipolar transistor (IGBT) is disclosed. The IGBT includes a substrate containing a substrate layer and an epitaxial layer formed on one side of the substrate layer. The IGBT also includes a well region formed in the epitaxial layer, and a gate region formed over a junction between the well region and the epitaxial layer. Further, the IGBT includes a collector drift region formed in the epitaxial layer, and an emitter drift region formed in the well region. The IGBT also includes a collector formed on the collector drift region, an emitter formed on the emitter drift region, and a gate formed on the gate region. The collector, the emitter, and the gate are arranged at a same side of the substrate layer.
Abstract:
Self-assembled buckling patterns of thin films on compliant substrates can be used in micro-fabrication. However, most previous work has been limited to planar substrates, and buckling of films on curved substrates has not been widely explored. With the constraining effect from various types of substrate curvature, numerous new types of buckling morphologies can be derived. The morphologies not only enable true three-dimensional (3D) fabrication of microstructures and microdevices, but also can have important implications for the morphogenesis of quite a few natural and biological systems.
Abstract:
An e-fuse (200) for an integrated circuit is formed with a reverse P-N junction in the semiconductor body (205) between fuse contacts (235) and below the conductive (for example, silicide) layer (230), so that when the fuse is blown (that is, the conductive layer melts), conduction through the underlying body is prevented.
Abstract:
A combination of a thin-film µc-Si and a-Si:H containing diode structure characterized by an ultra-high current density that exceeds 1000 A/cm 2 , comprising: a substrate; a bottom metal layer disposed on the substrate; an n-layer of µc-Si deposited the bottom metal layer; an i-layer of µc-Si deposited on the n-layer; a buffer layer of a-Si:H deposited on the i-layer; a p-layer of µc-Si deposited on the buffer layer; and a top metal layer deposited on the p-layer.
Abstract:
A light emitting diode includes a transparent substrate (100) and a GaN buffer layer (120) on the transparent substrate. An n-GaN layer (140) is formed on the buffer layer. An active layer is formed on the n-GaN layer. A p-GaN layer is formed on the active layer. A p-electrode is formed on the p-GaN layer and an n-electrode is formed on the N-GaN layer. A reflective layer (200) is formed on a second side of the transparent substrate. Also, a cladding layer of AlGaN is between the p-GaN layer and the active layer (160).
Abstract:
A heterojunction bipolar transistor (20) is provided with a silicon (Si) base region (34) that forms a semiconductor junction with a multilayer emitter (38) having a thin gallium arsenide (GaAs) emitter layer (36) proximate the base region (34) and a distal gallium phosphide emitter layer (40). The GaAs emitter layer (36) is sufficiently thin, preferably less than 200 ANGSTROM , so as to be coherently strained.
Abstract:
A low-power ultrahigh-speed bipolar transistor and a circuit using the same are provided to achieve ultrahigh-speed transmission and receiving of a large quantity of signals as well as low-noise operation of a portable wireless device for extended periods of time. A silicon oxide film (115) is inserted under a polycrystalline silicon graft base (113) that connects a base region (114) to a base polycrystalline silicon electrode (110). This makes it possible to lower the base resistance and the base-collector capacitance, and to obtain a low-power transistor that operates at high speeds.
Abstract:
An inventive thyristor structure includes anode and cathode electrodes, with a diverter electrode being connected to the cathode electrode. A multi-layer body of semiconductor material has a first surface and includes a regenerative portion (110) operatively coupled between the anode and cathode electrodes, with a non-regenerative portion (120) being operatively coupled between the anode and diverter electrodes. The regenerative portion includes adjacent first (170), second (180), third (200) and fourth regions (240) of alternating conductivity type arranged respectively in series between the cathode and anode electrodes, wherein the cathode electrode is in electrical contact with the first region and the anode electrode is in electrical contact with the fourth region.