- 专利标题: Magnetic memory element with iridium anti-ferromagnetic coupling layer
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申请号: US15816160申请日: 2017-11-17
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公开(公告)号: US10032979B2公开(公告)日: 2018-07-24
- 发明人: Huadong Gan , Yiming Huai , Yuchen Zhou , Zihui Wang , Bing K. Yen , Xiaojie Hao , Pengfa Xu
- 申请人: Avalanche Technology, Inc.
- 申请人地址: US CA Fremont
- 专利权人: Avalanche Technology, Inc.
- 当前专利权人: Avalanche Technology, Inc.
- 当前专利权人地址: US CA Fremont
- 代理商 Bing K. Yen
- 主分类号: H01L43/08
- IPC分类号: H01L43/08 ; H01F10/32 ; G11C11/16 ; H01F41/30 ; H01L29/66 ; H01L43/10 ; H01L27/22 ; H01L43/02 ; B82Y40/00
摘要:
The present invention is directed to a magnetic memory element including a magnetic free layer structure having a variable magnetization direction perpendicular to a layer plane thereof; an insulating tunnel junction layer formed adjacent to the magnetic free layer structure; a first magnetic reference layer comprising cobalt, iron, and boron formed adjacent to the insulating tunnel junction layer; a second magnetic reference layer comprising cobalt separated from the first magnetic reference layer by a molybdenum layer; an iridium layer formed adjacent to the second magnetic reference layer; and a magnetic fixed layer structure formed adjacent to the iridium layer. The magnetic free layer structure includes a first and a second magnetic free layers with a perpendicular enhancement layer interposed therebetween. The first and second magnetic reference layers have a first invariable magnetization direction perpendicular to layer planes thereof. The magnetic fixed layer structure has a second invariable magnetization direction opposite to the first invariable magnetization direction.
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