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    VERFAHREN UND SYSTEM ZUM SPEKTROSKOPISCHEN MESSEN OPTISCHER EIGENSCHAFTEN VON PROBEN
    91.
    发明公开
    VERFAHREN UND SYSTEM ZUM SPEKTROSKOPISCHEN MESSEN OPTISCHER EIGENSCHAFTEN VON PROBEN 审中-公开
    用于样品光学性质的光谱测量的方法和系统

    公开(公告)号：EP3299780A1

    公开(公告)日：2018-03-28

    申请号：EP16190571.6

    申请日：2016-09-26

    Applicant: Berthold Technologies GmbH & Co. KG

    Inventor： Schleifenbaum, Dr. Frank ,  Hutter, Bernd

    IPC: G01J3/06 ,  G01J3/02 ,  G01J3/28

    CPC classification number: G01N21/31 ,  G01J3/027 ,  G01J3/06 ,  G01J3/28 ,  G01J2003/066 ,  G01N21/63

    Abstract: Bei einem Verfahren zum spektral aufgelösten Messen optischer Eigenschaften von Proben wird eine Probe in einer Messposition angeordnet, es mittels einer Lichtquelle Licht erzeugt. Spektrale Anteile des Lichts werden als Anregungslicht in einem ersten optischen Pfad zu der Probe übertragen. Durch die Probe emittiertes oder transmittiertes Licht wird in einem zweiten optischen Pfad zu einem Detektor übertragen. In dem ersten optischen Pfad und/oder in dem zweiten optischen Pfad ist ein durchstimmbarer Monochromator angeordnet. Ein Spektrum des emittierten oder transmittierten Lichts wird über einen effektiven Spektralbereich (SPE) durch Verschieben eines spektralen Passbereiches des durchstimmbaren Monochromators aufgenommen. Das Verfahren ist dadurch gekennzeichnet, dass Licht in Form von Lichtpulsen mit vorgebbarer Pulsfrequenz genutzt wird, dass der spektrale Passbereich des durchstimmbaren Monochromators für die Aufnahme eines Spektrums mit einer Verschiebungsgeschwindigkeit kontinuierlich von einer Anfangswellenlänge zu einer Endwellenlänge verschoben wird und dass die Pulsfrequenz des Lichts mit der Verschiebungsgeschwindigkeit des spektralen Passbereichs über eine Steuerung derart synchronisiert wird, dass innerhalb des effektiven Spektralbereichs (SPE) eine Vielzahl von Messungen des emittierten oder transmittierten Lichts an einer entsprechenden Vielzahl von spektralen Stützpunkten (ST1, ST2, STn) erfolgt.

    Abstract translation: 在用于样品的光学性质的光谱分辨测量的方法中，将样品放置在测量位置中，借助于光源产生光。 光的光谱分量在第一光路中作为激发光传输到样品。 通过样本发射或透射的光被传输到第二光路中的检测器。 可调谐单色器被布置在第一光路中和/或第二光路中。 通过改变可调谐单色器的光谱范围，在有效光谱范围（SPE）上接收发射光或透射光的光谱。 该方法的特征在于，光在具有预先确定的脉冲速率的光脉冲的形式使用时，其用于接收与移动速度的频谱可调单色仪的光谱通范围被连续地从一个初始波长移动到端部的波长和使光的与所述脉冲频率 光谱通范围的位移速度通过使得有效的光谱范围内（SPE）在相应的多个频谱点（ST1，ST2，STN）的情况下进行多个所发射的光或透射光的测量值的控制同步。

    FOURIER TRANSFORM SPECTROPHOTOMETER
    92.
    发明公开
    FOURIER TRANSFORM SPECTROPHOTOMETER 审中-公开

    公开(公告)号：EP3270142A4

    公开(公告)日：2018-03-28

    申请号：EP15885369

    申请日：2015-03-13

    Applicant: SHIMADZU CORP

    Inventor： KAMIKAKE TADAFUMI

    IPC: G01N21/27 ,  G01B9/02 ,  G01J3/02 ,  G01J3/06 ,  G01J3/453

    CPC classification number: G01J3/4535 ,  G01B9/02 ,  G01J3/0202 ,  G01J3/027 ,  G01J3/0275 ,  G01J3/0289 ,  G01J3/06 ,  G01J2003/064 ,  G01N21/27 ,  G01N21/3563

    Abstract: Provided is a Fourier transform type spectrophotometer capable of stably controlling a speed of a moving mirror. The Fourier transform type spectrophotometer according to the present invention is provided with a movable unit 111 to which a moving mirror 141 is fixed, outside-force-applying means 160 configured to apply external force larger than movement resistance of the movable unit 111 to the movable unit 111, a driving source 120 configured to apply positive or negative driving force along the moving direction of the movable unit 111 to the movable unit 111, a speed measurement unit 132 configured to measure the moving speed of the movable unit 111, and a driving force control unit 131 configured to control the driving force of the driving source 120 so that the movable unit 111 is moved in a predetermined manner based on the moving speed, wherein a rate of fluctuation of the driving force is suppressed by operating in a state in which the driving force of the driving source 120 is high due to the external force to thereby stabilize the control.

