Abstract:
A process of fabricating an electromagnetic circuit includes providing a first sheet of dielectric material including a top surface having at least one conductive trace and depositing a solder bump on the at least one conductive trace. The process further includes applying a second sheet of dielectric material to the first sheet of dielectric material with bond film sandwiched in between, the second sheet of dielectric material having a through-hole providing access to the solder bump. The process further includes bonding the first and second dielectric materials to one another and removing bond film resin from the solder bump. The process further includes machining the solder bump by the drilling or milling process to achieve a desired amount of solder in the solder bump.
Abstract:
회전하는 롤 브러쉬를 회로 기판에 직접 접촉시켜 회로 기판 상에서 이물질을 제거하는 기판의 이물질 제거 장치 및 방법을 제공한다. 상기 기판의 이물질 제거 장치는, 지지대 상에 제1 방향으로 형성된 제1 레일 및 지지대 상에 제2 방향으로 형성된 제2 레일을 포함하는 바디부; 제2 레일 상에 배치되며, 기판을 유동시키는 기판 유동부; 및 제1 레일 상에 배치되며, 관통구가 형성된 하우징 및 하우징의 내부 공간에 탑재되는 롤 브러쉬를 포함하는 브러싱부를 포함하며, 브러싱부의 롤 브러쉬는 관통구를 통해 기판과 접촉하여 기판으로부터 이물질을 제거한다.
Abstract:
A vacuum wiper, comprising a housing, a connection port, multiple holes and a hole adjusting means; the housing contains a cavity; the connection port is disposed on the housing and is in communication with the cavity; the multiple holes are disposed on the housing in the length direction of the housing, such that the cavity of the vacuum wiper housing is able to be in fluid communication with the outside via the multiple holes. The vacuum wiper has a maximum vacuumizing length when all of the multiple holes are in communication with the outside. The hole adjusting means is configured to be capable of blocking one or more of the multiple holes in sequence from two ends in the length direction of arrangement of the multiple holes of the vacuum wiper, such that the vacuum wiper is able to adjust the vacuumizing length. The provision of the hole adjusting means enables the vacuum wiping apparatus to have an adjustable vacuumizing length, in order to match the wiping of stencils with different length specifications, thereby effectively increasing the vacuumizing efficiency of the vacuum wiping apparatus and reducing the production cost.
Abstract:
The present invention relates to a method for selective removal of palladium from a surface of a substrate having at least one structured surface with conductive features thereon made of one or more metal or metal alloys which are not palladium and at least one outer layer of palladium layer or parts thereof comprising the following method steps to be carried out in the given order (1) providing said substrate; and i. (2) treating said substrate with a treatment composition comprising at least one solvent; at least one hydroxycarboxylic acid or a salt thereof; and at least one sulfur compound selected from compounds represented by formula (I) compounds represented by formula (II) and mixtures of the aforementioned wherein the concentration of the at least one sulfur compound is at least 0.06 mol/L. The invention further concerns a treatment composition for selective removal of palladium from a surface of a substrate and its use.