    DETECTING SMALL AMOUNTS OF SUBSTANCES
    95.
    发明公开
    DETECTING SMALL AMOUNTS OF SUBSTANCES 审中-公开

    公开(公告)号：EP2376880A4

    公开(公告)日：2017-12-20

    申请号：EP09833742

    申请日：2009-12-17

    Applicant: TOTALFÖRSVARETS FORSKNINGSINSTITUT FOI

    Inventor： HENRIC ÖSTMARK

    IPC: G01J3/06 ,  G01N21/65 ,  G01N21/88 ,  G01N33/22

    CPC classification number: G01J3/44 ,  G01J3/32 ,  G01N21/65 ,  G01N33/0057 ,  G01N2021/1793

    Abstract: In determining whether an object contains e.g. a hazardous substance or molecules of a hazardous substance the object is illuminated with light of a definite wavelength. A telescope collects and concentrates light scattered by the object and a plurality of individual picture elements in a picture element array in a camera receives and detects the collected and concentrated light. The detection signals from each of the individual picture elements are individually analyzed to produce a Raman-spectrum or some similar spectrum valid for the subarea of the illuminated area of the object that corresponds to the respective picture element. The subarea of the illuminated area that corresponds to one of the individual picture elements can be chosen to have a width or dimension chosen to correspond to the size or a dimension of a particle or a molecule of the hazardous substance. A filter that can be tunable can be used for filtering the collected and concentrated light before being received by the camera, so that at each instance light of only one wavelength range is detected.

    A SURFACE REFRACTIVE INDEX SCANNING SYSTEM AND METHOD
    97.
    发明公开
    A SURFACE REFRACTIVE INDEX SCANNING SYSTEM AND METHOD 有权
    一种表面折射率指数扫描系统和方法

    公开(公告)号：EP3140636A1

    公开(公告)日：2017-03-15

    申请号：EP15723825.4

    申请日：2015-05-08

    Applicant: Danmarks Tekniske Universitet

    Inventor： KRISTENSEN, Anders ,  VANNAHME, Christoph ,  DUFVA, Martin

    IPC: G01N21/77 ,  G02F1/39 ,  H01S3/06 ,  H01S3/08 ,  H01S3/16 ,  G01J3/02 ,  G01J3/06 ,  G01J3/18 ,  G01J3/28 ,  G02B6/122 ,  H01S5/00

    CPC classification number: G01N21/7743 ,  G01J3/0245 ,  G01J3/1895 ,  G01J3/2823 ,  G01J2003/064 ,  G01N21/4133 ,  G01N2021/7776 ,  G01N2021/7789 ,  G02B6/00 ,  G02B6/1225 ,  G02F1/39 ,  H01S3/0635 ,  H01S3/08009 ,  H01S3/168 ,  H01S3/2391

    Abstract: The invention relates to a surface refractive index scanning system for characterization of a sample. The system comprises a grating device for holding or receiving the sample, the device comprising at least a first grating region having a first grating width along a transverse direction, and a second grating region having a second grating width in the transverse direction. The first grating region and the second grating region are adjacent in the transverse direction, wherein the first grating region has a grating period Λ1 in a longitudinal direction, and the second grating region has a grating period Λ2 in the longitudinal direction, where the longitudinal direction is orthogonal to the transverse direction. A grating period spacing ΔΛ=Λ1-Λ2 is finite. Further, the first and second grating periods are chosen to provide optical resonances for light respectively in a first wavelength band and a second wavelength band, light is being emitted, transmitted, or reflected in an out-of-plane direction, wherein the first wavelength band and the second wavelength band are at least partially non-overlapping in wavelength. The system further comprises a light source for illuminating at least a part of the grating device with light at an illumination wavelength band. Additionally, the system comprises an imaging system for imaging the emitted, transmitted or reflected light from the grating device. The imaging system comprises an optical element, such as a cylindrical lens or a bended mirror, configured for focusing light in a transverse direction and for being invariant in an orthogonal transverse direction, the optical element being oriented such that the longitudinal direction of the grating device is oriented to coincide with the invariant direction of the optical element, and an imaging spectrometer comprising an entrance slit having a longitudinal direction oriented to coincide with the invariant direction of the optical element. The imaging spectrometer further comprises a 2-dimensional image sensor. The invention further relates to a method.

    Abstract translation: 本发明涉及用于表征样品的表面折射率扫描系统。 该系统包括用于保持或接收样本的光栅装置，该装置至少包括具有沿横向方向的第一光栅宽度的第一光栅区域和具有沿横向方向的第二光栅宽度的第二光栅区域。 第一光栅区域和第二光栅区域在横向方向上相邻，其中第一光栅区域在纵向方向上具有光栅周期Λ1，并且第二光栅区域在纵向方向上具有光栅周期Λ2，其中纵向方向 与横向方向正交。 光栅周期间隔ΔΛ=Λ1-Λ2是有限的。 此外，第一和第二光栅周期被选择为分别为第一波长带和第二波长带的光提供光共振，光在面外方向上发射，透射或反射，其中第一波长 波段和第二波长带在波长上至少部分不重叠。 该系统还包括用于用照明波长带处的光照射光栅装置的至少一部分的光源。 另外，该系统包括成像系统，用于对来自光栅装置的发射光，透射光或反射光进行成像。 成像系统包括光学元件，例如圆柱形透镜或弯曲镜，被配置用于在横向方向上聚焦光并且在正交横向方向上不变，光学元件被定向成使得光栅装置的纵向方向 定向成与光学元件的不变方向一致;以及成像光谱仪，其包括入射狭缝，该入射狭缝具有定向为与光学元件的不变方向一致的纵向方向。 成像光谱仪还包括二维图像传感器。 本发明还涉及一种方法。

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